年 〜
年

検索結果 156 件

2013 18th IEEE European test symposium : (ETS 2013) : Avignon, France : 27-30 May 2013 : TTTC-sponsored technical meetings : May 2013, Avignon, France. CFP13216

2013 18th IEEE European test symposium : (ETS 2013) : Avignon, France : 27-30 May 2013 : TTTC-sponsored technical meetings : May 2013, Avignon, France. CFP13216
紙図書
IEEEc2013.<M17-14-1027>
国立国会図書館

2014 19th IEEE European test symposium : (ETS 2014) : Paderborn, Germany : 26-30 May 2014 : TTTC-sponsored technical meetings : May 2014, Paderborn, Germany. CFP14216-ART

2014 19th IEEE European test symposium : (ETS 2014) : Paderborn, Germany : 26-30 May 2014 : TTTC-sponsored technical meetings : May 2014, Paderborn, Germany. CFP14216-ART
紙図書
IEEE[2014]<M17-15-2206>
国立国会図書館

2011 16th IEEE European test symposium : (ETS 2011) : Trondheim, Norway : 23-27 May 2011 : TTTC-sponsored technical meetings : May 2011, Trondheim, Norway.

2011 16th IEEE European test symposium : (ETS 2011) : Trondheim, Norway : 23-27 May 2011 : TTTC-sponsored technical meetings : May 2011, Trondheim, Norway.
紙図書
IEEEc2011.<M17-12-2202>
国立国会図書館

2010 15th IEEE European test symposium : (ETS 2010) : Praha, Czech Republic : 24-28 May 2010 : TTTC-sponsored technical meetings : May 2010, Praha, Czech Republic.

2010 15th IEEE European test symposium : (ETS 2010) : Praha, Czech Republic : 24-28 May 2010 : TTTC-sponsored technical meetings : May 2010, Praha, Czech Republic.
紙図書
IEEEc2010.<M17-12-764>
国立国会図書館

ETS 2008 : thirteenth IEEE European test symposium : proceedings : 25-29 May 2008 : Verbania, Italy. : TTTC-sponsored technical meetings : May 2008, Verbania, Italy.

ETS 2008 : thirteenth IEEE European test symposium : proceedings : 25-29 May 2008 : Verbania, Italy. : TTTC-sponsored technical meetings : May 2008, Verbania, Italy.
紙図書
IEEE Computer Societyc2008.<M17-09-727>
国立国会図書館
  • 件名Integrated circuits -- Testing -- Congresses.

2011 IEEE 14th international symposium on design and diagnostics of electronic crcuits & systems : (DDECS 2011) : Cottbus, Germany : 13-15 April 2011 : TTTC-sponsored technical meetings : Apr 2011, Cottbus, Germany.

2011 IEEE 14th international symposium on design and diagnostics of electronic crcuits & systems : (DDECS 2011) : Cottbus, Germany : 13-15 April 2011 : TTTC-sponsored technical meetings : Apr 2011, Cottbus, Germany.
紙図書
IEEEc2011.<M17-12-2316>
国立国会図書館

ETS 2007 : 12th IEEE European test symposium : proceedings : 20-24 May 2007 : Freiburg, Germany. : European test week : May 2007, Freiburg, Germany.

ETS 2007 : 12th IEEE European test symposium : proceedings : 20-24 May 2007 : Freiburg, Germany. : European test week : May 2007, Freiburg, Germany.
紙図書
IEEE Computer Societyc2007.<M17-08-234>
国立国会図書館
  • 件名Integrated circuits -- Testing -- Congresses.

2016 international conference on design and technology of integrated systems in nanoscale era (DTIS 2016) : Istanbul, Turkey : 12-14 April 2016 : 2016 11th IEEE international conference on design & technology of integrated systems in nanoscale era : Apr 2016, Istanbul, Turkey.

2016 international conference on design and technology of integrated systems in nanoscale era (DTIS 2016) : Istanbul, Turkey : 12-14 April 2016 : 2016 11th IEEE international conference on design & technology of integrated systems in nanoscale era : Apr 2016, Istanbul, Turkey.
紙図書
IEEE[2016]<M17-17-2317>
国立国会図書館

2015 IEEE 24th North Atlantic test workshop : (NATW 2015) : Johnson City, New York, USA : 11-13 May 2015 : NATW 2015 conference : May 2015, Johnson CIty, NY.

2015 IEEE 24th North Atlantic test workshop : (NATW 2015) : Johnson City, New York, USA : 11-13 May 2015 : NATW 2015 conference : May 2015, Johnson CIty, NY.
紙図書
IEEE[2015]<M17-17-1931>
国立国会図書館

Eleventh IEEE European test symposium : ETS 2006 : proceedings : 21-24 May 2006 : Southampton, United Kingdom. : May 2006, Southampton, UK.

