sponsored by IEEE Computer Society Test Technology Technical Council ; organized by University of Athens, University of Piraeus, TIMA LaboratoryIEEE Computer Societyc2008
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- 著者標目...ting Symposium IEEE Computer Society. Technical Council on Test Technology Panepistēmio Athēnōn Universi...
sponsored by IEEE Computer Society Test Technology Technical CouncilIEEE Computer Societyc2006
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- 著者標目..., Lake, Italy) IEEE Computer Society. Technical Council on Test Technology
sponsored by IEEE Computer Society Test Technology Technical Council ; organized by University of Athens, University of Piraeus, TIMA LaboratoryIEEE Computer Societyc2007
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- 著者標目...leion, Greece) IEEE Computer Society. Technical Council on Test Technology Panepistēmio Athēnōn Universi...
sponsored by IEEE Computer Society Technical Council on Test Technology , IEEE Computer Society Technical Committee on Design AutomationIEEE Computer Societyc2003
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sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology ; in cooperation with IEEE Solid State Circuits Society ; [edited by Tom Wik, Adit Singh, and Rochit Rajsuman]IEEE Computer Societyc2003
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editors, Bernard Courtois, Thomas Wik, Yervant Zorian ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits SocietyIEEE Computer Societyc2002
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editors, Yervant Zorian ... [et al.] ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits SocietyIEEE Computer Societyc2001
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edited by R. Rajsuman, T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology ; in cooperation with The IEEE Solid State Circuits SocietyInstitute of Electrical and Electronics Engieersc2000
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edited by R. Rajsuman, T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology ; in cooperation with The IEEE Solid-State Circuits SocietyInstitute of Electrical and Electronics Engieersc1999
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