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Scanning microscopies 2015 : 29 September-1 October 2015 : Monterey, California, United States : Sep 2015, Monterey, CA. (SPIE Proceedings ; 9636)

Scanning microscopies 2015 : 29 September-1 October 2015 : Monterey, California, United States : Sep 2015, Monterey, CA. (SPIE Proceedings ; 9636)
Paper図書
SPIE[2015]<M17-16-458>
National Diet Library

Scanning microscopies 2013: advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences : 30 April-1 May 2013 : Baltimore, Maryland, United States : particle beam interaction modeling workshop : scanning microscopies 2013: advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences (conference 8729) : DSS conferences : microscopy for STEM educators workshop : Apr 2013, Baltimore, MD. (SPIE Proceedings ; 8729)

Scanning microscopies 2013: advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences : 30 April-1 May 2013 : Baltimore, Maryland, United States : particle beam interaction modeling workshop : scanning microscopies 2013: advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences (conference 8729) : DSS conferences : microscopy for STEM educators workshop : Apr 2013, Baltimore, MD. (SPIE Proceedings ; 8729)
Paper図書
SPIEc2013.<M17-14-673>
National Diet Library

Scanning microscopies 2012: advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences : 24-26 April 2012 : Baltimore, Maryland, United States : scanning microscopies 2012: advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences (conference 8378) : DSS meeting : 2012 SPIE defense security+sensing symposium : Apr 2012, Baltimore, MD. (SPIE Proceedings ; 8378)

Scanning microscopies 2012: advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences : 24-26 April 2012 : Baltimore, Maryland, United States : scanning microscopies 2012: advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences (conference 8378) : DSS meeting : 2012 SPIE defense security+sensing symposium : Apr 2012, Baltimore, MD. (SPIE Proceedings ; 8378)
Paper図書
SPIEc2012.<M17-12-3978>
National Diet Library

Scanning microscopies 2011: advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences : 26-28 April 2011 : Orlando, Florida, United States : particle beam interaction workshop : SCANNING 2011 meeting : SPIE defense, security, and sensing 2011 (DSS 2011) conference : spring conferences on scanning microscopy : scanning microscopy in forensic science short course : annual SCANNING meetings : Apr 2011, Orlando, FL. (SPIE Proceedings ; 8036)

Scanning microscopies 2011: advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences : 26-28 April 2011 : Orlando, Florida, United States : particle beam interaction workshop : SCANNING 2011 meeting : SPIE defense, security, and sensing 2011 (DSS 2011) conference : spring conferences on scanning microscopy : scanning microscopy in forensic science short course : annual SCANNING meetings : Apr 2011, Orlando, FL. (SPIE Proceedings ; 8036)
Paper図書
SPIEc2011.<M17-12-1033>
National Diet Library

Scanning microscopy 2010 : 17-19 May 2010 : Monterey, California, United States. : 2nd of the SPIE scanning microscopy symposia : scanning microscopy 2010 meeting : May 2010, Monterey, CA. (SPIE Proceedings ; 7729)

Scanning microscopy 2010 : 17-19 May 2010 : Monterey, California, United States. : 2nd of the SPIE scanning microscopy symposia : scanning microscopy 2010 meeting : May 2010, Monterey, CA. (SPIE Proceedings ; 7729)
Paper図書
SPIEc2010.<M17-10-4242>
National Diet Library
  • Subject HeadingScanning electron microscopes -- Congresses.

Scanning microscopy 2009 : 4-7 May 2009 : Monterey, California, United States. : SPIE scanning microscopy symposiums : scanning microscopy 2009 meeting : May 2009, Monterey, CA. (SPIE Proceedings ; 7378)

Scanning microscopy 2009 : 4-7 May 2009 : Monterey, California, United States. : SPIE scanning microscopy symposiums : scanning microscopy 2009 meeting : May 2009, Monterey, CA. (SPIE Proceedings ; 7378)
Paper図書
SPIEc2009.<M17-10-847>
National Diet Library
  • Subject HeadingScanning electron microscopes -- Congresses.

Advances in materials problem solving with the electron microscope : symposium held November 30-December 3, 1999, Boston, Massachusetts, U.S.A.

Advances in materials problem solving with the electron microscope : symposium held November 30-December 3, 1999, Boston, Massachusetts, U.S.A.
Paper図書
editors, Jim Bentley, ... [et. al]Materials Research Societyc2001
Other Libraries in Japan

Electron microscopy ... : proceedings of the ... European Congress on Electron Microscopy.

Electron microscopy ... : proceedings of the ... European Congress on Electron Microscopy.
Paper図書
Institute of Physics1972-<ND448-19>
National Diet Library
  • Subject HeadingElectron microscopes -- Congresses. Electron microscopy -- Congr...

