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Dynamics of active light elements in functional materials : finding of new behaviors of lithium, hydrogen isotopes and carbon in materials by meV ion beam analysis techniques

Dynamics of active light elements in functional materials : finding of new behaviors of lithium, hydrogen isotopes and carbon in materials by meV ion beam analysis techniques
Paper図書
Kenji MoritaLAP LAMBERT Academic Publishing[2020]<ND416-D25>
National Diet Library
  • Subject Heading...egregation MeV ion beam analysis. (VLB-WN)1655: Chemi...

Plasma and low-energy ion-beam-assisted processing and synthesis of energy-related materials : April 1-5, 2013 : San Francisco, California, USA : Apr 2013, San Francisco, CA. (Materials Research Society Symposia Proceedings ; 1574)

Plasma and low-energy ion-beam-assisted processing and synthesis of energy-related materials : April 1-5, 2013 : San Francisco, California, USA : Apr 2013, San Francisco, CA. (Materials Research Society Symposia Proceedings ; 1574)
Paper図書
Cambridge University Press[2013]<M17-14-2582>
National Diet Library
  • Subject Heading...terials Plasma ion beam Low energy ion beam Assisted processing Synthesis

走査ダイヤモンドNV中心磁気プローブ顕微鏡の開発

走査ダイヤモンドNV中心磁気プローブ顕微鏡の開発
Digital博士論文障害者向け資料あり
貝沼, 雄太2022-03
National Diet Library
  • Subject HeadingNV center focused ion beam magnetometry magnetic imaging...

Focused ion beams for analysis and processing : November 27-December 1, 2006 : Boston, Massachusetts, USA. : Nov 2006, Boston, MA. (Materials Research Society Symposia Proceedings ; 983)

Focused ion beams for analysis and processing : November 27-December 1, 2006 : Boston, Massachusetts, USA. : Nov 2006, Boston, MA. (Materials Research Society Symposia Proceedings ; 983)
Paper図書
Materials Research Societyc2006.<M17-08-1978>
National Diet Library
  • Subject HeadingFocused ion beams -- Congresses.

宙吊りグラフェン・フォノニック結晶（GPnC)における熱輸送の研究

宙吊りグラフェン・フォノニック結晶（GPnC)における熱輸送の研究
Digital博士論文障害者向け資料あり
Haque, Mayeesha Masrura2020-09
National Diet Library
  • Subject Heading...anomesh Helium ion beam milling Phononic bandgap Resi...

Focused ion beams for materials characterization and micromachining : March 24-28, 2008 : San Francisco, California, USA. : Mar 2008, San Francisco, CA. (Materials Research Society Symposia Proceedings ; 1089)

Focused ion beams for materials characterization and micromachining : March 24-28, 2008 : San Francisco, California, USA. : Mar 2008, San Francisco, CA. (Materials Research Society Symposia Proceedings ; 1089)
Paper図書
Materials Research Societyc2008.<M17-09-2070>
National Diet Library
  • Subject HeadingFocused ion beams -- Industrial applications -...

Nanoscale materials modification by photon, ion, and electron beams : April 9-13, 2012 : San Francisco, California, USA : Apr 2012, San Francisco, CA. (Materials Research Society Symposia Proceedings ; 1455)

Nanoscale materials modification by photon, ion, and electron beams : April 9-13, 2012 : San Francisco, California, USA : Apr 2012, San Francisco, CA. (Materials Research Society Symposia Proceedings ; 1455)
Paper図書
Cambridge University Pressc2012.<M17-13-3111>
National Diet Library
  • Subject Heading...s Photon beams Ion beams MRS

Nanoscale materials modification by photon, ion, and electron beams : April 9-13, 2012 : San Francisco, California, USA : Apr 2012, San Francisco, CA. (Materials Research Society Symposia Proceedings ; 1450)

Nanoscale materials modification by photon, ion, and electron beams : April 9-13, 2012 : San Francisco, California, USA : Apr 2012, San Francisco, CA. (Materials Research Society Symposia Proceedings ; 1450)
Paper図書
Cambridge University Pressc2012.<M17-13-3109>
National Diet Library
  • Subject Heading...s Photon beams Ion beams MRS

Analysis of Scars and Keloids by Focused Ion Beam/Scanning Electron Microscopy: Distinguishing Between Hypertrophic Scars and Keloids

Analysis of Scars and Keloids by Focused Ion Beam/Scanning Electron Microscopy: Distinguishing Between Hypertrophic Scars and Keloids
Digital博士論文障害者向け資料あり
右田, 尚2020-04-01
National Diet Library
  • Subject Headingcell-cell interaction focused ion beam/scanning electron microscopic...