Eleventh IEEE European test symposium : ETS 2006 : proceedings : 21-24 May 2006 : Southampton, United Kingdom. : May 2006, Southampton, UK.
紙図書
IEEE Computer Societyc2006.<M17-06-2394>
国立国会図書館

2015 10th international conference on design & technology of integrated systems in nanoscale era : (DTIS 2015) : Napoli, Italy : 21-23 April 2015 : DTIS2015 : Apr 2015, Napoli, Italy.

2015 10th international conference on design & technology of integrated systems in nanoscale era : (DTIS 2015) : Napoli, Italy : 21-23 April 2015 : DTIS2015 : Apr 2015, Napoli, Italy.
紙図書
IEEE[2015]<M17-17-642>
国立国会図書館

Proceedings of the 2009 IEEE symposium on design and diagnostics of electronic circuits and systems : April 15-17, 2009 : Liberec, Czech Republic. : 12th IEEE DDECS symposium : Apr 2009, Liberec, Czech Republic.

Proceedings of the 2009 IEEE symposium on design and diagnostics of electronic circuits and systems : April 15-17, 2009 : Liberec, Czech Republic. : 12th IEEE DDECS symposium : Apr 2009, Liberec, Czech Republic.
紙図書
IEEEc2009.<M17-10-652>
国立国会図書館
  • 件名Integrated circuits -- Testing -- Congresses. Integrated circuits -- Design...

2014 IEEE 23rd North Atlantic test workshop : (NATW 2014) : Johnson City, New York, USA : 14-16 May 2014 : May 2014, Johnson City, NY.

2014 IEEE 23rd North Atlantic test workshop : (NATW 2014) : Johnson City, New York, USA : 14-16 May 2014 : May 2014, Johnson City, NY.
紙図書
IEEE[2014]<M17-15-2207>
国立国会図書館

2014 IEEE 21st international symposium on the physical and failure analysis of integrated circuits : (IPFA 2014) : Singapore : 30 June-4 July 2014 : Jun 2014, Singapore.

2014 IEEE 21st international symposium on the physical and failure analysis of integrated circuits : (IPFA 2014) : Singapore : 30 June-4 July 2014 : Jun 2014, Singapore.
紙図書
IEEE[2014]<M17-15-2494>
国立国会図書館

European test symposium : ETS 2005 : proceedings : 22-25 May 2005 : Tallinn, Estonia. : May 2005, Tallinn, Estonia.

European test symposium : ETS 2005 : proceedings : 22-25 May 2005 : Tallinn, Estonia. : May 2005, Tallinn, Estonia.
紙図書
IEEE Computer Societyc2005.<M17-06-978>
国立国会図書館
  • 件名Integrated circuits -- Testing -- Congresses.

2012 IEEE international conference on microelectronic test structures : (ICMTS 2012) : San Diego, California, USA : 19-22 March 2012 : Mar 2012, San Diego, CA.

2012 IEEE international conference on microelectronic test structures : (ICMTS 2012) : San Diego, California, USA : 19-22 March 2012 : Mar 2012, San Diego, CA.
紙図書
IEEEc2012.<M17-12-3881>
国立国会図書館

2013 8th international conference on design & technology of integrated systems in nanoscale era : (DTIS 2013) : Abu Dhabi, United Arab Emirates : 26-28 March 2013 : IEEE international conference on design & technology of integrated systems in nanoscale era : Mar 2013, Abu Dhabi, United Arab Emirates.

2013 8th international conference on design & technology of integrated systems in nanoscale era : (DTIS 2013) : Abu Dhabi, United Arab Emirates : 26-28 March 2013 : IEEE international conference on design & technology of integrated systems in nanoscale era : Mar 2013, Abu Dhabi, United Arab Emirates.
紙図書
IEEEc2013.<M17-14-334>
国立国会図書館

2016 IEEE 25th North Atlantic test workshop (NATW 2016) : Providence, Rhode Island, USA : 9-11 May 2016 : May 2016, Providence, RI.

2016 IEEE 25th North Atlantic test workshop (NATW 2016) : Providence, Rhode Island, USA : 9-11 May 2016 : May 2016, Providence, RI.
紙図書
IEEE[2016]<M17-18-1582>
国立国会図書館

2008 IEEE workshop on design and diagnostics of electronic circuits and systems : proceedings : April 16-18, 2008 : Bratislava, Slovakia. : 11th IEEE DDECS workshop : Apr 2008, Bratislava, Slovakia.

2008 IEEE workshop on design and diagnostics of electronic circuits and systems : proceedings : April 16-18, 2008 : Bratislava, Slovakia. : 11th IEEE DDECS workshop : Apr 2008, Bratislava, Slovakia.
紙図書
IEEEc2008.<M17-09-556>
国立国会図書館
  • 件名Integrated circuits -- Testing -- Congresses. Integrated circuits -- Design...

2011 IEEE 6th international design and test workshop : (IDT 2011) : Beirut, Lebanon : 11-14 December : Dec 2011, Beirut, Lebanon.

2011 IEEE 6th international design and test workshop : (IDT 2011) : Beirut, Lebanon : 11-14 December : Dec 2011, Beirut, Lebanon.
紙図書
IEEEc2011.<M17-12-3093>
国立国会図書館