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年

検索結果 5 件

2016 IEEE international symposium on defect and fault tolerance in VLSI and nanotechnology systems : (DFT 2016) : Storrs, Connecticut, USA : 19-20 September 2016 : Sep 2016, Storrs, CT.

2016 IEEE international symposium on defect and fault tolerance in VLSI and nanotechnology systems : (DFT 2016) : Storrs, Connecticut, USA : 19-20 September 2016 : Sep 2016, Storrs, CT.
紙図書
IEEE[2016]<M17-18-354>
国立国会図書館
  • 件名...e--Congresses. Integrated circuits--Fault tolerance. Integrated circuits--Very lar...

2015 IEEE international symposium on defect and fault tolerance in VLSI and nanotechnology systems : (DFTS 2015) : Amherst, Massachusetts, USA : 12-14 October 2015 : DFT 2015 : Oct 2015, Amherst, MA.

2015 IEEE international symposium on defect and fault tolerance in VLSI and nanotechnology systems : (DFTS 2015) : Amherst, Massachusetts, USA : 12-14 October 2015 : DFT 2015 : Oct 2015, Amherst, MA.
紙図書
IEEE[2015]<M17-17-636>
国立国会図書館

2014 IEEE international symposium on defect and fault tolerance in VLSI and nanotechnology systems : (DFT 2014) : Amsterdam, Netherlands : 1-3 October 2014 : Oct 2014, Amsterdam, the Netherlands.

2014 IEEE international symposium on defect and fault tolerance in VLSI and nanotechnology systems : (DFT 2014) : Amsterdam, Netherlands : 1-3 October 2014 : Oct 2014, Amsterdam, the Netherlands.
紙図書
IEEE[2014]<M17-16-1280>
国立国会図書館

Strain-engineered MOSFETs : hbk.

Strain-engineered MOSFETs : hbk.
紙図書
C. K. Maiti, T. K. MaitiTaylor & Francisc2013
全国の図書館

Digital circuit testing and testability

Digital circuit testing and testability
紙図書
Parag K. LalaAcademic Pressc1997
全国の図書館

検索結果は以上です。