炭素イオン線の抗腫瘍効果に対する5-アミノレブリン酸の増感作用と機序の解明

炭素イオン線の抗腫瘍効果に対する5-アミノレブリン酸の増感作用と機序の解明
Digital博士論文障害者向け資料あり
金子, 友子2018-09-27
National Diet Library
  • Subject Heading5-Aminolevulinic acid carbon-ion beam mitochondria protoporphyrin I...

イオン蒸着によるSiヘテロ界面形成と制御に関する基礎研究

イオン蒸着によるSiヘテロ界面形成と制御に関する基礎研究
Paper図書
生地, 文也, 九州共立大学1995-1997<Y151-H07650039>
National Diet Library
  • Subject Heading...Ion Scuttering Ion beam deposition Thin Film Surtace ...

Area-selective electroless deposition of gold nanostructures on silicon

Area-selective electroless deposition of gold nanostructures on silicon
Digital博士論文障害者向け資料あり
Itasaka, Hiroki2016-03-23
Available onlineNational Diet LibraryOther Libraries in Japan
  • Subject Headingsilicon gold nanostructure electroless deposition focused ion beam tip-enhanced Raman spectrosco...

The EGFR mutation status affects the relative biological effectiveness of carbon-ion beams in non-small cell lung carcinoma cells

The EGFR mutation status affects the relative biological effectiveness of carbon-ion beams in non-small cell lung carcinoma cells
Digital博士論文障害者向け資料あり
Napapat, Amornwichet群馬大学医学系研究科2016-03-23
National Diet Library
  • Subject HeadingCarbon-ion beams relative biological effectiv...

Low-energy sputtering research [microform] / P.K. Ray and V. Shutthanandan ([NASA contractor report] ; NASA/CR-1999-209162)

Low-energy sputtering research [microform] / P.K. Ray and V. Shutthanandan ([NASA contractor report] ; NASA/CR-1999-209162)
Microform図書
1999<YCA-NAS 1.26:209162>
National Diet Library
  • Subject HeadingPropulsion Molybdenum Xenon Ion currents Sputtering Accumulators Backscattering Ion beams

Ion figuring of X-ray mirror mandrels [microform] : final report, period of performance: June 14, 1996 to June 5, 1997; contract no. NAS83-8609 D.O. 166 / Thomas M. Cantey, Don A. Gregory (principal investigator) ([NASA contractor report] ; 205763)

Ion figuring of X-ray mirror mandrels [microform] : final report, period of performance: June 14, 1996 to June 5, 1997; contract no. NAS83-8609 D.O. 166 / Thomas M. Cantey, Don A. Gregory (principal investigator) ([NASA contractor report] ; 205763)
Microform図書
1997<YCA-NAS 1.26:205763>
National Diet Library
  • Subject HeadingIon beams Machining Surface finishing ...

Deep fluid characteristics in the subduction zone: A window from metamorphic quartz veins

Deep fluid characteristics in the subduction zone: A window from metamorphic quartz veins
Digital博士論文障害者向け資料あり
Yoshida, Kenta2015-03-23
Available onlineNational Diet LibraryOther Libraries in Japan
  • Subject Heading...c belt focused ion beam X-ray CT

Low-energy sputtering studies of boron nitride with xenon ions [microform] / P.K. Ray and V. Shutthanandan ([NASA contractor report] ; NASA/CR-1999-208873)

Low-energy sputtering studies of boron nitride with xenon ions [microform] / P.K. Ray and V. Shutthanandan ([NASA contractor report] ; NASA/CR-1999-208873)
Microform図書
1999<YCA-NAS 1.26:208873>
National Diet Library
  • Subject Heading...Heavy elements Ion beams Electron guns Charged partic...

走査ダイヤモンドNV中心磁気プローブ顕微鏡の開発

走査ダイヤモンドNV中心磁気プローブ顕微鏡の開発
Digital博士論文
貝沼, 雄太2022-03
Available onlineOther Libraries in Japan
  • Subject HeadingNV center focused ion beam magnetometry magnetic imaging...

Raw data files for Fig. 7 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"

Raw data files for Fig. 7 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
Digital文書・図像類
2022-12-14
Available onlineOther Libraries in Japan
  • Subject HeadingAuger depth profiling analysis HfO2/Si Ultra low angle incidence ion beam

Raw data files for Fig. 8 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"

Raw data files for Fig. 8 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
Digital文書・図像類
2022-11-15
Available onlineOther Libraries in Japan
  • Subject HeadingAuger depth profiling analysis HfO2/Si Ultra low angle incidence ion beam
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