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Optics and photonics for advanced dimensional metrology II : 5-7 April 2022 : Strasbourg, France : 9-20 May 2022 : online : 2022, ------. (SPIE Proceedings ; 12137)

Optics and photonics for advanced dimensional metrology II : 5-7 April 2022 : Strasbourg, France : 9-20 May 2022 : online : 2022, ------. (SPIE Proceedings ; 12137)
Paper図書
SPIE[2022]<M17-22-918>
National Diet Library

Dimensional optical metrology and inspection for practical applications IV : 20-21 April 2015 : Baltimore, Maryland, United States : Apr 2015, Baltimore, MD. (SPIE Proceedings ; 9489)

Dimensional optical metrology and inspection for practical applications IV : 20-21 April 2015 : Baltimore, Maryland, United States : Apr 2015, Baltimore, MD. (SPIE Proceedings ; 9489)
Paper図書
SPIE[2015]<M17-15-3051>
National Diet Library

Dimensional optical metrology and inspection for practical applications 2 : 25-26 August 2013 : San Diego, California, United States : 2013 conference on dimensional optical metrology and inspection for practical applications : Aug 2013, San Diego, CA. (SPIE Proceedings ; 8839)

Dimensional optical metrology and inspection for practical applications 2 : 25-26 August 2013 : San Diego, California, United States : 2013 conference on dimensional optical metrology and inspection for practical applications : Aug 2013, San Diego, CA. (SPIE Proceedings ; 8839)
Paper図書
SPIEc2013.<M17-14-1500>
National Diet Library

Dimensional optical metrology and inspection for practical applications III : 5-6 May 2014 : Baltimore, Maryland, United States : May 2014, Baltimore, MD. (SPIE Proceedings ; 9110)

Dimensional optical metrology and inspection for practical applications III : 5-6 May 2014 : Baltimore, Maryland, United States : May 2014, Baltimore, MD. (SPIE Proceedings ; 9110)
Paper図書
SPIE[2014]<M17-15-965>
National Diet Library

Applied optical metrology II : 8-9 August 2017 : San Diego, California, United States : Aug 2017, San Diego, CA. (SPIE Proceedings ; 10373)

Applied optical metrology II : 8-9 August 2017 : San Diego, California, United States : Aug 2017, San Diego, CA. (SPIE Proceedings ; 10373)
Paper図書
SPIE[2017]<M17-19-922>
National Diet Library

Dimensional optical metrology and inspection for practical applications : 22-23 August 2011 : San Diego, California, United States : Aug 2011, San Diego, CA. (SPIE Proceedings ; 8133)

Dimensional optical metrology and inspection for practical applications : 22-23 August 2011 : San Diego, California, United States : Aug 2011, San Diego, CA. (SPIE Proceedings ; 8133)
Paper図書
SPIEc2011.<M17-12-2008>
National Diet Library

Optical manipulation conference : 25-27 April 2018 : Yokohama, Japan : Apr 2018, Yokohama, Japan. (SPIE Proceedings ; 10712)

Optical manipulation conference : 25-27 April 2018 : Yokohama, Japan : Apr 2018, Yokohama, Japan. (SPIE Proceedings ; 10712)
Paper図書
SPIE[2018]<M17-19-1577>
National Diet Library

Optical micro- and nanometrology V : 15-17 April 2014 : Brussels, Belgium : 6th conference on optical micro- and nanometrology, photonics Europe : Apr 2014, Brussels, Belgium. (SPIE Proceedings ; 9132)

Optical micro- and nanometrology V : 15-17 April 2014 : Brussels, Belgium : 6th conference on optical micro- and nanometrology, photonics Europe : Apr 2014, Brussels, Belgium. (SPIE Proceedings ; 9132)
Paper図書
SPIE[2014]<M17-15-864>
National Diet Library

Real-time photonic measurements, data management, and processing : 9-11 October 2014 : Beijing, China : Oct 2014, Beijing, China. (SPIE Proceedings ; 9279)

Real-time photonic measurements, data management, and processing : 9-11 October 2014 : Beijing, China : Oct 2014, Beijing, China. (SPIE Proceedings ; 9279)
Paper図書
SPIE[2014]<M17-15-1418>
National Diet Library

Eighth international symposium on precision engineering measurements and instrumentation : 8-11 August, 2012 : Chengdu, China : ISPEMI : 8th international symposium on precision engineering measurement and instrumentation : Aug 2012, Chengdu, China. (SPIE Proceedings ; 8759)

Eighth international symposium on precision engineering measurements and instrumentation : 8-11 August, 2012 : Chengdu, China : ISPEMI : 8th international symposium on precision engineering measurement and instrumentation : Aug 2012, Chengdu, China. (SPIE Proceedings ; 8759)
Paper図書
SPIEc2013.<M17-13-2280>
National Diet Library

Modeling aspects in optical metrology 4 : 13-14 May 2013 : Munich, Germany : conference modelling aspects in optical metrology 2013 : SPIE optical metrology symposium : May 2013, Munich, Germany. (SPIE Proceedings ; 8789)

Modeling aspects in optical metrology 4 : 13-14 May 2013 : Munich, Germany : conference modelling aspects in optical metrology 2013 : SPIE optical metrology symposium : May 2013, Munich, Germany. (SPIE Proceedings ; 8789)
Paper図書
SPIEc2013.<M17-14-100>
National Diet Library

