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2022 IEEE International Test Conference (ITC 2022) : Anaheim, California, USA, 23-30 September 2022

2022 IEEE International Test Conference (ITC 2022) : Anaheim, California, USA, 23-30 September 2022
紙図書
IEEEc2022
全国の図書館
  • 著者標目International Test Conference Institute of Electrical and E...

2020 IEEE International Test Conference (ITC 2020) : Washington, DC, USA, 1-6 November 2020

2020 IEEE International Test Conference (ITC 2020) : Washington, DC, USA, 1-6 November 2020
紙図書
IEEEc2020
全国の図書館
  • 著者標目International Test Conference Institute of Electrical and E...

2019 IEEE International Test Conference : (ITC 2019) : Washington, DC, USA, 9-15 November 2019

2019 IEEE International Test Conference : (ITC 2019) : Washington, DC, USA, 9-15 November 2019
紙図書
IEEEc2019
全国の図書館
  • 著者標目International Test Conference Institute of Electrical and E...

2018 IEEE International Test Conference : (ITC 2018) : Phoenix, Arizona, USA 29 October-1 November 2018

2018 IEEE International Test Conference : (ITC 2018) : Phoenix, Arizona, USA 29 October-1 November 2018
紙図書
IEEEc2018
全国の図書館
  • 著者標目International Test Conference Institute of Electrical and E...

2017 IEEE International Test Conference : (ITC 2017) : Forth [i.e. Fort] Worth, Texas, USA 31 October-2 November 2017

2017 IEEE International Test Conference : (ITC 2017) : Forth [i.e. Fort] Worth, Texas, USA 31 October-2 November 2017
紙図書
IEEEc2017
全国の図書館
  • 著者標目International Test Conference Institute of Electrical and E...

2016 IEEE International Test Conference : (ITC 2016) : Fort Worth, Texas, USA, 15-17 November 2016

2016 IEEE International Test Conference : (ITC 2016) : Fort Worth, Texas, USA, 15-17 November 2016
紙図書
IEEEc2016
全国の図書館
  • 著者標目International Test Conference Institute of Electrical and E...

2015 IEEE International Test Conference : (ITC 2015) : Anaheim, California, USA, 6-8 October 2015

2015 IEEE International Test Conference : (ITC 2015) : Anaheim, California, USA, 6-8 October 2015
紙図書
IEEEc2015
全国の図書館
  • 著者標目International Test Conference Institute of Electrical and E...

2014 IEEE International Test Conference : (ITC 2014) : Seattle, Washington, USA, 20-23 October 2014

2014 IEEE International Test Conference : (ITC 2014) : Seattle, Washington, USA, 20-23 October 2014
紙図書
IEEEc2014
全国の図書館
  • 著者標目International Test Conference Institute of Electrical and E...

2013 IEEE International Test Conference : (ITC 2013) : Anaheim, California, USA, 6-13 September 2013

2013 IEEE International Test Conference : (ITC 2013) : Anaheim, California, USA, 6-13 September 2013
紙図書
IEEEc2013
全国の図書館
  • 著者標目International Test Conference Institute of Electrical and E...

2016 IEEE international test conference (ITC 2016) : Fort Worth, Texas, USA : 15-17 November 2016 : 47th international test conference : Nov 2016, Fort Worth, TX.

2016 IEEE international test conference (ITC 2016) : Fort Worth, Texas, USA : 15-17 November 2016 : 47th international test conference : Nov 2016, Fort Worth, TX.
紙図書
IEEE[2016]<M17-18-1579>
国立国会図書館
  • 著者標目International Test Conference (47th : 2016 : Fort Worth, Te...

2012 IEEE International Test Conference (ITC 2012) : Anaheim, California, USA 5-8 November 2012

2012 IEEE International Test Conference (ITC 2012) : Anaheim, California, USA 5-8 November 2012
紙図書
IEEEc2012
全国の図書館
  • 著者標目International Test Conference Institute of Electrical and E...

