Jump to main content

yr 〜
yr

Search results 31

2016 32nd thermal measurement, modeling & management symposium : (SEMI-THERM 2016) : San Jose, California, USA : 14-17 March 2016 : SEMI-THERM short courses : SEMI-THERM 32 : 32nd annual conference on thermal design, management, measurement and characterization of semiconductor components and systems : Mar 2016, San Jose, CA.

2016 32nd thermal measurement, modeling & management symposium : (SEMI-THERM 2016) : San Jose, California, USA : 14-17 March 2016 : SEMI-THERM short courses : SEMI-THERM 32 : 32nd annual conference on thermal design, management, measurement and characterization of semiconductor components and systems : Mar 2016, San Jose, CA.
Paper図書
IEEE[2016]<M17-17-2413>
National Diet Library

Thermal sensors : principles and applications for semiconductor industries

Thermal sensors : principles and applications for semiconductor industries
Paper図書
Chandra Mohan Jha, editor.Springer[2015]<ND371-B95>
National Diet Library

2012 28th annual IEEE semiconductor thermal measurement and management symposium : (SEMI-THERM 2012) : San Jose, California, USA : 18-22 March 2012 : 28th annual IEEE thermal measurement, modeling and management symposium : ST28 : SEMI-THERM 28 vendor workshop : Mar 2012, San Jose, CA.

2012 28th annual IEEE semiconductor thermal measurement and management symposium : (SEMI-THERM 2012) : San Jose, California, USA : 18-22 March 2012 : 28th annual IEEE thermal measurement, modeling and management symposium : ST28 : SEMI-THERM 28 vendor workshop : Mar 2012, San Jose, CA.
Paper図書
IEEEc2012.<M17-12-4129>
National Diet Library

Rapid thermal processing and beyond : applications in semiconductor processing : special topic volume : selected papers from RTP specialists all over the world : Dornstadt, Germany / edited by W. Lerch and J. Niess. (Materials science forum ; v. 573-574)

Rapid thermal processing and beyond : applications in semiconductor processing : special topic volume : selected papers from RTP specialists all over the world : Dornstadt, Germany / edited by W. Lerch and J. Niess. (Materials science forum ; v. 573-574)
Paper図書
Trans Tech Publications Ltd.c2008.<X>
National Diet Library
  • Subject HeadingSemiconductors -- Thermal properties. Thermal processing.

Twenty fifth annual IEEE semiconductor thermal measurement and management symposium : proceedings 2009 : San Jose, CA USA : March 15-19, 2009. : SEMI-THERM 25 : Semi-Therm conference : Mar 2009, San Jose, CA.

Twenty fifth annual IEEE semiconductor thermal measurement and management symposium : proceedings 2009 : San Jose, CA USA : March 15-19, 2009. : SEMI-THERM 25 : Semi-Therm conference : Mar 2009, San Jose, CA.
Paper図書
IEEEc2009.<M17-11-184>
National Diet Library
  • Subject HeadingSemiconductors -- Thermal properties -- Congresses. Semiconductors...

Twenty second annual IEEE semiconductor thermal measurement and management symposium : SEMI-THERM : proceedings 2006 : Dallas, TX USA : March 14-16, 2006. : SEMI-THERM 22 : 22nd IEEE semiconductor thermal management, modeling and measurement symposium : Mar 2006, Dallas, TX.

Twenty second annual IEEE semiconductor thermal measurement and management symposium : SEMI-THERM : proceedings 2006 : Dallas, TX USA : March 14-16, 2006. : SEMI-THERM 22 : 22nd IEEE semiconductor thermal management, modeling and measurement symposium : Mar 2006, Dallas, TX.
Paper図書
IEEE[c2006]<M17-07-1504>
National Diet Library
  • Subject HeadingSemiconductors -- Thermal properties -- Congresses. Semiconductors...

Twentieth annual IEEE semiconductor thermal measurement and management symposium : March 9-11, 2004 : Fairmont Hotel : San Jose, CA USA. : SEMI-THERM 20 : Mar 2004, San Jose, CA.

Twentieth annual IEEE semiconductor thermal measurement and management symposium : March 9-11, 2004 : Fairmont Hotel : San Jose, CA USA. : SEMI-THERM 20 : Mar 2004, San Jose, CA.
Paper図書
IEEEc2004.<M17-04-3486>
National Diet Library
  • Subject HeadingSemiconductors -- Thermal properties -- Congresses. Semiconductors...

Nineteenth annual IEEE semiconductor thermal measurement and management symposium : SEMI-THERM : proceedings 2003 : San Jose, CA USA : March 11-13, 2003. : Mar 2003, San Jose, CA.

Nineteenth annual IEEE semiconductor thermal measurement and management symposium : SEMI-THERM : proceedings 2003 : San Jose, CA USA : March 11-13, 2003. : Mar 2003, San Jose, CA.
Paper図書
IEEEc2003.<M17-04-187>
National Diet Library
  • Subject HeadingSemiconductors -- Thermal properties -- Congresses. Semiconductors...

Eighteenth annual IEEE semiconductor thermal measurement and management symposium : SEMI-THERM : proceedings 2002 : San Jose, CA USA : March 12-14, 2002 : sessions: (...). : Mar 2002, San Jose, CA.

Eighteenth annual IEEE semiconductor thermal measurement and management symposium : SEMI-THERM : proceedings 2002 : San Jose, CA USA : March 12-14, 2002 : sessions: (...). : Mar 2002, San Jose, CA.
Paper図書
IEEEc2002.<M17-03-3929>
National Diet Library
  • Subject HeadingSemiconductors -- Thermal properties -- Congresses. Semiconductors...

