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Proceedings of the 10th International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA 2003

Proceedings of the 10th International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA 2003
Paper図書
edited by Philip HO ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technically co-sponsored by IEEE Electron Devices Society, IEEE Reliability Society ; in co-operation with Centre for IC Failure Analysis & Reliability, National University of SingaporeIEEE Operations Centerc2003
Other Libraries in Japan
  • Author Heading...evices Society National University of Singapore. Centre for IC Failure Analysis and Reliability IEEE Reliability Society Trig...

Proceedings of the 9th International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA 2002

Proceedings of the 9th International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA 2002
Paper図書
edited by John Thong ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technical co-sponsored by IEEE Electron Devices Society, IEEE Reliability Society ; in co-operation with Centre for IC Failure Analysis & Reliability, National University of SingaporeInstitute of Electrical and Electronics Engineersc2002
Other Libraries in Japan
  • Author Heading...evices Society National University of Singapore. Centre for IC Failure Analysis and Reliability IEEE Reliability Society Tan,...

Proceedings of the 2001, 8th International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA 2001

Proceedings of the 2001, 8th International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA 2001
Paper図書
edited by Wilson Tan ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technical co-sponsored by IEEE Electron Devices Society ; in co-operation with Centre for IC Failure Analysis & Reliability, National University of Singapore, Institute of Microelectronics, SingaporeInstitute of Electrical and Electronics Engineersc2001
Other Libraries in Japan
  • Author Heading...evices Society National University of Singapore. Centre for IC Failure Analysis and Reliability Institute of Microelectronics

Proceedings of the 1995 5th International Symposium on the Physical & Failure Analysis of Integrated Circuits

Proceedings of the 1995 5th International Symposium on the Physical & Failure Analysis of Integrated Circuits
Paper図書
edited by Soon Huat Ong, MK Radhakrishnan ; organised by, IEEE Singapore Section, Reliability/CPMT/EDS Chapter ; technical co-sponsorship, IEEE Electron Devices Society ; in co-operation with National University of Singapore, Centre for IC Failure Analysis and Reliability, Institute of Microelectronics, Singapore, [and] Magnetics Technology Centre, SingaporeInstitute of Electrical and Electronics Engineersc1995
Other Libraries in Japan
  • Author Heading...evices Society National University of Singapore. Centre for IC Failure Analysis and Reliability Institute of Microelectronics...

Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits :softbound

Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits :softbound
Paper図書
edited by Chim Wai Kin, M.K. Radhakrishnan, John Thong ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technical co-sponsored by IEEE Electron Devices Society ; in co-operation with Centre for IC Failure Analysis & Reliability, National University of Singapore, Institute of Microelectronics, SingaporeInstitute of Electrical and Electronics Engineersc1999
Other Libraries in Japan
  • Author Heading...evices Society National University of Singapore. Centre for IC Failure Analysis and Reliability Institute of Microelectronics

Proceedings of the 1997 6th International Symposium on the Physical & Failure Analysis of Integrated Circuits [IPFA '97 : 21-25 July, 1997, Raffles City Convention Centre, Singapore] softbound

Proceedings of the 1997 6th International Symposium on the Physical & Failure Analysis of Integrated Circuits [IPFA '97 : 21-25 July, 1997, Raffles City Convention Centre, Singapore] softbound
Paper図書
edited by M.K. Radhakrishnan, Philip Ho, Chim Wai Kin ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technically co-sponsored by IEEE Electron Device Society ; in co-operation with National University of Singapore Centre for IC Failure Analysis & Reliability, Institute of Microelectronics,SingaporeInstitute of Electrical and Electronics Engineersc1997
Other Libraries in Japan
  • Author Heading...evices Society National University of Singapore. Centre for IC Failure Analysis and Reliability Institute of Microelectronics...

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