Scanning microscopy instrumentation : 22-23 July 1991, San Diego, California

Scanning microscopy instrumentation : 22-23 July 1991, San Diego, California
Paper図書
Gordon S. Kino, chair/editor ; sponsored and published by SPIE--the International Society for Optical EngineeringSPIEc1992
Other Libraries in Japan
  • Subject HeadingScanning electron microscopes -- Congresses
  • Subject Heading (ID)Scanning electron microscopes -- Congresses

'From molecule to cell'; Symposium on Electron Microscopy, Modena, April 1963, held at the University of Modena on the occasion of the centenary of the death of Giovan Battista Amici. Proceedings edited by Paola Buffa. Foreword by Giovanni Polvani. (Congressi, convegni e simposi scientifici, 7)

'From molecule to cell'; Symposium on Electron Microscopy, Modena, April 1963, held at the University of Modena on the occasion of the centenary of the death of Giovan Battista Amici. Proceedings edited by Paola Buffa. Foreword by Giovanni Polvani. (Congressi, convegni e simposi scientifici, 7)
Paper図書
Consiglio Nazionale delle Ricerche1964.<ND448-3>
National Diet Library
  • Subject HeadingElectron microscopes -- Congresses.

Scanning electron microscopy of polymers and coatings. (Applied polymer symposia)

Scanning electron microscopy of polymers and coatings. (Applied polymer symposia)
Paper図書
John Wiley & Sons1970.<PA431-58>
National Diet Library
  • Subject Heading...-- Congresses. Electron microscopes -- Congresses.

Techniques of electron microscopy, diffraction, and microprobe analysis. Presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 26, 1963. (ASTM special technical publication no. 372)

Techniques of electron microscopy, diffraction, and microprobe analysis. Presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 26, 1963. (ASTM special technical publication no. 372)
Paper図書
American Society for Testing and Materials[1965, c1964]<669.9-S991t>
National Diet Library
  • Subject HeadingMetallography -- Congresses. Electron microscopes -- Congresses.

Symposium on Advances in Techniques in Electron Metallography; [papers] Sponsored by Subcommittee XI on Electron Microstructure of Metals of ASTM Committee E-4 on Electron Metallography, held at New York, N.Y., June 26, 1962. (ASTM special technical publication no. 339)

Symposium on Advances in Techniques in Electron Metallography; [papers] Sponsored by Subcommittee XI on Electron Microstructure of Metals of ASTM Committee E-4 on Electron Metallography, held at New York, N.Y., June 26, 1962. (ASTM special technical publication no. 339)
Paper図書
American Society for Testing and Materials[1963]<669.063-S9892s>
National Diet Library
  • Subject HeadingMetallography -- Congresses. Electron microscopes -- Congresses.

Scanning microscopy technologies and applications

Scanning microscopy technologies and applications
Paper図書
E. Clayton Teague, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating sponsor, American Society for Precision EngineeringSPIEc1988
Other Libraries in Japan
  • Subject HeadingScanning electron microscopes -- Congresses
  • Subject Heading (ID)Scanning electron microscopes -- Congresses

Proceedings : thirty-seventh annual meeting Electron Microscopy Society of America, San Antonio, Texas, August 13-17, 1979

Proceedings : thirty-seventh annual meeting Electron Microscopy Society of America, San Antonio, Texas, August 13-17, 1979
Paper図書
editor G.W. BaileyClaitor's Pub. Division1979
Other Libraries in Japan
  • Subject HeadingElectron microscopes -- Congresses
  • Subject Heading (ID)Electron microscopes -- Congresses

Scanning electron microscopy in taxonomy and functional morphology

Scanning electron microscopy in taxonomy and functional morphology
Paper図書
edited by D. ClaugherPublished for the Systematics Association by Clarendon Press1990
Other Libraries in Japan
  • Subject HeadingBiology -- Classification -- Congresses Scanning electron microscopes -- Congresses
  • Subject Heading (ID)Biology -- Classification -- Congresses Scanning electron microscopes -- Congresses

High resolution microscopy of materials : symposium held November 29-December 1, 1988, Boston, Massachusetts, U.S.A.

High resolution microscopy of materials : symposium held November 29-December 1, 1988, Boston, Massachusetts, U.S.A.
Paper図書
editors, William Krakow, Fernando A. Ponce, David J. SmithMaterials Research Societyc1989
Other Libraries in Japan

Electron microscopy : proceedings of the first regional conference in Asia and Oceania, Tokyo, 1956 / editor, Organizing Committee.

Electron microscopy : proceedings of the first regional conference in Asia and Oceania, Tokyo, 1956 / editor, Organizing Committee.
Paper図書
Electrotechnical Laboratory1957.<ND448-2>
National Diet Library
  • Subject HeadingElectron microscopes -- Congresses. Microscopy -- Congresses.

Scanned image microscopy

Scanned image microscopy
Paper図書
edited by Eric A. AshAcademic Press1980
Other Libraries in Japan

Electron microscopy in material science : Third Course of the International School of Electron Microscopy , 'Ettore Majorana' International Centre for Scientific Culture

Electron microscopy in material science : Third Course of the International School of Electron Microscopy , 'Ettore Majorana' International Centre for Scientific Culture
Paper図書
editors U. Valdré and E. RuedlOffice for Official Publications of the European Communities1975
Other Libraries in Japan
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