Seventeenth annual IEEE semiconductor thermal measurement and management symposium : March 20-22, 2001 : Doubletree Hotel. 2001 semiconductor thermal measurement and management (SEMI-THERM) symposium : Mar 2001, San Jose, CA.

Seventeenth annual IEEE semiconductor thermal measurement and management symposium : March 20-22, 2001 : Doubletree Hotel. 2001 semiconductor thermal measurement and management (SEMI-THERM) symposium : Mar 2001, San Jose, CA.
Microform図書
IEEEc2001.<M17-LS-03-105>
National Diet Library
  • Subject HeadingSemiconductors -- Thermal properties -- Congresses. Semiconductors...

Thermal transport in semiconductors : first principles and phonon hydrodynamics

Thermal transport in semiconductors : first principles and phonon hydrodynamics
Paper図書
Pol Torres AlvarezSpringerc2018
Other Libraries in Japan
  • Subject HeadingPhysics Heat -- Transmission Semiconductors -- Thermal properties Hydrodynamics Thermodynamics ...
  • Subject Heading (ID)Physics Heat -- Transmission Semiconductors -- Thermal properties Hydrodynamics Thermodynamics ...

HOTPAC [microform] : programs for thermal analysis including version 3.0 of the TXYZ program, TXYZ 30, and the thermal multilayer program, TML / John Albers (Semiconductor measurement technology) (NIST special publication ; 400-96)

HOTPAC [microform] : programs for thermal analysis including version 3.0 of the TXYZ program, TXYZ 30, and the thermal multilayer program, TML / John Albers (Semiconductor measurement technology) (NIST special publication ; 400-96)
Microform図書
1995<YCA-C 13.10:400-96>
National Diet Library
  • Subject HeadingSemiconductors -- Thermal properties Thermal analysis -- Computer ...

Version 2.0 of the TXYZ thermal analysis program, TXYZ20 [microform] / John Albers (Semiconductor measurement technology) (NIST special publication ; 400-89)

Version 2.0 of the TXYZ thermal analysis program, TXYZ20 [microform] / John Albers (Semiconductor measurement technology) (NIST special publication ; 400-89)
Microform図書
1992<YCA-C 13.10:400-89>
National Diet Library
  • Subject HeadingSemiconductors -- Thermal properties Thermal analysis -- Computer ...

Lock-in thermography : basics and use for evaluating electronic devices and materials 2nd ed

Lock-in thermography : basics and use for evaluating electronic devices and materials 2nd ed
Paper図書
O. Breitenstein, W. Warta, M. LangenkampSpringerc2010
Other Libraries in Japan
  • Subject Heading...ces -- Testing Semiconductors -- Thermal properties Thermography
  • Subject Heading (ID)...ces -- Testing Semiconductors -- Thermal properties Thermography

Focus on semiconductor research

Focus on semiconductor research
Paper図書
Thomas B. Elliot, editorNova Sciencec2005
Other Libraries in Japan
  • Subject HeadingSemiconductors -- Research Semiconductors -- Thermal properties Semiconductors -- Effect of r...
  • Subject Heading (ID)Semiconductors -- Research Semiconductors -- Thermal properties Semiconductors -- Effect of r...

Power-constrained testing of VLSI circuits

Power-constrained testing of VLSI circuits
Paper図書
by Nicola Nicolici and Bashir M. Al-HashimiKluwer Academicc2003
Other Libraries in Japan
  • Subject HeadingIntegrated circuits -- Very large scale integration Semiconductors -- Thermal properties
  • Subject Heading (ID)Integrated circuits -- Very large scale integration Semiconductors -- Thermal properties

Lock-in thermography : basics and use for functional diagnostics of electronic components

Lock-in thermography : basics and use for functional diagnostics of electronic components
Paper図書
O. Breitenstein, M. LangenkampSpringerc2003
Other Libraries in Japan
  • Subject Heading...raphic methods Semiconductors -- Thermal properties Semiconductors -- Testing -- ...
  • Subject Heading (ID)...raphic methods Semiconductors -- Thermal properties Semiconductors -- Testing -- ...

Amorphous solids : low-temperature properties / edited by W. A. Phillips ; with contributions by A. C. Anderson ... [et al.]. (Topics in current physics ; 24)

Amorphous solids : low-temperature properties / edited by W. A. Phillips ; with contributions by A. C. Anderson ... [et al.]. (Topics in current physics ; 24)
Paper図書
Springer-Verlag1981.<MC151-57>
National Diet Library
  • Subject Heading...ies. Amorphous semiconductors -- Thermal properties. Materials at low temperature...

Teplofizicheskie svoĭstva poluprovodnikov.

Teplofizicheskie svoĭstva poluprovodnikov.
Paper図書
Atomizdat1972.<MC151-21>
National Diet Library
  • Subject HeadingSemiconductors -- Thermal properties.

8th Workshop on Photoacoustics and Photothermics : Szczyrk, Poland, February 27-28, 2003

8th Workshop on Photoacoustics and Photothermics : Szczyrk, Poland, February 27-28, 2003
Paper図書
edited by J. BodzentaEDP sciences[2003]
Other Libraries in Japan
  • Subject Heading... -- Congresses Semiconductors -- Thermal properties -- Congresses Acoustooptical ...
  • Subject Heading (ID)... -- Congresses Semiconductors -- Thermal properties -- Congresses Acoustooptical ...
RSS