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System diagnosis and prognosis: security and condition monitoring issues 3 : 21 April 2003 : Orlando, Florida, USA. : Apr 2003, Orlando, FL. (SPIE Proceedings ; 5107)

System diagnosis and prognosis: security and condition monitoring issues 3 : 21 April 2003 : Orlando, Florida, USA. : Apr 2003, Orlando, FL. (SPIE Proceedings ; 5107)
Paper図書
SPIEc2003.<M17-04-650>
National Diet LibraryOther Libraries in Japan
  • Subject HeadingAutomatic checkout equipment -- Congresses. Medical techno...

Component and systems diagnostics, prognostics, and health management 2 : 3-4 April 2002 : Orlando, USA. : 2nd SPIE conference on component and systems diagnosis, prognosis, and health management : Apr 2002, Orlando, FL. (SPIE Proceedings ; 4733)

Component and systems diagnostics, prognostics, and health management 2 : 3-4 April 2002 : Orlando, USA. : 2nd SPIE conference on component and systems diagnosis, prognosis, and health management : Apr 2002, Orlando, FL. (SPIE Proceedings ; 4733)
Paper図書
SPIEc2002.<M17-03-4156>
National Diet Library
  • Subject HeadingAutomatic checkout equipment -- Congresses. Medical techno...

Proceedings : January 9-12, 1984, Anaheim Convention Center, Anaheim, CA / ATE West ; sponsored by Electronics test.

Proceedings : January 9-12, 1984, Anaheim Convention Center, Anaheim, CA / ATE West ; sponsored by Electronics test.
Paper図書
Morgan-Grampian Pub. Co.c1984.<M15-A5893>
National Diet Library
  • Subject HeadingAutomatic checkout equipment -- Congresses.

Computer controlled testing and instrumentation : an introduction to the IEC-625:IEEE-488 bus / Martin Colloms.

Computer controlled testing and instrumentation : an introduction to the IEC-625:IEEE-488 bus / Martin Colloms.
Paper図書
Pentech Press1983.<M154-A10>
National Diet Library
  • Subject Heading電子計算機 (地理区分) Automatic checkout equipment. Computer interfaces.

Proceedings / ATE Central, Automated Testing for Electronics Manufacturing Conference ; s ponsored by Electronics test, October 4-6, 1983, O'Hare Exposition and Conference Center, Rosemont, IL.

Proceedings / ATE Central, Automated Testing for Electronics Manufacturing Conference ; s ponsored by Electronics test, October 4-6, 1983, O'Hare Exposition and Conference Center, Rosemont, IL.
Paper図書
Morgan-Grampian Pub. Co.c1983.<M15-A5885>
National Diet Library
  • Subject Heading...-- Congresses. Automatic checkout equipment -- Congresses.

Autotestcon.

Autotestcon.
Paper図書
Institute of Electrical and Electronics Engineersc1976]-c1983.<M131-106>
National Diet Library
  • Subject HeadingAutomatic checkout equipment -- Congresses. Electronics in...

Conference record, 1982 Workshop on Industrial Applications of Machine Vision, May 3-5, 1982, Research Triangle Park, N.C.

Conference record, 1982 Workshop on Industrial Applications of Machine Vision, May 3-5, 1982, Research Triangle Park, N.C.
Paper図書
Available from IEEE Computer Society1982.<M291-18>
National Diet Library
  • Subject Heading...-- Congresses. Automatic checkout equipment -- Congresses.

A designer's guide to built-in self-test : softcover

A designer's guide to built-in self-test : softcover
Paper図書
Charles E. StroudKluwer Academicc2002
Other Libraries in Japan
  • Subject Heading...d construction Automatic checkout equipment
  • Subject Heading (ID)...d construction Automatic checkout equipment

Nondestructive and automated testing for soil and rock properties

Nondestructive and automated testing for soil and rock properties
Paper図書
W.A. Marr and C.E. Fairhurst, editorsASTMc1999
Other Libraries in Japan
  • Subject HeadingSoils -- Testing Rocks -- Testing Non-destructive testing Automatic checkout equipment
  • Subject Heading (ID)Soils -- Testing Rocks -- Testing Non-destructive testing Automatic checkout equipment

Design-for-test for digital IC's and embedded core systems

Design-for-test for digital IC's and embedded core systems
Paper図書
Alfred L. CrouchPrentice Hall1999
Other Libraries in Japan
  • Subject Heading...circuit design Automatic checkout equipment Embedded computer systems -- ...
  • Subject Heading (ID)...circuit design Automatic checkout equipment Embedded computer systems -- ...

