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Advances in metrology for x-ray and EUV optics V : 18 August 2014 : San Diego, California, United States : Aug 2014, San Diego, CA. (SPIE Proceedings ; 9206)

Advances in metrology for x-ray and EUV optics V : 18 August 2014 : San Diego, California, United States : Aug 2014, San Diego, CA. (SPIE Proceedings ; 9206)
紙図書
SPIE[2014]<M17-15-236>
国立国会図書館

Advances in metrology for x-ray and EUV optics 4 : 12 August 2012 : San Diego, California, United States : Aug 2012, San Diego, CA. (SPIE Proceedings ; 8501)

Advances in metrology for x-ray and EUV optics 4 : 12 August 2012 : San Diego, California, United States : Aug 2012, San Diego, CA. (SPIE Proceedings ; 8501)
紙図書
SPIEc2012.<M17-13-1006>
国立国会図書館

Advances in metrology for x-ray and EUV optics 2 : 30 August 2007 : San Diego, California, USA. : Aug 2007, San Diego, CA. (SPIE Proceedings ; 6704)

Advances in metrology for x-ray and EUV optics 2 : 30 August 2007 : San Diego, California, USA. : Aug 2007, San Diego, CA. (SPIE Proceedings ; 6704)
紙図書
SPIEc2007.<M17-08-306>
国立国会図書館
  • 件名...-- Congresses. Measuring instruments -- Design and construction -- Congresses. Laser interfer...

Advances in metrology for x-ray and EUV optics : 2-3 August 2005 : San Diego, California, USA. : Aug 2005, San Diego, CA. (SPIE Proceedings ; 5921)

Advances in metrology for x-ray and EUV optics : 2-3 August 2005 : San Diego, California, USA. : Aug 2005, San Diego, CA. (SPIE Proceedings ; 5921)
紙図書
SPIEc2005.<M17-06-225>
国立国会図書館
  • 件名...-- Congresses. Measuring instruments -- Design and construction -- Congresses. Laser interfer...

Recent developments in traceable dimensional measurements 2 : 4-6 August 2003 : San Diego, California, USA. : Aug 2003, San Diego, CA. (SPIE Proceedings ; 5190)

Recent developments in traceable dimensional measurements 2 : 4-6 August 2003 : San Diego, California, USA. : Aug 2003, San Diego, CA. (SPIE Proceedings ; 5190)
紙図書
SPIEc2003.<M17-04-1394>
国立国会図書館全国の図書館
  • 件名...-- Congresses. Measuring instruments -- Design and construction -- Congresses. Laser interfer...

Recent developments in traceable dimensional measurements : 20-21 June 2001 : Munich, Germany. : Jun 2001, Munich, Germany. (SPIE Proceedings ; 4401)

Recent developments in traceable dimensional measurements : 20-21 June 2001 : Munich, Germany. : Jun 2001, Munich, Germany. (SPIE Proceedings ; 4401)
紙図書
SPIEc2001.<M17-03-2954>
国立国会図書館全国の図書館
  • 件名...-- Congresses. Measuring instruments -- Design and construction -- Congresses. Laser interfer...

The nanopositioning book

The nanopositioning book
紙図書
Thomas R. Hicks, Paul D. Atherton with contributions from Ying Xu, Malachy McConnellQueensgate Instruments1997
全国の図書館
  • 件名Nanotechnology Physical measurements -- Standards Measuring instruments -- Design and construction
  • 件名（識別子）Nanotechnology Physical measurements -- Standards Measuring instruments -- Design and construction

Advances in metrology for x-ray and EUV optics II : 30 August 2007, San Diego, California, USA

Advances in metrology for x-ray and EUV optics II : 30 August 2007, San Diego, California, USA
紙図書
Lahsen Assoufid, Peter Z. Takacs, Masaru Ohtsuka, chairs/editors ; sponsored and published by SPIE--the International Society for Optical EngineeringSPIEc2007
全国の図書館
  • 件名... -- Congresses Measuring instruments -- Design and construction -- Congresses Laser interfero...
  • 件名（識別子）... -- Congresses Measuring instruments -- Design and construction -- Congresses Laser interfero...

Advances in metrology for x-ray and EUV optics : 2-3 August 2005, San Diego, California, USA

Advances in metrology for x-ray and EUV optics : 2-3 August 2005, San Diego, California, USA
紙図書
Lahsen Assoufid, Peter Z. Takacs, John S. Taylor, chairs/editors ; sponsored and published by SPIE--the International Society for Optical EngineeringSPIEc2005
全国の図書館
  • 件名... -- Congresses Measuring instruments -- Design and construction -- Congresses Laser interfero...
  • 件名（識別子）... -- Congresses Measuring instruments -- Design and construction -- Congresses Laser interfero...

Correlation-based measurement systems : Halsted Press

Correlation-based measurement systems : Halsted Press
紙図書
James Jordan, Peter Bishop, Bijan KianiE. Horwood1989
全国の図書館
  • 件名...d construction Measuring instruments -- Design and construction Correlators -- Design and con...
  • 件名（識別子）...d construction Measuring instruments -- Design and construction Correlators -- Design and con...

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