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Physics and technology of crystalline oxide semiconductor CAAC-IGZO. Fundamentals (Wiley-SID series in display technology)

Physics and technology of crystalline oxide semiconductor CAAC-IGZO. Fundamentals (Wiley-SID series in display technology)
Paper図書
edited by Noboru Kimizuku, Shunpei Yamazaki.Wiley2017.<ND371-B99>
National Diet Library

Characterization of semiconductor heterostructures and nanostructures Second edition.

Characterization of semiconductor heterostructures and nanostructures Second edition.
Paper図書
edited by Carlo Lamberti and Giovanni Agostini.Elsevier[2013]<MC151-B51>
National Diet Library

Physics and technology of crystalline oxide semiconductor CAAC-IGZO. Application to displays (Wiley-SID series in display technology)

Physics and technology of crystalline oxide semiconductor CAAC-IGZO. Application to displays (Wiley-SID series in display technology)
Paper図書
edited by Shunpei Yamazaki, Tetsuo Tsutsui.Wiley2017.<ND371-B101>
National Diet Library

Physics and technology of crystalline oxide semiconductor CAAC-IGZO. Application to LSI (Wiley-SID series in display technology)

Physics and technology of crystalline oxide semiconductor CAAC-IGZO. Application to LSI (Wiley-SID series in display technology)
Paper図書
edited by Shunpei Yamazaki, Masahiro Fujita.John Wiley & Sons, Ltd Registered office John Wiley & Sons Ltd[2017]<ND371-B100>
National Diet Library

Frontiers of characterization and metrology for nanoelectronics: 2011 : Grenoble, France 23-26 May 2011 : 2011 international conference on frontiers of characterization and metrology for nanoelectronics (2011 FCMN) : May 2011, Grenoble, France. (AIP Conference Proceedings ; 1395)

Frontiers of characterization and metrology for nanoelectronics: 2011 : Grenoble, France 23-26 May 2011 : 2011 international conference on frontiers of characterization and metrology for nanoelectronics (2011 FCMN) : May 2011, Grenoble, France. (AIP Conference Proceedings ; 1395)
Paper図書
American Institute of Physics2011.<M17-12-3709>
National Diet Library

Characterization of semiconductor heterostructures and nanostructures / edited by Carlo Lamberti. 1st ed.

Characterization of semiconductor heterostructures and nanostructures / edited by Carlo Lamberti. 1st ed.
Paper図書
Elsevier2008.<MC151-B20>
National Diet Library
  • Subject HeadingSemiconductors -- Characterization. Heterostructures. Nanostruct...

Frontiers of characterization and metrology for nanoelectronics : 2009 international conference on frontiers of characterization and metrology for nanoelectronics : Albany, New York 11-15 May 2009. : May 2009, Albany, NY. (AIP Conference Proceedings ; 1173)

Frontiers of characterization and metrology for nanoelectronics : 2009 international conference on frontiers of characterization and metrology for nanoelectronics : Albany, New York 11-15 May 2009. : May 2009, Albany, NY. (AIP Conference Proceedings ; 1173)
Paper図書
American Institute of Physics2009.<M17-10-1269>
National Diet Library
  • Subject Heading...-- Congresses. Semiconductors -- Characterization -- Congresses. Metal oxide se...

Physics and technology of crystalline oxide semiconductor CAAC-IGZO : fundamentals : cloth

Physics and technology of crystalline oxide semiconductor CAAC-IGZO : fundamentals : cloth
Paper図書
edited by Noboru Kimizuka, Shunpei YamazakiWiley2017
Other Libraries in Japan
  • Subject HeadingSemiconductors -- Materials Semiconductors -- Characterization Gallium compounds Zinc compou...
  • Subject Heading (ID)Semiconductors -- Materials Semiconductors -- Characterization Gallium compounds Zinc compou...

Advanced characterization techniques for optics, semiconductors, and nanotechnologies 3 : 28-29 August 2007 : San Diego, California, USA. : Aug 2007, San Diego, CA. (SPIE Proceedings ; 6672)

Advanced characterization techniques for optics, semiconductors, and nanotechnologies 3 : 28-29 August 2007 : San Diego, California, USA. : Aug 2007, San Diego, CA. (SPIE Proceedings ; 6672)
Paper図書
SPIEc2007.<M17-07-2920>
National Diet LibraryOther Libraries in Japan
  • Subject Heading...-- Congresses. Semiconductors -- Characterization -- Congresses. Thin films -- ...

2001 6th international workshop on statistical methodology : IWSM : June 10, 2001/Kyoto : IWSM 2001 : Jun 2001, Kyoto, Japan.

2001 6th international workshop on statistical methodology : IWSM : June 10, 2001/Kyoto : IWSM 2001 : Jun 2001, Kyoto, Japan.
Paper図書
IEEEc2001.<M17-03-2557>
National Diet Library
  • Subject HeadingSemiconductors -- Characterization -- Statistical methods -- Con...

Physics and technology of crystalline oxide semiconductor CAAC-IGZO : application to displays : cloth

Physics and technology of crystalline oxide semiconductor CAAC-IGZO : application to displays : cloth
Paper図書
edited by Shunpei Yamazaki, Tetsuo TsutsuiWiley2017
Other Libraries in Japan
  • Subject HeadingSemiconductors -- Materials Semiconductors -- Characterization Gallium compounds Zinc compou...
  • Subject Heading (ID)Semiconductors -- Materials Semiconductors -- Characterization Gallium compounds Zinc compou...

