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Test 1988 : Conference for test and instrumentation users : Jun 1988, Boston, MA.

Test 1988 : Conference for test and instrumentation users : Jun 1988, Boston, MA.
Paper図書
MG Expositions Group1988.<M17-89-1444>
National Diet Library
  • Author HeadingAmerican Society of Test Engineers. Electronics Test. Computer/Electronic Service N...

Innovations in test : ATE and instrumentation conference west : Jan 1989, Anaheim, CA.

Innovations in test : ATE and instrumentation conference west : Jan 1989, Anaheim, CA.
Paper図書
MG Expositions Group1989.<M17-90-0514>
National Diet Library
  • Note (General)Papers. Index term: test ; ATE ; instrumentation ; electronics test. BL shelfmark: 8796.32742 1989...

Get ready for the next decade of test : ATE and instrumentation conference west : Jan 1990, Anaheim, CA.

Get ready for the next decade of test : ATE and instrumentation conference west : Jan 1990, Anaheim, CA.
Paper図書
Miller Freeman Expositions, a member of the United Newspapers Group1990.<M17-92-0990>
National Diet Library

TEST 1988 : ATE and instrumentation conference West : Jan 1988, Anaheim, CA.

TEST 1988 : ATE and instrumentation conference West : Jan 1988, Anaheim, CA.
Paper図書
MG Expositions Group1988.<M17-89-1443>
National Diet Library
  • Note (General)Papers. Index term: test ; ATE ; instrumentation ; electronics test. BL shelfmark: 8796.32742 1988...

Test 1989 : winning test solutions for the '90s : ATE and instrumentation conference east : Jun 1989, Boston, MA.

Test 1989 : winning test solutions for the '90s : ATE and instrumentation conference east : Jun 1989, Boston, MA.
Paper図書
MG Expositions Group1989.<M17-92-0989>
National Diet Library

Proceedings / ATE Central Seminar/Exhibit, Electronics Test & Measurement Conference, October 25-28, 1982, O'Hare Exosition Center, Hyatt Regency O'Hare, Rosemont, IL.

Proceedings / ATE Central Seminar/Exhibit, Electronics Test & Measurement Conference, October 25-28, 1982, O'Hare Exosition Center, Hyatt Regency O'Hare, Rosemont, IL.
Paper図書
Morgan-Grampian Expositions Groupc1982.<M15-A2582>
National Diet Library

Conference on Electronic Test and Measuring Instrumentation--Testmex 79, 19-21 June, 1979 / organised by the Institution of Electrical Engineers, in association with the Institute of Electrical and Electronics Engineers (United Kingdom and Republic of Ireland Section) ... [et al.]. (I.E.E. conference publication ; no. 174)

Conference on Electronic Test and Measuring Instrumentation--Testmex 79, 19-21 June, 1979 / organised by the Institution of Electrical Engineers, in association with the Institute of Electrical and Electronics Engineers (United Kingdom and Republic of Ireland Section) ... [et al.]. (I.E.E. conference publication ; no. 174)
Paper図書
Institution of Electrical Engineersc1979.<ND416-40>
National Diet Library

Proceedings

Proceedings
Paper図書
CADCON Computer-Aided Design Conference, January 17-19, 1983, Disneyland Hotel & Convention Center, Anaheim, CA ; sponsored by Electronic Imaging, Circuits Manufacturing, Contractor, Digital Design, Electronics Test magazines ; director, Robert A. Poggi ; conference chairman, Carl MachoverMorgan-Grampian Expositions Group[1983?]
Other Libraries in Japan

ATE Central : Conference : OCT 1985, Rosemont, IL.

ATE Central : Conference : OCT 1985, Rosemont, IL.
Paper図書
<M17-86-0360>
National Diet Library
  • Note (General)Papers. Index term: ATE ; ELECTRONICS TEST.
  • Author HeadingElectronics Test.

ATE East : Conference : JUN 1984, Boston, MA.

ATE East : Conference : JUN 1984, Boston, MA.
Paper図書
<M17-86-0355>
National Diet Library
  • Note (General)Papers and Abstracts. Index term: ATE ; ELECTRONICS TEST. BL shelfmark: 1765.834 1984.
  • Author HeadingElectronics Test.

ATE Central : Conference : OCT 1984, Dallas, TX.

ATE Central : Conference : OCT 1984, Dallas, TX.
Paper図書
<M17-86-0356>
National Diet Library
  • Note (General)Papers and Abstracts. Index term: ATE ; ELECTRONICS TEST.
  • Author HeadingElectronics Test.

ATE Silicon Valley : Conference : APR 1984, San Mateo, CA.

ATE Silicon Valley : Conference : APR 1984, San Mateo, CA.
Paper図書
<M17-86-0354>
National Diet Library
  • Note (General)Papers and Abstracts. Index term: ATE ; ELECTRONICS TEST. BL shelfmark: 1765.834 1984.
  • Author HeadingElectronics Test.

ATE northwest : Conference : APR 1985, San Mateo, CA.

ATE northwest : Conference : APR 1985, San Mateo, CA.
Paper図書
<M17-86-0358>
National Diet Library
  • Note (General)Papers. Index term: ATE ; ELECTRONICS TEST. BL shelfmark: 1765.834 1985.
  • Author HeadingElectronics Test.

ATE east : Conference : JUN 1985, Boston, MA.

ATE east : Conference : JUN 1985, Boston, MA.
Paper図書
<M17-86-0359>
National Diet Library
  • Note (General)Papers. Index term: ATE ; ELECTRONICS TEST. BL shelfmark: 1765.834 1985.
  • Author HeadingElectronics Test.

ATE west : Conference : JAN 1985, Anaheim, CA.

ATE west : Conference : JAN 1985, Anaheim, CA.
Paper図書
<M17-86-0357>
National Diet Library
  • Note (General)Papers. Index term: ATE ; ELECTRONICS TEST. BL shelfmark: 1765.834 1985.
  • Author HeadingElectronics Test.

Test Solutions : Test Engineering Conference : Jun 1990, Boston, MA.

Test Solutions : Test Engineering Conference : Jun 1990, Boston, MA.
Paper図書
<M17-92-0991>
National Diet Library

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