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検索結果 6 件

Stress induced phenomena and reliability in 3D microelectronics : Kyoto, Japan : 28-30 May 2012 : international workshops "stress management for 3D ICs using through silicon vias--design for reliability" : 12th international workshop on stress-induced phenomena in microelectronics : May 2012, Kyoto, Japan. (AIP Conference Proceedings ; 1601)

Stress induced phenomena and reliability in 3D microelectronics : Kyoto, Japan : 28-30 May 2012 : international workshops "stress management for 3D ICs using through silicon vias--design for reliability" : 12th international workshop on stress-induced phenomena in microelectronics : May 2012, Kyoto, Japan. (AIP Conference Proceedings ; 1601)
紙図書
American Institute of Physics2014.<M17-15-831>
国立国会図書館

Stress-induced phenomena in metallization : eleventh international workshop on stress-induced phenomena in metallization : Bad Schandau, Germany 12-14 April 2010. : Apr 2010, Bad Schandau, Germany. (AIP Conference Proceedings ; 1300)

Stress-induced phenomena in metallization : eleventh international workshop on stress-induced phenomena in metallization : Bad Schandau, Germany 12-14 April 2010. : Apr 2010, Bad Schandau, Germany. (AIP Conference Proceedings ; 1300)
紙図書
American Institute of Physics2010.<M17-11-1386>
国立国会図書館
  • 件名Interconnects (Integrated circuit technology) -- Defects -- Congresses. Metal-metal bonds -- Congress...

Stress-induced phenomena in metallization : tenth international workshop on stress-induced phenomena in metallization : Austin, Texas 5-7 November 2008. : 10th stress workshop : Nov 2008, Austin, TX. (AIP Conference Proceedings ; 1143)

Stress-induced phenomena in metallization : tenth international workshop on stress-induced phenomena in metallization : Austin, Texas 5-7 November 2008. : 10th stress workshop : Nov 2008, Austin, TX. (AIP Conference Proceedings ; 1143)
紙図書
American Institute of Physics2009.<M17-10-405>
国立国会図書館全国の図書館
  • 件名Interconnects (Integrated circuit technology) -- Defects -- Congresses. Metal-metal bonds -- Congress...

Stress-induced phenomena in metallization : ninth international workshop on stress-induced phenomena in metallization : Kyoto, Japan 4-6 April 2007. : Apr 2007, Kyoto, Japan. (AIP Conference Proceedings ; 945)

Stress-induced phenomena in metallization : ninth international workshop on stress-induced phenomena in metallization : Kyoto, Japan 4-6 April 2007. : Apr 2007, Kyoto, Japan. (AIP Conference Proceedings ; 945)
紙図書
American Institute of Physics2007.<M17-08-188>
国立国会図書館
  • 件名Interconnects (Integrated circuit technology) -- Defects -- Congresses. Metal-metal bonds -- Congress...

Stress-induced phenomena in metallization : eighth international workshop on stress-induced phenomena in metallization : Dresden, Germany 12-14 September 2005. : Sep 2005, Dresden, Germany. (AIP Conference Proceedings ; 817)

Stress-induced phenomena in metallization : eighth international workshop on stress-induced phenomena in metallization : Dresden, Germany 12-14 September 2005. : Sep 2005, Dresden, Germany. (AIP Conference Proceedings ; 817)
紙図書
American Institute of Physics2006.<M17-06-1138>
国立国会図書館
  • 件名Interconnects (Integrated circuit technology) -- Defects -- Congresses. Metal-metal bonds -- Congress...

Stress-induced phenomena in metallization : Ninth international workshop on stress-induced phenomena in metallization, Kyoto, Japan 4 - 6 April 2007

Stress-induced phenomena in metallization : Ninth international workshop on stress-induced phenomena in metallization, Kyoto, Japan 4 - 6 April 2007
紙図書
editors, Shinichi Ogawa, Paul S. Ho, Ehrenfried Zschech ; sponsoring organization Japan Society of Applied PhysicsAmerican Institute of Physics2007
全国の図書館

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