Testability concepts for digital ICs : the macro test approach : hard : alk. paper

Testability concepts for digital ICs : the macro test approach : hard : alk. paper
Paper図書
by F.P.M. Beenker, R.G. Bennetts, A.P. ThijssenKluwer Academic Publishersc1995
Other Libraries in Japan
  • Subject HeadingDigital integrated circuits -- Testing Automatic checkout equipment
  • Subject Heading (ID)Digital integrated circuits -- Testing Automatic checkout equipment

International Conference on New Developments in Automatic Testing, 30 November-2 December 1977, venue Metropole Convention Centre, Brighton / organised by the Control and Automation and Electronics Divisions of the Institution of Electrical Engineers in association with ... [others]. (Conference publication - IEE ; no. 158)

International Conference on New Developments in Automatic Testing, 30 November-2 December 1977, venue Metropole Convention Centre, Brighton / organised by the Control and Automation and Electronics Divisions of the Institution of Electrical Engineers in association with ... [others]. (Conference publication - IEE ; no. 158)
Paper図書
The Institution1977.<M191-52>
National Diet Library
  • Subject HeadingAutomatic checkout equipment -- Congresses. Electronic ins...

Proceedings / ATE West, Automated Testing for Electronics Manufacturing Conference, January 10-13, 1983, Anaheim Convention Center, Anaheim, CA ; sponsored by Electronics Test.

Proceedings / ATE West, Automated Testing for Electronics Manufacturing Conference, January 10-13, 1983, Anaheim Convention Center, Anaheim, CA ; sponsored by Electronics Test.
Paper図書
Morgan-Grampian Pub. Co.c1983.<ND354-A1>
National Diet Library
  • Subject Heading...-- Congresses. Automatic checkout equipment -- Congresses.

Multisensor instrumentation 6[sigma] design : defined accuracy computer-integrated measurement systems

Multisensor instrumentation 6[sigma] design : defined accuracy computer-integrated measurement systems
Paper図書
Patrick H. GarrettJ. Wileyc2002
Other Libraries in Japan
  • Subject HeadingElectrooptical devices -- Testing -- Congresses Automatic checkout equipment -- Congresses
  • Subject Heading (ID)Electrooptical devices -- Testing -- Congresses Automatic checkout equipment -- Congresses

International Test Conference 2002 : proceedings, October 7-10, 2002, Baltimore Convention Center, Baltimore, MD, USA

International Test Conference 2002 : proceedings, October 7-10, 2002, Baltimore Convention Center, Baltimore, MD, USA
Paper図書
sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia SectionInternational Test Conferencec2002
Other Libraries in Japan
  • Subject HeadingIntegrated circuits -- Testing -- Congresses Automatic checkout equipment -- Congresses
  • Subject Heading (ID)Integrated circuits -- Testing -- Congresses Automatic checkout equipment -- Congresses

Conference record / ... ASSC.

Conference record / ... ASSC.
Paper図書
Institute of Electrical and Electronics Engineersc1974-c1975].<M131-62>
National Diet Library
  • Subject HeadingAutomatic checkout equipment -- Congresses. Avionics -- Co...

International Test Conference 2001 : proceedings, October 30 - November 1, 2001, Baltimore Convention Center, Baltimore, MD, USA

International Test Conference 2001 : proceedings, October 30 - November 1, 2001, Baltimore Convention Center, Baltimore, MD, USA
Paper図書
sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia SectionInternational Test Conferencec2001
Other Libraries in Japan
  • Subject HeadingIntegrated circuits -- Testing -- Congresses Automatic checkout equipment -- Congresses
  • Subject Heading (ID)Integrated circuits -- Testing -- Congresses Automatic checkout equipment -- Congresses

System test and diagnosis

System test and diagnosis
Paper図書
by William R. Simpson and John W. SheppardKluwer Academicc1994
Other Libraries in Japan
  • Subject Heading...rant computing Automatic checkout equipment
  • Subject Heading (ID)...rant computing Automatic checkout equipment

Automatic testing / edited by N. O. Matthews.

Automatic testing / edited by N. O. Matthews.
Paper図書
Network1975]<ND416-68>
National Diet Library
  • Subject HeadingAutomatic checkout equipment -- Congresses. Electronic app...

Proceedings : International Test Conference 2000, [October 3-5, 2000, New Atlantic City Convention Center, Atlantic City, NJ, USA] : soft : case : microfiche

Proceedings : International Test Conference 2000, [October 3-5, 2000, New Atlantic City Convention Center, Atlantic City, NJ, USA] : soft : case : microfiche
Paper図書
[sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]International Test Conferencec2000
Other Libraries in Japan
  • Subject HeadingIntegrated circuits -- Testing -- Congresses Automatic checkout equipment -- Congresses
  • Subject Heading (ID)Integrated circuits -- Testing -- Congresses Automatic checkout equipment -- Congresses
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