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2016 IEEE 23rd international symposium on the physical and failure analysis of integrated circuits (IPFA 2016) : Singapore : 18-21 July 2016 : IPFA conference : Jul 2016, Singapore.

2016 IEEE 23rd international symposium on the physical and failure analysis of integrated circuits (IPFA 2016) : Singapore : 18-21 July 2016 : IPFA conference : Jul 2016, Singapore.
Paper図書
IEEE[2016]<M17-18-1168>
National Diet Library

2015 IEEE 22nd international symposium on the physical and failure analysis of integrated circuits : (IPFA 2015) : Hsinchu, Taiwan : 29 June-2 July 2015 : events of IPFA 2015 : IPFA 2015 tutorial : IPFA 2015 exhibition : Jun 2015, Hsinchu, Taiwan.

2015 IEEE 22nd international symposium on the physical and failure analysis of integrated circuits : (IPFA 2015) : Hsinchu, Taiwan : 29 June-2 July 2015 : events of IPFA 2015 : IPFA 2015 tutorial : IPFA 2015 exhibition : Jun 2015, Hsinchu, Taiwan.
Paper図書
IEEE[2015]<M17-17-1530>
National Diet Library

2012 10th IEEE international conference on semiconductor electronics : (ICSE 2012) : Kuala Lumpur, Malaysia : 19-21 September 2012 : IEEE-ICSE2012 : ICSE2012 : IEEE-ICSE 2012 : Sep 2012, Kuala Lumpur, Malaysia. CFP12421

2012 10th IEEE international conference on semiconductor electronics : (ICSE 2012) : Kuala Lumpur, Malaysia : 19-21 September 2012 : IEEE-ICSE2012 : ICSE2012 : IEEE-ICSE 2012 : Sep 2012, Kuala Lumpur, Malaysia. CFP12421
Paper図書
IEEEc2012.<M17-13-2918>
National Diet Library

2014 IEEE 21st international symposium on the physical and failure analysis of integrated circuits : (IPFA 2014) : Singapore : 30 June-4 July 2014 : Jun 2014, Singapore.

2014 IEEE 21st international symposium on the physical and failure analysis of integrated circuits : (IPFA 2014) : Singapore : 30 June-4 July 2014 : Jun 2014, Singapore.
Paper図書
IEEE[2014]<M17-15-2494>
National Diet Library

2013 20th IEEE international symposium on the physical and failure analysis of integrated circuits : (IPFA 2013) : Suzhou, China : 15-19 July 2013 : IPFA2013 : Jul 2013, Suzhou, China. CFP13777-PRT

2013 20th IEEE international symposium on the physical and failure analysis of integrated circuits : (IPFA 2013) : Suzhou, China : 15-19 July 2013 : IPFA2013 : Jul 2013, Suzhou, China. CFP13777-PRT
Paper図書
IEEEc2013.<M17-14-1212>
National Diet Library

2012 19th IEEE international symposium on the physical and failure analysis of integrated circuits : (IPFA 2012) : Singapore : 2-6 July 2012 : Jul 2012, Singapore.

2012 19th IEEE international symposium on the physical and failure analysis of integrated circuits : (IPFA 2012) : Singapore : 2-6 July 2012 : Jul 2012, Singapore.
Paper図書
IEEEc2012.<M17-13-1384>
National Diet Library

2008 IEEE international conference on semiconductor electronics : ICSE 2008 : proceedings : 25-27 November, 2008 : Persada Johor International Convention Centre, Johor Bahru, Johor, Malaysia. : ICSE2008 : 8th ICSE : Nov 2008, Johor Bahru, Malaysia.

2008 IEEE international conference on semiconductor electronics : ICSE 2008 : proceedings : 25-27 November, 2008 : Persada Johor International Convention Centre, Johor Bahru, Johor, Malaysia. : ICSE2008 : 8th ICSE : Nov 2008, Johor Bahru, Malaysia.
Paper図書
IEEEc2008.<M17-11-2695>
National Diet Library
  • Subject HeadingSemiconductors -- Failures -- Congresses. Semiconductor ...

18th IEEE international symposium on the physical and failure analysis of integrated circuits : (IPFA 2011) : Incheon, South Korea : 4-7 July 2011 : Jul 2011, Incheon, Korea.

18th IEEE international symposium on the physical and failure analysis of integrated circuits : (IPFA 2011) : Incheon, South Korea : 4-7 July 2011 : Jul 2011, Incheon, Korea.
Paper図書
IEEEc2011.<M17-12-1685>
National Diet Library

2010 17th IEEE international symposium on the physical and failure analysis of integrated circuits : (IPFA 2010) : Singapore : 5-9 July 2010 : Jul 2010, Singapore.

