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2003 IEEE International Conference on Microelectronic Systems Education : proceedings : June 1-2, 2003, Anaheim, California, USA

2003 IEEE International Conference on Microelectronic Systems Education : proceedings : June 1-2, 2003, Anaheim, California, USA
紙図書
sponsored by IEEE Computer Society Technical Committee on Design Automation, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSIIEEE Computer Societyc2003
全国の図書館
  • 著者標目...ical Committee IEEE Computer Society. Test Technology Committee IEEE Computer Society. Techni...

Proceedings / International Test Conference.

Proceedings / International Test Conference.
紙図書
IEEE Computer Society Pressc1983-<M154-229>
国立国会図書館
  • 著者標目IEEE Computer Society. Test Technology Committee. Institute of Electrical and ...

Curriculum for test technology : M.E.I.S. Center, University of Minnesota, Minneapolis, 1983, November 16-17, 1983 / IEEE Computer Society Test Technology Committee.

Curriculum for test technology : M.E.I.S. Center, University of Minnesota, Minneapolis, 1983, November 16-17, 1983 / IEEE Computer Society Test Technology Committee.
紙図書
IEEE Computer Society Pressc1983.<ND386-36>
国立国会図書館
  • 著者標目IEEE Computer Society. Test Technology Committee. IEEE Computer Society. Curri...

Digest of papers / International Test Conference.

Digest of papers / International Test Conference.
紙図書
Institute of Electrical and Electronics Engineers1981-1982.<M154-229>
国立国会図書館
  • 著者標目IEEE Computer Society. Test Technology Committee. Institute of Electrical and ...

Proceedings, 1999 IEEE International Conference on Microelectronic Systems Education, (MSE'99) : "Systems Education in the 21st Century", July 19-21, 1999, Arlington, Virginia, USA

Proceedings, 1999 IEEE International Conference on Microelectronic Systems Education, (MSE'99) : "Systems Education in the 21st Century", July 19-21, 1999, Arlington, Virginia, USA
紙図書
sponsored by IEEE Computer Society Technical Committee on Design Automation, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSIIEEE Computer Society Pressc1999
全国の図書館
  • 著者標目...ical Committee IEEE Computer Society. Test Technology Committee IEEE Computer Society. Techni...

Digest of papers ... Test Conference.

Digest of papers ... Test Conference.
紙図書
Institute of Electrical and Electronics Engineers1979-1980.<ND386-21>
国立国会図書館
  • 著者標目IEEE Computer Society. Test Technology Committee. Institute of Electrical and ...

Digest of papers ... Test Conference.

Digest of papers ... Test Conference.
紙図書
Institute of Electrical and Electronics Engineers1979-1980.<M154-233>
国立国会図書館
  • 著者標目IEEE Computer Society. Test Technology Committee. Institute of Electrical and ...

Digest of papers ... Semiconductor Test Conference.

Digest of papers ... Semiconductor Test Conference.
紙図書
Institute of Electrical and Electronics Engineers1978.<ND386-21>
国立国会図書館
  • 著者標目IEEE Computer Society. Test Technology Committee. Institute of Electrical and ...

Proceedings, 1997 IEEE International Conference on Microelectronic Systems Education, MSE'97 : doing more with less in a rapidly changing environment, July 21-23, 1997, Arlington, Virginia, USA

Proceedings, 1997 IEEE International Conference on Microelectronic Systems Education, MSE'97 : doing more with less in a rapidly changing environment, July 21-23, 1997, Arlington, Virginia, USA
紙図書
sponsored by IEEE Computer Society Technical Committee on Design Automation, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with Association for Computing Machinery (ACM), the American Society for Engineering Education (ASEE) ; support provided by National Science Foundation, Semiconductor Research CorporationIEEE Computer Society Pressc1997
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  • 著者標目...ical Committee IEEE Computer Society. Test Technology Committee IEEE Computer Society. Techni...