Spatially resolved characterization of local phenomena in materials and nanostructures : symposium held December 2-6, 2002, Boston, Massachusetts, U.S.A. : symposium G, "spatially resolved characterization of local phenomena in materials and devices" : 2002 MRS fall meeting : Dec 2002, Boston, MA. (Materials Research Society Symposia Proceedings ; 738)

Spatially resolved characterization of local phenomena in materials and nanostructures : symposium held December 2-6, 2002, Boston, Massachusetts, U.S.A. : symposium G, "spatially resolved characterization of local phenomena in materials and devices" : 2002 MRS fall meeting : Dec 2002, Boston, MA. (Materials Research Society Symposia Proceedings ; 738)
Paper図書
Materials Research Societyc2003.<M17-03-5205>
National Diet Library
  • Subject Heading...-- Congresses. Semiconductors -- Characterization -- Technique -- Congresses. S...

Physics and technology of crystalline oxide semiconductor CAAC-IGZO : application to LSI : cloth

Physics and technology of crystalline oxide semiconductor CAAC-IGZO : application to LSI : cloth
Paper図書
edited by Shunpei Yamazaki, Masahiro FujitaWiley2017
Other Libraries in Japan
  • Subject HeadingSemiconductors -- Materials Semiconductors -- Characterization Gallium compounds Zinc compou...
  • Subject Heading (ID)Semiconductors -- Materials Semiconductors -- Characterization Gallium compounds Zinc compou...

Advanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July 2002, Seattle, Washington, USA. : Jul 2002, Seattle, WA. (SPIE Proceedings ; 4779)

Advanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July 2002, Seattle, Washington, USA. : Jul 2002, Seattle, WA. (SPIE Proceedings ; 4779)
Paper図書
SPIEc2002.<M17-03-637>
National Diet Library
  • Subject Heading...-- Congresses. Semiconductors -- Characterization -- Congresses. Information st...

Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003 : San Diego, California, USA. : annual SPIE conference on advanced characterization techniques for optics, semiconductors, and nanotechnologies : Aug 2003, San Diego, CA. (SPIE Proceedings ; 5188)

Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003 : San Diego, California, USA. : annual SPIE conference on advanced characterization techniques for optics, semiconductors, and nanotechnologies : Aug 2003, San Diego, CA. (SPIE Proceedings ; 5188)
Paper図書
SPIEc2003.<M17-04-1398>
National Diet Library
  • Subject Heading...-- Congresses. Semiconductors -- Characterization -- Congresses. Thin films -- ...

Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry [microform] / W. Murray Bullis, S. Perkowitz, D.G. Seiler (NIST special publication ; 400-98) (Semiconductor measurement technology)

Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry [microform] / W. Murray Bullis, S. Perkowitz, D.G. Seiler (NIST special publication ; 400-98) (Semiconductor measurement technology)
Microform図書
1995<YCA-C 13.10:400-98>
National Diet Library
  • Subject Heading...ptical methods Semiconductors -- Characterization Semiconductor industry -- Uni...

Handbook of instrumentation and techniques for semiconductor nanostructure characterization vol. 1 vol. 2 set

Handbook of instrumentation and techniques for semiconductor nanostructure characterization vol. 1 vol. 2 set
Paper図書
editors, Richard Haight, Frances M. Ross, James B. HannonWorld Scientificc2012
Other Libraries in Japan
  • Subject HeadingSemiconductors -- Characterization Nanoelectromechanical systems...
  • Subject Heading (ID)Semiconductors -- Characterization Nanoelectromechanical systems...

Semiconductor devices

Semiconductor devices
Paper図書
Kanaan KanoPrentice Hallc1998
Other Libraries in Japan
  • Subject HeadingSemiconductors -- Characterization Diodes, Semiconductor Bipolar...
  • Subject Heading (ID)Semiconductors -- Characterization Diodes, Semiconductor Bipolar...

Advanced characterization techniques for optics, semiconductors, and nanotechnologies II : 2-4 August, 2005, San Diego, California, USA

Advanced characterization techniques for optics, semiconductors, and nanotechnologies II : 2-4 August, 2005, San Diego, California, USA
Paper図書
Angela Duparré, Bhanwar Singh, Zu-Han GU, chairs/editors ; sponsored and published by SPIE--the International Society for Optical EngineeringSPIEc2005
Other Libraries in Japan
  • Subject Heading... -- Congresses Semiconductors -- Characterization -- Congresses Thin films -- O...
  • Subject Heading (ID)... -- Congresses Semiconductors -- Characterization -- Congresses Thin films -- O...

1998 3rd International Workshop on Statistical Metrology, June 7, 1998, Honolulu :softbound :microfiche

1998 3rd International Workshop on Statistical Metrology, June 7, 1998, Honolulu :softbound :microfiche
Paper図書
IEEE Electron Devices SocietyInstitute of Electrical and Electronics Engineersc1998
Other Libraries in Japan
  • Subject HeadingSemiconductors -- Characterization -- Statistical methods -- Con...
  • Subject Heading (ID)Semiconductors -- Characterization -- Statistical methods -- Con...
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