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Search results 13

Defect and fault tolerance in VLSI systems : International symposium : Nov 1998, Austin, TX.

Defect and fault tolerance in VLSI systems : International symposium : Nov 1998, Austin, TX.
Paper図書
IEEE Computer Society Press1998.<M17-99-1519>
National Diet Library
  • Author Heading...ant Computing. Institute of Electrical and Electronics Engineers. Computer Society. Test Technology Technical Committee.

1st Asian test symposium : Nov 1992, Hiroshima, Japan.

1st Asian test symposium : Nov 1992, Hiroshima, Japan.
Paper図書
IEEE Computer Society Press1992.<M17-94-0817>
National Diet Library
  • Author HeadingInstitute of Electrical and Electronics Engineers. Computer Society. Test Technology Technical Committee.

25th International test conference Oct 1994, Washington, DC.

25th International test conference Oct 1994, Washington, DC.
Microform図書
IEEE1994.<M17-95-1333-LS>
National Diet Library
  • Author HeadingInstitute of Electrical and Electronics Engineers. Computer Society. Test Technology Technical Committee. Institute of Electrical and E...

22nd International test conference Oct 1991, Nashville, TN.

22nd International test conference Oct 1991, Nashville, TN.
Microform図書
IEEE1991.<M17-92-2251-LS>
National Diet Library
  • Author HeadingInstitute of Electrical and Electronics Engineers. Computer Society. Test Technology Technical Committee.

6th Asian test symposium : Nov 1997, Akita, Japan.

6th Asian test symposium : Nov 1997, Akita, Japan.
Paper図書
IEEE1997.<M17-98-1863>
National Diet Library

International test conference Sep 1992, Baltimore, MD.

International test conference Sep 1992, Baltimore, MD.
Microform図書
IEEE1992.<M17-94-0938-LS>
National Diet Library
  • Author HeadingInstitute of Electrical and Electronics Engineers. Computer Society. Test Technology Technical Committee. Institute of Electrical and E...

VLSI test : 9th Symposium : Apr 1991, Atlantic City, NJ.

VLSI test : 9th Symposium : Apr 1991, Atlantic City, NJ.
Paper図書
IEEE1991.<M17-94-0805>
National Diet Library
  • Author HeadingInstitute of Electrical and Electronics Engineers. Computer Society. Test Technology Technical Committee. Institute of Electrical and E...

ETC '89 1st European test conference : Apr 1989, Paris.

ETC '89 1st European test conference : Apr 1989, Paris.
Microform図書
IEEE1989.<M17-90-0590-LS>
National Diet Library
  • Author HeadingInstitute of Electrical and Electronics Engineers. Computer Society. Test Technology Technical Committee.

Meeting the tests of time 20th International test conference : Aug 1989, Washington, DC.

Meeting the tests of time 20th International test conference : Aug 1989, Washington, DC.
Microform図書
IEEE1989.<M17-90-2538-LS>
National Diet Library
  • Author HeadingInstitute of Electrical and Electronics Engineers. Computer Society. Test Technology Technical Committee.

The changing philosophy of test 21st International test conference : Sep 1990, Washington, DC.

The changing philosophy of test 21st International test conference : Sep 1990, Washington, DC.
Microform図書
IEEE Computer Society Press1990.<M17-92-0701-LS>
National Diet Library
  • Author HeadingInstitute of Electrical and Electronics Engineers. Computer Society. Test Technology Technical Committee. Institute of Electrical and E...

7th Asian test symposium : Dec 1998, Singapore.

7th Asian test symposium : Dec 1998, Singapore.
Paper図書
IEEE1998.<M17-99-2166>
National Diet Library

2nd Asian test symposium : Nov 1993, Beijing, China.

2nd Asian test symposium : Nov 1993, Beijing, China.
Paper図書
<M17-94-1548>
National Diet Library
  • Author HeadingInstitute of Electrical and Electronics Engineers. Computer Society. Test Technology Technical Committee.

3rd Asian test symposium : Nov 1994, Nara, Japan.

3rd Asian test symposium : Nov 1994, Nara, Japan.
Paper図書
<M17-95-0892>
National Diet Library
  • Author HeadingInstitute of Electrical and Electronics Engineers. Computer Society. Test Technology Technical Committee.

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