VLSI system test : cost versus quality : 1990 IEEE Test Symposium, April 10-11, 1990, Bally's Park Place Casino Hotel, Atlantic City, NJ

VLSI system test : cost versus quality : 1990 IEEE Test Symposium, April 10-11, 1990, Bally's Park Place Casino Hotel, Atlantic City, NJ
紙図書
IEEE Computer Society Press1990]
全国の図書館
  • 著者標目...elphia Section IEEE Computer Society. Test Technology Committee

The three faces of test : design, characterization, production : International Test Conference, 1984 proceedings, October 16, 17, 18, 1984 pbk. microfiche hard

The three faces of test : design, characterization, production : International Test Conference, 1984 proceedings, October 16, 17, 18, 1984 pbk. microfiche hard
紙図書
sponsored by the IEEE Computer Society, Test Technology Committee, IEEE Philadelphia SectionIEEE Computer Society Pressc1984
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  • 著者標目International Test Conference IEEE Computer Society. Test Technology Committee Institute of Electrical and E...

Testing's changing role : International Test Conference, 1983 : proceedings, October 18-20, 1983

Testing's changing role : International Test Conference, 1983 : proceedings, October 18-20, 1983
紙図書
sponsored by the IEEE Computer Society, Test Technology Committee, IEEE Philadelphia SectionIEEE Computer Society Press1983
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  • 著者標目International Test Conference IEEE Computer Society. Test Technology Committee Institute of Electrical and E...

Testing in the 1980's : digest of papers, 1981 International Test Conference, October 27, 28 & 29, 1981

Testing in the 1980's : digest of papers, 1981 International Test Conference, October 27, 28 & 29, 1981
紙図書
sponsored by the IEEE Computer Society, Test Technology Committee, and the Philadelphia Section of the IEEEInstitute of Electrical and Electronics Engineersc1981
全国の図書館
  • 著者標目International Test Conference IEEE Computer Society. Test Technology Committee Institute of Electrical and E...

Testing for the 80's : digest of papers, 1980 Test Conference, November 11, 12, 13, 1980

Testing for the 80's : digest of papers, 1980 Test Conference, November 11, 12, 13, 1980
紙図書
sponsored by IEEE Computer Society, Test Technology Committee [and] Philadelphia Section of the IEEEInstitute of Electrical and Electronics Engineersc1980
全国の図書館
  • 著者標目Test Conference IEEE Computer Society. Test Technology Committee Institute of Electrical and E...

LSI & boards : digest of papers, 1979 Test Conference, October 23, 24 & 25, 1979, held at Cherry Hill, New Jersey

LSI & boards : digest of papers, 1979 Test Conference, October 23, 24 & 25, 1979, held at Cherry Hill, New Jersey
紙図書
sponsored by IEEE Computer Society, Test Technology Committee, and the Philadelphia Section of the IEEEInstitute of Electrical and Electronics Engineersc1979
全国の図書館
  • 著者標目Test Conference IEEE Computer Society. Test Technology Committee Institute of Electrical and E...

LSI & boards : digest of papers, 1978 Semiconductor Test Conference, October 31, November 1, 2, 1978, held at Cherry Hill, New Jersey

LSI & boards : digest of papers, 1978 Semiconductor Test Conference, October 31, November 1, 2, 1978, held at Cherry Hill, New Jersey
紙図書
sponsored by IEEE Computer Society, Test Technology Committee and the Philadelphia Section of the IEEEInstitute of Electrical and Electronics Engineersc1978
全国の図書館
  • 著者標目Semiconductor Test Conference IEEE Computer Society. Test Technology Committee Institute of Electrical and E...

Quality productivity profit : digest of papers : 1982 International Test Conference, November 15-18, 1982

Quality productivity profit : digest of papers : 1982 International Test Conference, November 15-18, 1982
紙図書
presented by the Test Technology Committee, the International Test Formation [i.e. Foundation] ; sponsored by IEEE Computer Society, IEEE Philadelphia SectionIEEE Computer Society Pressc1982
全国の図書館
  • 著者標目International Test Conference IEEE Computer Society. Test Technology Committee International Test Foundation...

Simulation and test generation environments : Workshop : SEP 1985, San Francisco, CA.

Simulation and test generation environments : Workshop : SEP 1985, San Francisco, CA.
紙図書
<M17-86-1805>
国立国会図書館

Three Faces of Test : Design, Characterization, Production : International Test Conference : OCT 1984, Philadelphia, PA.

Three Faces of Test : Design, Characterization, Production : International Test Conference : OCT 1984, Philadelphia, PA.
紙図書
<M17-86-2390>
国立国会図書館

Testing in the 80's International Test Conference : OCT 1981, Philadelphia, PA.

Testing in the 80's International Test Conference : OCT 1981, Philadelphia, PA.
マイクロ図書
<M17-86-2460-LS>
国立国会図書館

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