IEEE Computer Society Press1999.<M17-00-1219>
国立国会図書館
- 著者標目IEEE. Computer Society. Technical Committee on Test Technology.
IEEE Computer Society1999.<M17-01-3265>
国立国会図書館
- 著者標目...gn Automation. IEEE. Computer Society. Technical Committee on Test Technology. IEEE. Computer Society. Techn...
sponsored by IEEE Computer Society Technical Committee on Design Automation, IEEE Computer Society Technical Committee on Simulation, IEEE Computer Society Technical Committee on Test TechnologyIEEE Computer Society Pressc2000
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edited by Anura P. Jayasumana ; sponsored by IEEE Computer Society Technical Committee on Test TechnologyIEEE Computer Society Pressc1997
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sponsored by IEEE Computer Society Technical Committee on Simulation, IEEE Computer Society Technical Committee on Test Technology, Association for Computing Machinery SIGSIMIEEE Computer Societyc1999
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edited by Carol Tong, Anura Jayasumana ; sponsored by IEEE Computer Society Technical Committee on Test TechnologyIEEE Computer Society Pressc1996
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sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Philadelphia SectionIEEE Computer Society Pressc1996
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sponsored by the IEEE Computer Society Technical Committee on Test Technology, National Tsing Hua UniversityIEEE Computer Society Pressc1996
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sponsored by IEEE Computer Society Technical Committee on Design Automation, IEEE Computer Society Technical Committee on Simulation, IEEE Computer Society Technical Committee on Test TechnologyIEEE Computer Society Pressc1997
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sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Philadelphia SectionIEEE Computer Society Pressc1995
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sponsored by IEEE Computer Society Technical Committee on Simulation, IEEE Computer Society Technical Committee on Test Technology, ACM SIGSIM ; proceedings editor, Jürgen Becker ; program chair, Mangred Glesner ; workshop char, Rudy LauwereinsIEEE Computer Society Pressc1998
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sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Philadelphia SectionIEEE Computer Society Pressc1994
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sponsored by IEEE Computer Society Technical Committee on Simulation, IEEE Computer Society Technical Committee on Test Technology, ACM SIGSIMIEEE Computer Society Pressc1996
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sponsored by IEEE Computer Society Test Technology Technical Committee ; in cooperation with Technical Group on Fault Tolerant Systems, IEICE ... [et al.]IEEE Computer Society Pressc1997
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sponsored by IEEE Computer Society Test Technology Technical Committee, Computer Chapter of IEEE Singapore Section, Singapore Polytechnic ; in cooperation with National University of Singapore, Nanyang Technological UniversityIEEE Computer Society Pressc1998
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sponsored by the IEEE Computer Society's Technical Committee on Test Technology and the VLSI Society of India (VSI)IEEE Computer Society Pressc1995
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sponsored by the IEEE Computer Society, Technical Committee-Test Technology and the Philadelphia Section of the IEEEIEEE Computer Society Pressc1993
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sponsored by IEEE Computer Society Technical Committee on Design Automation, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSIIEEE Computer Societyc2003
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edited by R. Rajsuman ; sponsored by IEEE Computer Society, Technical Committee on Test TechnologyIEEE Computer Society Pressc1993
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sponsored by IEEE Computer Society Technical Committee on Design Automation, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSIIEEE Computer Society Pressc1999
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