edited by Philip HO ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technically co-sponsored by IEEE Electron Devices Society, IEEE Reliability Society ; in co-operation with Centre for IC Failure Analysis & Reliability, National University of SingaporeIEEE Operations Centerc2003
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- Author Heading...ng, John T. L. IEEE Singapore Section. Reliability/CPMT/EDA Chapter IEEE Electron Devices Society...
edited by John Thong ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technical co-sponsored by IEEE Electron Devices Society, IEEE Reliability Society ; in co-operation with Centre for IC Failure Analysis & Reliability, National University of SingaporeInstitute of Electrical and Electronics Engineersc2002
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- Author Heading...ng, John T. L. IEEE Singapore Section. Reliability/CPMT/EDA Chapter IEEE Electron Devices Society...
edited by Wilson Tan ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technical co-sponsored by IEEE Electron Devices Society ; in co-operation with Centre for IC Failure Analysis & Reliability, National University of Singapore, Institute of Microelectronics, SingaporeInstitute of Electrical and Electronics Engineersc2001
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- Author Heading...ts Tan, Wilson IEEE Singapore Section. Reliability/CPMT/EDA Chapter IEEE Electron Devices Society...
edited by Chim Wai Kin, M.K. Radhakrishnan, John Thong ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technical co-sponsored by IEEE Electron Devices Society ; in co-operation with Centre for IC Failure Analysis & Reliability, National University of Singapore, Institute of Microelectronics, SingaporeInstitute of Electrical and Electronics Engineersc1999
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- Author Heading...ng, John T. L. IEEE Singapore Section. Reliability/CPMT/EDA Chapter IEEE Electron Devices Society...
edited by M.K. Radhakrishnan, Philip Ho, Chim Wai Kin ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technically co-sponsored by IEEE Electron Device Society ; in co-operation with National University of Singapore Centre for IC Failure Analysis & Reliability, Institute of Microelectronics,SingaporeInstitute of Electrical and Electronics Engineersc1997
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- Author Heading... Chim, Wai Kin IEEE Singapore Section. Reliability/CPMT/EDA Chapter IEEE Electron Devices Society...
edited by Soon Huat Ong, MK Radhakrishnan ; organised by, IEEE Singapore Section, Reliability/CPMT/EDS Chapter ; technical co-sponsorship, IEEE Electron Devices Society ; in co-operation with National University of Singapore, Centre for IC Failure Analysis and Reliability, Institute of Microelectronics, Singapore, [and] Magnetics Technology Centre, SingaporeInstitute of Electrical and Electronics Engineersc1995
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- Author Heading...rishnan, M. K. IEEE Singapore Section. Reliability/CPMT/EDA Chapter IEEE Electron Devices Society...