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Drying technologies for biotechnology and pharmaceutical applications

Drying technologies for biotechnology and pharmaceutical applications
Paper図書
edited by Satoshi Ohtake, Ken-ichi Izutsu, David Lechuga-Ballesteros.Wiley-VCH[2020]<PA161-D7>
National Diet Library
  • Author HeadingOhtake, Satoshi. Izutsu, Ken'ichi. [伊豆津健一] Lec...

An Approach to RTL False Path Mapping Using Uniqueness of Paths

An Approach to RTL False Path Mapping Using Uniqueness of Paths
Digital文書・図像類
Iwata, Hiroshi, Ohtake, Satoshi, Fujiwara, HideoNara Institute of Science and Technology2009-09Information Science Technical ReportTR2009004
Available onlineOther Libraries in Japan

Over-testing reduction for delay faults through false path exclusion using RTL information

Over-testing reduction for delay faults through false path exclusion using RTL information
Digital文書・図像類
Yoshikawa, Yuki, Ohtake, Satoshi, Fujiwara, HideoNara Institute of Science and Technology2007-06Information Science Technical ReportTR2007012
Available onlineOther Libraries in Japan

An approach to reduce over-testing of path delay faults in data paths using RT-level information

An approach to reduce over-testing of path delay faults in data paths using RT-level information
Digital文書・図像類
Yoshikawa, Yuki, Ohtake, Satoshi, Fujiwara, HideoNara Institute of Science and Technology2006-02Information Science Technical ReportTR2006001
Available onlineOther Libraries in Japan

Design for testability based on single-port-change delay testing for data paths

Design for testability based on single-port-change delay testing for data paths
Digital文書・図像類
Yoshikawa, Yuki, Ohtake, Satoshi, Inoue, Michiko, Fujiwara, HideoNara Institute of Science and Technology2005-08Information Science Technical ReportTR2005005
Available onlineOther Libraries in Japan

Acceleration of transition test generation for acyclic sewuential circuits utilizing constrained combinational stuck-at test generation

Acceleration of transition test generation for acyclic sewuential circuits utilizing constrained combinational stuck-at test generation
Digital文書・図像類
Iwagaki, Tsuyoshi, Ohtake, Satoshi, Fujiwara, HideoNara Institute of Science and Technology2004-12Information Science Technical ReportTR2004009
Available onlineOther Libraries in Japan

Reducibility of sequential test generation to combinational test generation for several delay fault models

Reducibility of sequential test generation to combinational test generation for several delay fault models
Digital文書・図像類
Iwagaki, Tsuyoshi, Ohtake, Satoshi, Fujiwara, HideoNara Institute of Science and Technology2003-09Information Science Technical ReportTR2003009
Available onlineOther Libraries in Japan

Phosphorus recovery and recycling

Phosphorus recovery and recycling
Paper図書
Hisao Ohtake, Satoshi Tsuneda, editors.Springer[2019]<PA225-B175>
National Diet LibraryOther Libraries in Japan

A design scheme for delay fault testability of controllers using state transition information

A design scheme for delay fault testability of controllers using state transition information
Digital文書・図像類
Iwagaki, Tsuyoshi, Ohtake, Satoshi, Fujiwara, HideoNara Institute of Science and Technology2003-09Information Science Technical ReportTR2003010
Available onlineOther Libraries in Japan

An Non-scan DFT Method at RTL Based on Fixed-control Testability to Achieve 100% Fault Efficiency

An Non-scan DFT Method at RTL Based on Fixed-control Testability to Achieve 100% Fault Efficiency
Digital文書・図像類
Ohtake, Satoshi, Nagai, Shintaro, Wada, Hiroki, Fujiwara, HideoNara Institute of Science and Technology2000-11Information Science Technical ReportTR2000009
Available onlineOther Libraries in Japan

New DFT Techniques of Non-Scan Sequential Circuits with Complete Fault Efficiency

New DFT Techniques of Non-Scan Sequential Circuits with Complete Fault Efficiency
Digital文書・図像類
Das, Debesh Kumar, Ohtake, Satoshi, Fujiwara, HideoNara Institute of Science and Technology1998-11Information Science Technical ReportTR98013
Available onlineOther Libraries in Japan

Sequential test generation based on circuit pseudo-transformation

Sequential test generation based on circuit pseudo-transformation
Digital文書・図像類
Ohtake, Satoshi, Inoue, Tomoo, Fujiwara, HideoNara Institute of Science and Technology1997-07Information Science Technical ReportTR97014
Available onlineOther Libraries in Japan

Phosphorus recovery and recycling

Phosphorus recovery and recycling
Paper図書
Hisao Ohtake, Satoshi Tsuneda, editorsSpringer Nature Singaporec2019
Other Libraries in Japan

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