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2015 6th Asia symposium on quality electronic design : (ASQED 2015) : Kula Lumpur, Malaysia : 4-5 August 2015 : Aug 2015, Kuala Lumpur, Malaysia.

2015 6th Asia symposium on quality electronic design : (ASQED 2015) : Kula Lumpur, Malaysia : 4-5 August 2015 : Aug 2015, Kuala Lumpur, Malaysia.
Paper図書
IEEE[2015]<M17-17-1651>
National Diet Library

2012 4th Asia symposium on quality electronic design : (ASQED 2012) : Penang, Malaysia : 10-11 July 2012 : Jul 2012, Penang, Malaysia.

2012 4th Asia symposium on quality electronic design : (ASQED 2012) : Penang, Malaysia : 10-11 July 2012 : Jul 2012, Penang, Malaysia.
Paper図書
IEEEc2012.<M17-13-1767>
National Diet Library

2011 3rd Asia symposium on quality electronic design : (ASQED 2011) : Kuala Lumpur, Malaysia : 19-20 July 2011 : Jul 2011, Kuala Lumpur, Malaysia.

2011 3rd Asia symposium on quality electronic design : (ASQED 2011) : Kuala Lumpur, Malaysia : 19-20 July 2011 : Jul 2011, Kuala Lumpur, Malaysia.
Paper図書
IEEEc2011.<M17-12-2920>
National Diet Library

2010 2nd Asia symposium on quality electronic design : (ASQED 2010) : Penang, Malaysia : 3-4 August 2010 : Aug 2010, Penang, Malaysia.

2010 2nd Asia symposium on quality electronic design : (ASQED 2010) : Penang, Malaysia : 3-4 August 2010 : Aug 2010, Penang, Malaysia.
Paper図書
IEEEc2010.<M17-12-868>
National Diet Library

2010 11th international symposium on quality electronic design : (ISQED 2010) : San Jose, California, USA : 22-24 March 2010 : ISQED 2010 conference : ISQED exhibition : Mar 2010, San Jose, CA.

2010 11th international symposium on quality electronic design : (ISQED 2010) : San Jose, California, USA : 22-24 March 2010 : ISQED 2010 conference : ISQED exhibition : Mar 2010, San Jose, CA.
Paper図書
IEEEc2010.<M17-12-334>
National Diet Library

2009 1st Asia symposium on quality electronic design : (ASQED 2009) : Kuala Lumpur, Malaysia : 15-16 July 2009. : Jul 2009, Kuala Lumpur, Malaysia.

2009 1st Asia symposium on quality electronic design : (ASQED 2009) : Kuala Lumpur, Malaysia : 15-16 July 2009. : Jul 2009, Kuala Lumpur, Malaysia.
Paper図書
IEEEc2009.<M17-11-199>
National Diet Library
  • Subject HeadingIntegrated circuits -- Very large scale integration -- Reliability -- Congresses. Integrated cir...

Ninth international symposium on quality electronic design : ISQED 2008 : proceedings : San Jose, California : 17-19 March 2008. : ISQED08 : ISQED 2008 conference : ISQED'08 tutorials : Mar 2008, San Jose, CA.

Ninth international symposium on quality electronic design : ISQED 2008 : proceedings : San Jose, California : 17-19 March 2008. : ISQED08 : ISQED 2008 conference : ISQED'08 tutorials : Mar 2008, San Jose, CA.
Paper図書
IEEE Computer Societyc2008.<M17-09-732>
National Diet Library
  • Subject HeadingIntegrated circuits -- Very large scale integration -- Reliability -- Congresses. Integrated cir...

Eighth international symposium on quality electronic design : ISQED 2007 : proceedings : San Jose, California : 26-28 March 2007. : ISQED07 : ISQED 2007 conference : ISQED'07 tutorials : Mar 2007, San Jose, CA.

Eighth international symposium on quality electronic design : ISQED 2007 : proceedings : San Jose, California : 26-28 March 2007. : ISQED07 : ISQED 2007 conference : ISQED'07 tutorials : Mar 2007, San Jose, CA.
Paper図書
IEEE Computer Societyc2007.<M17-09-4>
National Diet Library
  • Subject HeadingIntegrated circuits -- Very large scale integration -- Reliability -- Congresses. Integrated cir...

7th international symposium on quality electronic design : ISQED 2006 : proceedings : 27-29 March 2006 : San Jose, California. : ISQED tutorials : ISQED06 : ISQED 2006 conference : Mar 2006, San Jose, CA.

7th international symposium on quality electronic design : ISQED 2006 : proceedings : 27-29 March 2006 : San Jose, California. : ISQED tutorials : ISQED06 : ISQED 2006 conference : Mar 2006, San Jose, CA.
Paper図書
IEEE Computer Societyc2006.<M17-08-627>
National Diet Library
  • Subject HeadingIntegrated circuits -- Very large scale integration -- Reliability -- Congresses. Integrated cir...