2010 17th IEEE international symposium on the physical and failure analysis of integrated circuits : (IPFA 2010) : Singapore : 5-9 July 2010 : Jul 2010, Singapore.
Paper図書
IEEEc2010.<M17-12-238>
National Diet Library

Data mining and diagnosing IC fails

Data mining and diagnosing IC fails
Paper図書
Leendert M. HuismanSpringer2005
Other Libraries in Japan
  • Subject HeadingIntegrated circuits -- Testing -- Statistical methods Semiconductors -- Failures Data mining
  • Subject Heading (ID)Integrated circuits -- Testing -- Statistical methods Semiconductors -- Failures Data mining

Failure mechanisms in semiconductor devices 2nd ed.

Failure mechanisms in semiconductor devices 2nd ed.
Paper図書
E.Ajith Amerasekera, Farid N NajmWileyc1997
Other Libraries in Japan
  • Subject HeadingSemiconductors -- Failures
  • Subject Heading (ID)Semiconductors -- Failures

Integrated circuit failure analysis : a guide to preparation techniques

Integrated circuit failure analysis : a guide to preparation techniques
Paper図書
Friedrich Beck ; translated by Stephen S. WilsonJohn Wiley & Sonsc1998
Other Libraries in Japan
  • Subject HeadingSemiconductors -- Failures Semiconductors -- Testing
  • Subject Heading (ID)Semiconductors -- Failures Semiconductors -- Testing

Failure analysis of integrated circuits : tools and techniques

Failure analysis of integrated circuits : tools and techniques
Paper図書
edited by Lawrence C. WagnerKluwer Academic Publishersc1999
Other Libraries in Japan
  • Subject HeadingSemiconductors -- Failures Integrated circuits -- Testin...
  • Subject Heading (ID)Semiconductors -- Failures Integrated circuits -- Testin...

Electromigration and electronic device degradation : cloth : alk. paper

Electromigration and electronic device degradation : cloth : alk. paper
Paper図書
edited by Aris ChristouWileyc1994
Other Libraries in Japan
  • Subject HeadingIntegrated circuits -- Deterioration Semiconductors -- Failures Electrodiffusion
  • Subject Heading (ID)Integrated circuits -- Deterioration Semiconductors -- Failures Electrodiffusion

Reliability and degradation of III-V optical devices

Reliability and degradation of III-V optical devices
Paper図書
Osamu UedaArtech Housec1996
Other Libraries in Japan
  • Subject Heading...-- Reliability Semiconductors -- Failures Light emitting diodes -- Reli...
  • Subject Heading (ID)...-- Reliability Semiconductors -- Failures Light emitting diodes -- Reli...

The role of microscopy in semiconductor failure analysis

The role of microscopy in semiconductor failure analysis
Paper図書
B.P. Richards and P.K. FootnerOxford University Press : Royal Microscopical Society1992
Other Libraries in Japan
  • Subject HeadingSemiconductors -- Testing Semiconductors -- Failures Microscopes and microscopy
  • Subject Heading (ID)Semiconductors -- Testing Semiconductors -- Failures Microscopes and microscopy

Theory of CMOS digital circuits and circuit failures

Theory of CMOS digital circuits and circuit failures
Paper図書
Masakazu ShojiPrinceton University Pressc1992
Other Libraries in Japan
  • Subject Heading... Complementary Semiconductors -- Failures Digital integrated circuits -...
  • Subject Heading (ID)... Complementary Semiconductors -- Failures Digital integrated circuits -...

Failure mechanisms in semiconductor devices

Failure mechanisms in semiconductor devices
Paper図書
E.A. Amerasekera and D.S. CampbellWileyc1987
Other Libraries in Japan
  • Subject HeadingSemiconductors -- Failures
  • Subject Heading (ID)Semiconductors -- Failures

Wire bonding in microelectronics : materials, processes, reliability, and yield 2nd ed

Wire bonding in microelectronics : materials, processes, reliability, and yield 2nd ed
Paper図書
George G. HarmonMcGraw-Hillc1997
Other Libraries in Japan

Degradation mechanisms in III-V compound semiconductor devices and structures : symposium held April 17-18, 1990, San Francisco, California, U.S.A.

Degradation mechanisms in III-V compound semiconductor devices and structures : symposium held April 17-18, 1990, San Francisco, California, U.S.A.
Paper図書
editors, V. Swaminathan, S.J. Pearton, M.O. ManasrehMaterials Research Societyc1990
Other Libraries in Japan
  • Subject HeadingSemiconductors -- Reliability -- Congresses Semiconductors -- Failures -- Congresses
  • Subject Heading (ID)Semiconductors -- Reliability -- Congresses Semiconductors -- Failures -- Congresses

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