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Studies on test generation complexity for stuck-at and path delay faults based on τ[k]-notation

Studies on test generation complexity for stuck-at and path delay faults based on τ[k]-notation
Paper博士論文
Chia Yee Ooi [著][Chia Yee Ooi][2006]<UT51-2007-B463>
National Diet Library
  • Author HeadingOoi, Chia Yee

Enhanced Functional Fault Model for Micro Operation Faults

Enhanced Functional Fault Model for Micro Operation Faults
Digital文書・図像類
Ooi, Chia Yee, Fujiwara, HideoNara Institute of Science and Technology2010-08Information Science Technical ReportTR2010004
Available onlineOther Libraries in Japan
  • Author HeadingOoi, Chia Yee Fujiwara, Hideo

Studies on test generation complexity for stuck-at and path delay faults based on τ[k]-notation

Studies on test generation complexity for stuck-at and path delay faults based on τ[k]-notation
Digital博士論文
Ooi, Chia YeeNara Institute of Science and Technology2006-09-29
Other Libraries in Japan
  • Author HeadingOoi, Chia Yee

Classification of sequential circuits based on acyclic test generation complexity

Classification of sequential circuits based on acyclic test generation complexity
Digital文書・図像類
Ooi, Chia Yee, Fujiwara, HideoNara Institute of Science and Technology2006-07Information Science Technical ReportTR2006004
Available onlineOther Libraries in Japan
  • Author HeadingOoi, Chia Yee Fujiwara, Hideo

A new class of sequential circuits with acyclic test generation complexity

A new class of sequential circuits with acyclic test generation complexity
Digital文書・図像類
Ooi, Chia Yee, Fujiwara, HideoNara Institute of Science and Technology2006-05Information Science Technical ReportTR2006003
Available onlineOther Libraries in Japan
  • Author HeadingOoi, Chia Yee Fujiwara, Hideo

Test generation complexity for stuck-at and path delay faults based on tau[k] - notation

Test generation complexity for stuck-at and path delay faults based on tau[k] - notation
Digital文書・図像類
Ooi, Chia Yee, Clouqueur, Thomas, Fujiwara, HideoNara Institute of Science and Technology2005-05Information Science Technical ReportTR2005003
Available onlineOther Libraries in Japan
  • Author HeadingOoi, Chia Yee Clouqueur, Thomas Fujiwara, H...

Some tau-equivalent classes of sequential circuits

Some tau-equivalent classes of sequential circuits
Digital文書・図像類
Ooi, Chia Yee, Fujiwara, HideoNara Institute of Science and Technology2004-06Information Science Technical ReportTR2004002
Available onlineOther Libraries in Japan
  • Author HeadingOoi, Chia Yee Fujiwara, Hideo

Classification of sequential circuits based on combinational test generation complexity

Classification of sequential circuits based on combinational test generation complexity
Digital文書・図像類
Ooi, Chia Yee, Fujiwara, HideoNara Institute of Science and Technology2004-01Information Science Technical ReportTR2004001
Available onlineOther Libraries in Japan
  • Author HeadingOoi, Chia Yee Fujiwara, Hideo

組合せテスト生成可能な順序回路の新しいクラスの提案とそれに基づくテスト生成法・テスト容易化設計法について

組合せテスト生成可能な順序回路の新しいクラスの提案とそれに基づくテスト生成法・テスト容易化設計法について
Digital文書・図像類
岡, 伸也, OOI, Chia Yee, 市原, 英行, 井上, 智生, 藤原, 秀雄, OKA, Nobuya, ICHIHARA,Hideyuki, Hideyuki, INOUE, Tomoo, FUJIWARA, Hideo[広島市立大学]p.1-22
Other Libraries in Japan
  • Author Heading岡, 伸也 OOI, Chia Yee 市原, 英行 井上, 智生 藤原, 秀雄 OKA, Nob...

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