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2005 IEEE international workshop on current & defect based testing (DBT 2005) : proceedings : May 1, 2005 : Lodge at Rancho Mirage, Palm Springs, USA. : DBT-2005 : May 2005, Palm Springs, CA.

2005 IEEE international workshop on current & defect based testing (DBT 2005) : proceedings : May 1, 2005 : Lodge at Rancho Mirage, Palm Springs, USA. : DBT-2005 : May 2005, Palm Springs, CA.
紙図書
IEEEc2005.<M17-07-543>
国立国会図書館
  • 件名...-- Congresses. Iddq testing -- Congresses. Metal oxide semiconductors, C...

2004 IEEE international workshop on current & defect based testing (DBT 2004) : proceedings : April 25, 2004 : Napa Valley Marriott, Napa Valley, CA, USA. : DBT-2004 : Apr 2004, Napa Valley, CA.

2004 IEEE international workshop on current & defect based testing (DBT 2004) : proceedings : April 25, 2004 : Napa Valley Marriott, Napa Valley, CA, USA. : DBT-2004 : Apr 2004, Napa Valley, CA.
紙図書
IEEEc2004.<M17-05-2561>
国立国会図書館
  • 件名...-- Congresses. Iddq testing -- Congresses.

Digest of papers, IEEE International Workshop on IDDQ Testing : November 5-6, 1997, Washington, D.C.

Digest of papers, IEEE International Workshop on IDDQ Testing : November 5-6, 1997, Washington, D.C.
紙図書
edited by Anura P. Jayasumana ; sponsored by IEEE Computer Society Technical Committee on Test TechnologyIEEE Computer Society Pressc1997
全国の図書館

Digest of papers : 1996 IEEE International Workshop on IDDQ Testing, October 24-25, 1996, Washington, D.C.

Digest of papers : 1996 IEEE International Workshop on IDDQ Testing, October 24-25, 1996, Washington, D.C.
紙図書
edited by Carol Tong, Anura Jayasumana ; sponsored by IEEE Computer Society Technical Committee on Test TechnologyIEEE Computer Society Pressc1996
全国の図書館

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