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Defect based testing -- : Defect based testing : International workshop : Apr 2000, Montreal, Canada.

Defect based testing -- : Defect based testing : International workshop : Apr 2000, Montreal, Canada.
Paper図書
IEEE Computer Society2000.<M17-01-0696>
National Diet Library

Proceedings of the eighth Asian test symposium -- : Asian test symposium : 8th : Nov 1999, Shanghai, China.

Proceedings of the eighth Asian test symposium -- : Asian test symposium : 8th : Nov 1999, Shanghai, China.
Paper図書
IEEE1999.<M17-00-0968>
National Diet Library

Proceedings, 16th IEEE VLSI Test Symposium : April 26-30, 1998, Monterey, California

Proceedings, 16th IEEE VLSI Test Symposium : April 26-30, 1998, Monterey, California
Paper図書
sponsored by IEEE Computer Society Test Technology Technical Committee, IEEE Philadelphia SectionIEEE Computer Societyc1998
Other Libraries in Japan
  • Author HeadingIEEE VLSI Test Symposium IEEE Computer Society. Test Technology Technical Committee Institute of Electrical and E...

Proceedings, 17th IEEE VLSI Test Symposium : April 25-29, 1999, Dana Point, California

Proceedings, 17th IEEE VLSI Test Symposium : April 25-29, 1999, Dana Point, California
Paper図書
sponsored by IEEE Computer Society Test Technology Technical CouncilIEEE Computer Societyc1999
Other Libraries in Japan
  • Author HeadingIEEE VLSI Test Symposium IEEE Computer Society. Test Technology Technical Committee

Proceedings, 15th IEEE VLSI Test Symposium : April 27-May 1, 1997, Monterey, California : pbk

Proceedings, 15th IEEE VLSI Test Symposium : April 27-May 1, 1997, Monterey, California : pbk
Paper図書
sponsored by IEEE Computer Society Test Technology Technical Committee, IEEE Philadelphia SectionIEEE Computer Society Pressc1997
Other Libraries in Japan
  • Author HeadingIEEE VLSI Test Symposium IEEE Computer Society. Test Technology Technical Committee Institute of Electrical and E...

Proceedings : 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, November 2-4, 1998, Austin, Texas : microfiche

Proceedings : 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, November 2-4, 1998, Austin, Texas : microfiche
Paper図書
sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technical CommitteeIEEE Computer Societyc1998
Other Libraries in Japan
  • Author Heading...rant Computing IEEE Computer Society. Test Technology Technical Committee IEEE International Symposium ...

Proceedings of the Third Asian Test Symposium, November 15-17, 1994, Nara, Japan : paper : microfiche

Proceedings of the Third Asian Test Symposium, November 15-17, 1994, Nara, Japan : paper : microfiche
Paper図書
sponsored by the IEEE Computer Society. Test Technology Technical Committee ; in cooperation with Technical Group on Fault Tolerant Systems, IEICE ... [et al.]IEEE Computer Society Pressc1994
Other Libraries in Japan
  • Author HeadingAsian Test Symposium IEEE Computer Society. Test Technology Technical Committee IEICE. Technical Group on Fau...

Proceedings : First Asian Test Symposium (ATS'92), November 26-27, 1992, Hiroshima, Japan : microfiche : hard

Proceedings : First Asian Test Symposium (ATS'92), November 26-27, 1992, Hiroshima, Japan : microfiche : hard
Paper図書
sponsored by IEEE Computer Society Test Technology Technical CommitteeIEEE Computer Society Press1992
Other Libraries in Japan
  • Author HeadingAsian Test Symposium IEEE Computer Society. Test Technology Technical Committee Institute of Electrical and E...

Digest of papers : 1992 IEEE VLSI Test Symposium 10th anniversary, April 7-9, 1992, Bally's Park Place Casino Hotel, Atlantic City, New Jersey, USA : design, test, and application, ASICs and systems-on-a-chip

Digest of papers : 1992 IEEE VLSI Test Symposium 10th anniversary, April 7-9, 1992, Bally's Park Place Casino Hotel, Atlantic City, New Jersey, USA : design, test, and application, ASICs and systems-on-a-chip
Paper図書
sponsored by the IEEE Computer Society, Test Technology Technical Committee, and IEEE Philadelphia SectionThe Society : Institute of Electrical and Electronics Engineersc1992
Other Libraries in Japan
  • Author HeadingIEEE VLSI Test Symposium IEEE Computer Society. Test Technology Technical Committee Institute of Electrical and E...

Proceedings : International Workshop on Memory Technology, Design and Testing, August 24-25, 1998, San Jose, California, USA

Proceedings : International Workshop on Memory Technology, Design and Testing, August 24-25, 1998, San Jose, California, USA
Paper図書
sponsored by IEEE Computer Society Technical Committee on Test Technology, Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuit Society ; edited by D. Lepejian, ... [et al.]IEEE Computer Society Pressc1998
Other Libraries in Japan
  • Author Heading...g Lepejian, D. IEEE Computer Society. Test Technology Technical Committee IEEE Computer Society. Techni...

