Jump to main content

yr 〜
yr

Search results 10

Frontiers of characterization and metrology for nanoelectronics : 2007 international conference on frontiers of characterization and metrology for nanoelectronics : Gaithersburg, Maryland 27-29 March 2007. : Mar 2007, Gaithersburg, MD. (AIP Conference Proceedings ; 931)

Frontiers of characterization and metrology for nanoelectronics : 2007 international conference on frontiers of characterization and metrology for nanoelectronics : Gaithersburg, Maryland 27-29 March 2007. : Mar 2007, Gaithersburg, MD. (AIP Conference Proceedings ; 931)
Paper図書
American Institute of Physics2007.<M17-07-2846>
National Diet Library
  • Subject HeadingIntegrated circuits -- Ultra large scale integration -- Congresses. Nanoelectronics -- Congresse...

Characterization and metrology for ULSI technology : 2003 international conference on characterization and metrology for ULSI technology : Austin, Texas 24-28 March 2003. : Mar 2003, Austin, TX. (AIP Conference Proceedings ; 683)

Characterization and metrology for ULSI technology : 2003 international conference on characterization and metrology for ULSI technology : Austin, Texas 24-28 March 2003. : Mar 2003, Austin, TX. (AIP Conference Proceedings ; 683)
Paper図書
American Institute of Physicsc2003.<M17-04-1460>
National Diet Library
  • Subject HeadingIntegrated circuits -- Ultra large scale integration -- Congresses. Integrated circuits -- Ultra large scale integration -- Congresses -- Software.

ULSI process integration 3 : proceedings of the international symposium. : 3rd symposium on ULSI process integration : 203rd meeting of the Electrochemical Society : Apr 2003, Paris, France. (PV ; 2003-06)

ULSI process integration 3 : proceedings of the international symposium. : 3rd symposium on ULSI process integration : 203rd meeting of the Electrochemical Society : Apr 2003, Paris, France. (PV ; 2003-06)
Paper図書
Electrochemical Societyc2003.<M17-03-5246>
National Diet Library
  • Subject HeadingIntegrated circuits -- Ultra large scale integration -- Congresses.

Frontiers of characterization and metrology for nanoelectronics : 2009 international conference on frontiers of characterization and metrology for nanoelectronics : Albany, New York 11-15 May 2009. : May 2009, Albany, NY. (AIP Conference Proceedings ; 1173)

Frontiers of characterization and metrology for nanoelectronics : 2009 international conference on frontiers of characterization and metrology for nanoelectronics : Albany, New York 11-15 May 2009. : May 2009, Albany, NY. (AIP Conference Proceedings ; 1173)
Paper図書
American Institute of Physics2009.<M17-10-1269>
National Diet Library
  • Subject Heading...-- Congresses. Integrated circuits -- Ultra large scale integration -- Congresses.

ULSI process integration 2 : proceedings of the international symposium. : 2nd international symposium on ULSI process integration : 199th meeting of the Electrochemical Society : Mar 2001, Washington, D.C. (PV ; 2001-2)

ULSI process integration 2 : proceedings of the international symposium. : 2nd international symposium on ULSI process integration : 199th meeting of the Electrochemical Society : Mar 2001, Washington, D.C. (PV ; 2001-2)
Paper図書
Electrochemical Societyc2001.<M17-03-4986>
National Diet Library
  • Subject HeadingIntegrated circuits -- Ultra large scale integration -- Congresses.

Nanopatterning -- from ultralarge-scale integration to biotechnology : symposium held November 25-29, 2001, Boston, Massachusetts, U.S.A. : symposium Y, "nanopatterning -- from ultralarge-scale integration to biotechnology" held at the 2001 MRS fall meeting : Nov 2001, Boston, MA. (Materials Research Society Symposia Proceedings ; 705)

Nanopatterning -- from ultralarge-scale integration to biotechnology : symposium held November 25-29, 2001, Boston, Massachusetts, U.S.A. : symposium Y, "nanopatterning -- from ultralarge-scale integration to biotechnology" held at the 2001 MRS fall meeting : Nov 2001, Boston, MA. (Materials Research Society Symposia Proceedings ; 705)
Paper図書
Materials Research Societyc2002.<M17-03-3846>
National Diet Library
  • Subject Heading...-- Congresses. Integrated circuits -- Ultra large scale integration -- Congresses. Biotechnology -- Congresses.

Frontiers of characterization and metrology for nanoelectronics : 2007 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics : Gaithersburg, Maryland, 27-29 March 2007

Frontiers of characterization and metrology for nanoelectronics : 2007 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics : Gaithersburg, Maryland, 27-29 March 2007
Paper図書
editors, David G. Seiler ... [et al.] ; sponsoring organizations, National Institute of Standards and Technology ... [et al.]American Institute of Physics2007
Other Libraries in Japan
  • Subject HeadingIntegrated circuits -- Ultra large scale integration -- Congresses Nanoelectronics -- Congresses
  • Subject Heading (ID)Integrated circuits -- Ultra large scale integration -- Congresses Nanoelectronics -- Congresses

ULSI science and technology, 1997 : proceedings of the Sixth International Symposium on Ultralarge Scale Integration Science and Technology

ULSI science and technology, 1997 : proceedings of the Sixth International Symposium on Ultralarge Scale Integration Science and Technology
Paper図書
editors, Hisham Z. Massoud ... [et al.]Electrochemical Societyc1997
Other Libraries in Japan
  • Subject HeadingIntegrated circuits -- Ultra large scale integration -- Congresses
  • Subject Heading (ID)Integrated circuits -- Ultra large scale integration -- Congresses

ULSI science and technology, 1995 : proceedings of the Fifth International Symposium on Ultra Large Scale Integration Science and Technology

ULSI science and technology, 1995 : proceedings of the Fifth International Symposium on Ultra Large Scale Integration Science and Technology
Paper図書
editors, Edward M. Middlesworth, Hisham MassoudElectrochemical Societyc1995
Other Libraries in Japan
  • Subject HeadingIntegrated circuits -- Ultra large scale integration -- Congresses
  • Subject Heading (ID)Integrated circuits -- Ultra large scale integration -- Congresses

Proceedings of the First International Symposium on Advanced Materials for ULSI

Proceedings of the First International Symposium on Advanced Materials for ULSI
Paper図書
edited by Martin Scott, Yoichi Akasaka, Rafael ReifElectrochemical Societyc1988
Other Libraries in Japan
  • Subject HeadingIntegrated circuits -- Ultra large scale integration -- Congresses
  • Subject Heading (ID)Integrated circuits -- Ultra large scale integration -- Congresses

Reached to the end of result.

RSS