6th international symposium on quality electronic design : proceedings : March 21-23, 2005 San Jose, California. : ISQED05 : Mar 2005, San Jose, CA.

6th international symposium on quality electronic design : proceedings : March 21-23, 2005 San Jose, California. : ISQED05 : Mar 2005, San Jose, CA.
Paper図書
IEEE Computer Societyc2005.<M17-06-260>
National Diet Library
  • Subject HeadingIntegrated circuits -- Very large scale integration -- Reliability. -- Congresses. Integrated ci...

5th international symposium on quality electronic design : proceedings : 22-24 March 2004 San Jose, California. : 5th IEEE international symposium on quality electronic design : Mar 2004, San Jose, CA.

5th international symposium on quality electronic design : proceedings : 22-24 March 2004 San Jose, California. : 5th IEEE international symposium on quality electronic design : Mar 2004, San Jose, CA.
Paper図書
IEEE Computer Societyc2004.<M17-04-3408>
National Diet Library
  • Subject HeadingIntegrated circuits -- Very large scale integration -- Reliability -- Congresses. Integrated cir...

Fourth international symposium on quality electronic design : proceedings : 24-26 March 2003 : San Jose, California. : Mar 2003, San Jose, CA.

Fourth international symposium on quality electronic design : proceedings : 24-26 March 2003 : San Jose, California. : Mar 2003, San Jose, CA.
Paper図書
IEEE Computer Societyc2003.<M17-04-125>
National Diet Library
  • Subject HeadingIntegrated circuits -- Very large scale integration -- Reliability -- Congresses. Integrated cir...

International symposium on quality electronic design : proceedings : 18-21 March 2002 : San Jose, California. : Mar 2002, San Jose, CA.

International symposium on quality electronic design : proceedings : 18-21 March 2002 : San Jose, California. : Mar 2002, San Jose, CA.
Paper図書
IEEE Computer Societyc2002.<M17-03-4463>
National Diet Library
  • Subject HeadingIntegrated circuits -- Very large scale integration -- Reliability -- Congresses. Integrated cir...

VLSI reliability

VLSI reliability
Paper図書
Anant G. SabnisAcademic Pressc1990
Other Libraries in Japan
  • Subject HeadingIntegrated circuits -- Very large scale integration -- Reliability
  • Subject Heading (ID)Integrated circuits -- Very large scale integration -- Reliability

Multilevel interconnect technology

Multilevel interconnect technology
Paper図書
Gopal K. RaoMcGraw-Hillc1993
Other Libraries in Japan
  • Subject Heading...circuit design Integrated circuits -- Very large scale integration -- Reliability Production engineering
  • Subject Heading (ID)...circuit design Integrated circuits -- Very large scale integration -- Reliability Production engineering

Rapid reliability assessment of VLSICs

Rapid reliability assessment of VLSICs
Paper図書
A.P. Dorey ... [et al.]Plenum Pressc1990
Other Libraries in Japan
  • Subject Heading...ion -- Testing Integrated circuits -- Very large scale integration -- Reliability
  • Subject Heading (ID)...ion -- Testing Integrated circuits -- Very large scale integration -- Reliability

Proceedings, fourth International Symposium on Quality Electronic Design, 24-26 March 2003, San Jose, California

Proceedings, fourth International Symposium on Quality Electronic Design, 24-26 March 2003, San Jose, California
Paper図書
sponsored by IEEE Electron Device Society, IEEE Components, Packaging & Manufacturing Technology Society, Association for Computing Machinery, ACM Special Interest Group on Design AutomationIEEE Computer Societyc2003
Other Libraries in Japan
  • Subject HeadingIntegrated circuits -- Very large scale integration -- Reliability -- Congresses Integrated circ...
  • Subject Heading (ID)Integrated circuits -- Very large scale integration -- Reliability -- Congresses Integrated circ...

Manufacturing yield evaluation of VLSI/WSI systems

Manufacturing yield evaluation of VLSI/WSI systems
Paper図書
Bruno CicianiIEEE Computer Society Press1994
Other Libraries in Japan
  • Subject Heading...ata processing Integrated circuits -- Very large scale integration -- Reliability Integrated circuits -- Wafer-...
  • Subject Heading (ID)...ata processing Integrated circuits -- Very large scale integration -- Reliability Integrated circuits -- Wafer-...

Metallization : performance and reliability issues for VLSI and ULSI : 12-13 September 1991, San Jose, California

Metallization : performance and reliability issues for VLSI and ULSI : 12-13 September 1991, San Jose, California
Paper図書
Gennady S. Gildenblat, Gary P. Schwartz, chairs/editors ; sponsored and published by SPIE--the International Society for Optical EngineeringSPIEc1991
Other Libraries in Japan
  • Subject HeadingIntegrated circuits -- Very large scale integration -- Reliability -- Congresses Metallic films ...
  • Subject Heading (ID)Integrated circuits -- Very large scale integration -- Reliability -- Congresses Metallic films ...

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