Proceedings of the Second Asian Test Symposium, November 16-18, 1993, Beijing, China : paper : microfiche

Proceedings of the Second Asian Test Symposium, November 16-18, 1993, Beijing, China : paper : microfiche
Paper図書
sponsored by the IEEE Computer Society, Test Technology Technical Committee ; in cooperation with China Computer Federation (CCF), Institute of Computing Technology (ICT), CAS, National Natural Science Foundation of China (NSFC)IEEE Computer Society Pressc1993
Other Libraries in Japan
  • Author Heading...eijing, China) IEEE Computer Society. Test Technology Technical Committee

Digest of papers : 1991 IEEE VLSI Test Symposium : chip-to-system test concerns for the 90's : April 15-17, 1991, Bally's Park Place Casino Hotel, Atlantic City, New Jersey, USA : soft. : micro.

Digest of papers : 1991 IEEE VLSI Test Symposium : chip-to-system test concerns for the 90's : April 15-17, 1991, Bally's Park Place Casino Hotel, Atlantic City, New Jersey, USA : soft. : micro.
Paper図書
sponsored by the IEEE Computer Society, Test Technology Technical Committee and IEEE Philadelphia SectionIEEEc1991
Other Libraries in Japan
  • Author HeadingIEEE VLSI Test Symposium IEEE Computer Society. Test Technology Technical Committee Institute of Electrical and E...

Bridging faults and IDDQ testing : pbk. : fiche

Bridging faults and IDDQ testing : pbk. : fiche
Paper図書
[edited] by Y.K. Malaiya and R. RajsumanIEEE Computer Society Press1992
Other Libraries in Japan
  • Author HeadingMalaiya, Yashwant K. Rajsuman, Rochit IEEE Computer Society. Test Technology Technical Committee

The changing philosophy of test : International Test Conference 1990 proceedings : September 10-14, 1990, Sheraton Washington Hotel, Washington, DC : paper : microfiche : case

The changing philosophy of test : International Test Conference 1990 proceedings : September 10-14, 1990, Sheraton Washington Hotel, Washington, DC : paper : microfiche : case
Paper図書
sponsored by the IEEE Computer Society, Test Technology Technical Committee and IEEE Philadelphia SectionTokyo : IEEE Computer Society Pressc1990
Other Libraries in Japan
  • Author HeadingInternational Test Conference IEEE Computer Society. Test Technology Technical Committee Institute of Electrical and E...

Proceedings : International Workshop on Memory Technology, Design, and Testing

Proceedings : International Workshop on Memory Technology, Design, and Testing
Paper図書
edited by F. Lombardi, R. Rajsuman, and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits CouncilIEEE Computer Society Pressc1997
Other Libraries in Japan
  • Author Heading...it Wik, Thomas IEEE Computer Society. Test Technology Technical Committee IEEE Computer Society. Techni...

ITC : International Test Conference : Meeting the tests of time, August 29-31, 1989, Sheraton Washington Hotel, Washington, DC

ITC : International Test Conference : Meeting the tests of time, August 29-31, 1989, Sheraton Washington Hotel, Washington, DC
Paper図書
Sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia SectionIEEE Computer Society Press1989
Other Libraries in Japan
  • Author HeadingInternational Test Conference IEEE Computer Society. Test Technology Technical Committee Institute of Electrical and E...

Proceedings: the fifth International Workshop on Rapid System Prototyping : shortening the path from specification to prototype, Grenoble, France, June 21-23, 1994 paper microfiche

Proceedings: the fifth International Workshop on Rapid System Prototyping : shortening the path from specification to prototype, Grenoble, France, June 21-23, 1994 paper microfiche
Paper図書
sponsored by the IEEE Computer Society Technical Committee on Simulation, IEEE Computer Society Technical Committee on Test Technology, Association for Computing Machinery SIGSIMIEEE Computer Society Pressc1994
Other Libraries in Japan
  • Author Heading... on Simulation IEEE Computer Society. Test Technology Technical Committee ACM Special Interest Group on...

Records of the IEEE International Workshop on Memory Technology, Design, and Testing, August 8-9, 1994, San Jose, California

Records of the IEEE International Workshop on Memory Technology, Design, and Testing, August 8-9, 1994, San Jose, California
Paper図書
edited by R. Rajsuman ; sponsored by IEEE Computer Society Technical Committee on Test Technology in cooperation with the IEEE Computer Society Technical Committee on VLSIIEEE Computer Society Pressc1994
Other Libraries in Japan
  • Author Heading...jsuman, Rochit IEEE Computer Society. Test Technology Technical Committee IEEE Computer Society. Techni...

Proceedings : the sixth IEEE International Workshop on Rapid System Prototyping : shortening the path from specification to prototype, June 7-9 , 1995, Chapel Hill, North Carolina paper

Proceedings : the sixth IEEE International Workshop on Rapid System Prototyping : shortening the path from specification to prototype, June 7-9 , 1995, Chapel Hill, North Carolina paper
Paper図書
workshop chair, Nick Kanopoulos, program chair, Rudy Lauwereins, proceedings editor, Rudy Lauwereins ; sponsored by the IEEE Computer Society Technical Committee on Design Automation, the IEEE Computer Society Technical Committee on Test TechnologyIEEE Computer Society Pressc1995
Other Libraries in Japan
  • Author Heading...uwereins, Rudy IEEE Computer Society. Test Technology Technical Committee

Proceedings : International Test Conference 1999 : soft : case : microfiche

Proceedings : International Test Conference 1999 : soft : case : microfiche
Paper図書
[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section]International Test Conferencec1999
Other Libraries in Japan
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