Optical micro- and nanometrology 4 : 16-18 April 2012 : Brussels, Belgium : Apr 2012, Brussels, Belgium. (SPIE Proceedings ; 8430)

Optical micro- and nanometrology 4 : 16-18 April 2012 : Brussels, Belgium : Apr 2012, Brussels, Belgium. (SPIE Proceedings ; 8430)
Paper図書
SPIEc2012.<M17-12-3990>
National Diet Library

6th international symposium on advanced optical manufacturing and testing technologies : design, manufacturing, and testing of smart structures, micro- and nano-optical devices, and systems : 26-29 April 2012 : Xiamen, China : AOMATT 2012 : AOMATT2012 : Apr 2012, Xiamen, China. (SPIE Proceedings ; 8418)

6th international symposium on advanced optical manufacturing and testing technologies : design, manufacturing, and testing of smart structures, micro- and nano-optical devices, and systems : 26-29 April 2012 : Xiamen, China : AOMATT 2012 : AOMATT2012 : Apr 2012, Xiamen, China. (SPIE Proceedings ; 8418)
Paper図書
SPIEc2012.<M17-13-1212>
National Diet Library

6th international symposium on advanced optical manufacturing and testing technologies : optical test and measurement technology and equipment : 26-29 April 2012 : Xiamen, China : AOMATT 2012 : AOMATT2012 : Apr 2012, Xiamen, China. (SPIE Proceedings ; 8417)

6th international symposium on advanced optical manufacturing and testing technologies : optical test and measurement technology and equipment : 26-29 April 2012 : Xiamen, China : AOMATT 2012 : AOMATT2012 : Apr 2012, Xiamen, China. (SPIE Proceedings ; 8417)
Paper図書
SPIEc2012.<M17-13-990>
National Diet Library

International conference on advanced phase measurement methods in optics and imaging : Monte Verita, Ascona, Switzerland 16-21 May 2010. : May 2010, Ascona, Switzerland. (AIP Conference Proceedings ; 1236)

International conference on advanced phase measurement methods in optics and imaging : Monte Verita, Ascona, Switzerland 16-21 May 2010. : May 2010, Ascona, Switzerland. (AIP Conference Proceedings ; 1236)
Paper図書
American Institute of Physics2010.<M17-10-3228>
National Diet Library
  • Subject HeadingOptical measurements -- Congresses. Physical optics -- Congresse...

Modeling aspects in optical metrology V : 23-25 June 2015 : Munich, Germany : Jun 2015, Munich, Germany. (SPIE Proceedings ; 9526)

Modeling aspects in optical metrology V : 23-25 June 2015 : Munich, Germany : Jun 2015, Munich, Germany. (SPIE Proceedings ; 9526)
Paper図書
SPIE[2015]<M17-15-3191>
National Diet Library

Modeling aspects in optical metrology 3 : 23-24 May 2011 : Munich, Germany : conference modelling aspects in optical metrology : SPIE optical metrology symposium : May 2011, Munich, Germany. (SPIE Proceedings ; 8083)

Modeling aspects in optical metrology 3 : 23-24 May 2011 : Munich, Germany : conference modelling aspects in optical metrology : SPIE optical metrology symposium : May 2011, Munich, Germany. (SPIE Proceedings ; 8083)
Paper図書
SPIEc2011.<M17-12-727>
National Diet Library

Optical micro- and nanometrology 3 : 13-16 April 2010 : Brussels, Belgium. : Apr 2010, Brussels, Belgium. (SPIE Proceedings ; 7718)

Optical micro- and nanometrology 3 : 13-16 April 2010 : Brussels, Belgium. : Apr 2010, Brussels, Belgium. (SPIE Proceedings ; 7718)
Paper図書
SPIEc2010.<M17-10-3986>
National Diet Library
  • Subject HeadingOptical measurements -- Congresses. Microscopy -- Congresses. Ph...

Optical test and measurement technology and equipment : 4th international symposium on advanced optical manufacturing and testing technologies : 19-21 November 2008 : Chengdu, China. : AOMATT-international symposium on advanced optical manufacturing and testing technology : AOMATT08 : AOMATT symposium : Nov 2008, Chengdu, China. (SPIE Proceedings ; 7283)

Optical test and measurement technology and equipment : 4th international symposium on advanced optical manufacturing and testing technologies : 19-21 November 2008 : Chengdu, China. : AOMATT-international symposium on advanced optical manufacturing and testing technology : AOMATT08 : AOMATT symposium : Nov 2008, Chengdu, China. (SPIE Proceedings ; 7283)
Paper図書
SPIEc2009.<M17-10-485>
National Diet Library
  • Subject Heading...-- Congresses. Optical measurements -- Congresses. Measurement -- Congresses.

2011 international conference on optical instruments and technology : optoelectronic devices and integration : 6-9 November 2011 : Beijing, China : 2011 international conference on optical instrument and technology : OIT2011 : Nov 2011, Beijing, China. (SPIE Proceedings ; 8198)

2011 international conference on optical instruments and technology : optoelectronic devices and integration : 6-9 November 2011 : Beijing, China : 2011 international conference on optical instrument and technology : OIT2011 : Nov 2011, Beijing, China. (SPIE Proceedings ; 8198)
Paper図書
SPIEc2011.<M17-12-2564>
National Diet Library
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