2011 IEEE International Test Conference (ITC 2011) : Anaheim, California, USA, 20-22 September 2011

2011 IEEE International Test Conference (ITC 2011) : Anaheim, California, USA, 20-22 September 2011
紙図書
IEEEc2011
全国の図書館
  • 著者標目International Test Conference Institute of Electrical and E...

2009 International test conference : (ITC2009) : Austin, Texas, USA 1-6 November 2009

2009 International test conference : (ITC2009) : Austin, Texas, USA 1-6 November 2009
紙図書
IEEEc2009
全国の図書館
  • 著者標目International Test Conference

2012 IEEE international test conference : (ITC 2012) : Anaheim, California, USA : 5-8 November 2012 : ITC's lecture : Nov 2012, Anaheim, CA. CFP12ITC-ART

2012 IEEE international test conference : (ITC 2012) : Anaheim, California, USA : 5-8 November 2012 : ITC's lecture : Nov 2012, Anaheim, CA. CFP12ITC-ART
紙図書
IEEEc2012.<M17-13-2704>
国立国会図書館
  • 著者標目International Test Conference (43rd : 2012 : Anaheim, Calif...

2010 IEEE International Test Conference (ITC 2010) : Austin, Texas, USA, 2-4 November 2010

2010 IEEE International Test Conference (ITC 2010) : Austin, Texas, USA, 2-4 November 2010
紙図書
IEEEc2010
全国の図書館
  • 著者標目Institute of Electrical and Electronics Engineers International Test Conference

2008 IEEE International Test Conference (ITC) : Santa Clara, California, 28-30 October, 2008 Pages 1-534 Pages 535-1062

2008 IEEE International Test Conference (ITC) : Santa Clara, California, 28-30 October, 2008 Pages 1-534 Pages 535-1062
紙図書
Institute of Electrical and Electronics Engineersc2008
全国の図書館
  • 著者標目Institute of Electrical and Electronics Engineers International Test Conference

2005 IEEE international test conference (ITC) : 8-10 November, 2005 : Austin, TX. : Nov 2005, Austin, TX.

2005 IEEE international test conference (ITC) : 8-10 November, 2005 : Austin, TX. : Nov 2005, Austin, TX.
紙図書
IEEEc2005.<M17-10-182>
国立国会図書館
  • 著者標目International Test Conference (2005 : Austin, Texas.)

2006 IEEE international test conference : Santa Clara, CA : 22-27 October 2006. : ITC : 37th annual international test conference : Oct 2006, Santa Clara, CA.

2006 IEEE international test conference : Santa Clara, CA : 22-27 October 2006. : ITC : 37th annual international test conference : Oct 2006, Santa Clara, CA.
紙図書
IEEEc2006.<M17-11-3402>
国立国会図書館
  • 並列タイトル等（連結）2006 IEEE international test conference : Santa Clara, CA, USA : 22-2...
  • 並列タイトル等2006 IEEE international test conference : Santa Clara, CA, USA : 22-2...
  • 著者標目International Test Conference (37th : 2006 : Santa Clara, C...

2005 IEEE International Test Conference (ITC), 8-10 Novermber, 2005, Austin, TX : [set]

2005 IEEE International Test Conference (ITC), 8-10 Novermber, 2005, Austin, TX : [set]
紙図書
Institute of Electrical and Electronics Engineersc2005
全国の図書館
  • 著者標目International Test Conference IEEE Computer Society. Test T...

Proceedings : international test conference 2004. : Oct 2004, Charlotte, NC.

Proceedings : international test conference 2004. : Oct 2004, Charlotte, NC.
紙図書
International Test Conferencec2004.<M17-05-425>
国立国会図書館
  • 並列タイトル等（連結）ITC international test conference 2004 : proceedings : October ...
  • 並列タイトル等ITC international test conference 2004 : proceedings : October ...
  • 著者標目International Test Conference (35th : 2004 : Charlotte, Nor...
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