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Semiconductor measurement technology
Rev. Mar. 1983 (NBS list of publications ; 72)
Semiconductor measurement technology Rev. Mar. 1983 (NBS list of publications ; 72)
マイクロ
図書
1983
<YCA-C 13.37:72/3>
国立国会図書館
Semiconductor measurement technology
. Rev. Mar. 1982. (NBS list of publications ; 72)
Semiconductor measurement technology. Rev. Mar. 1982. (NBS list of publications ; 72)
紙
図書
U.S. Dept. of Commerce, National Bureau of Standards
1982.
<ND1-30>
国立国会図書館
Thin film reference materials development [microform] : final report for CRADA CN-1364 / Barbara J. Belzer ... [et al.] (
Semiconductor measurement technology
) (NIST special publication ; 400-100)
Thin film reference materials development [microform] : final report for CRADA CN-1364 / Barbara J. Belzer ... [et al.] (Semiconductor measurement technology) (NIST special publication ; 400-100)
マイクロ
図書
1998
<YCA-C 13.10:400-100>
国立国会図書館
Semiconductor measurement technology
. Rev. Dec. 1979. (NBS list of publications ; 72)
Semiconductor measurement technology. Rev. Dec. 1979. (NBS list of publications ; 72)
紙
図書
U.S. Dept. of Commerce, National Bureau of Standards
1979.
<ND1-26>
国立国会図書館
The results of an interlaboratory study of ellipsometric measurements of thin film silicon dioxide on silicon [microform] / Barbara J. Belzer and David L. Blackburn (
Semiconductor measurement technology
) (NIST special publication ; 400-99)
The results of an interlaboratory study of ellipsometric measurements of thin film silicon dioxide on silicon [microform] / Barbara J. Belzer and David L. Blackburn (Semiconductor measurement technology) (NIST special publication ; 400-99)
マイクロ
図書
1997
<YCA-C 13.10:400-99>
国立国会図書館
Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry [microform] / W. Murray Bullis, S. Perkowitz, D.G. Seiler (NIST special publication ; 400-98) (
Semiconductor measurement technology
)
Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry [microform] / W. Murray Bullis, S. Perkowitz, D.G. Seiler (NIST special publication ; 400-98) (Semiconductor measurement technology)
マイクロ
図書
1995
<YCA-C 13.10:400-98>
国立国会図書館
INSTANT-IGBT network simulation and transient ANalysis tool microform / A.R. Hefner, Jr (
Semiconductor measurement technology
) (NIST special publication ; 400-88)
INSTANT-IGBT network simulation and transient ANalysis tool microform / A.R. Hefner, Jr (Semiconductor measurement technology) (NIST special publication ; 400-88)
マイクロ
図書
1992
<YCA-C 13.10:400-88>
国立国会図書館
Version 2.0 of the TXYZ thermal analysis program, TXYZ20 [microform] / John Albers (
Semiconductor measurement technology
) (NIST special publication ; 400-89)
Version 2.0 of the TXYZ thermal analysis program, TXYZ20 [microform] / John Albers (Semiconductor measurement technology) (NIST special publication ; 400-89)
マイクロ
図書
1992
<YCA-C 13.10:400-89>
国立国会図書館
HOTPAC [microform] : programs for thermal analysis including version 3.0 of the TXYZ program, TXYZ 30, and the thermal multilayer program, TML / John Albers (
Semiconductor measurement technology
) (NIST special publication ; 400-96)
HOTPAC [microform] : programs for thermal analysis including version 3.0 of the TXYZ program, TXYZ 30, and the thermal multilayer program, TML / John Albers (Semiconductor measurement technology) (NIST special publication ; 400-96)
マイクロ
図書
1995
<YCA-C 13.10:400-96>
国立国会図書館
Design and testing guides for the CMOS and lateral bipolar-on-SOI test library [microform] / Janet C. Marshall and Mona E. Zaghloul (
Semiconductor measurement technology
) (NIST special publication ; 400-93)
Design and testing guides for the CMOS and lateral bipolar-on-SOI test library [microform] / Janet C. Marshall and Mona E. Zaghloul (Semiconductor measurement technology) (NIST special publication ; 400-93)
マイクロ
図書
1994
<YCA-C 13.10:400-93>
国立国会図書館
User's manual for the program MONSEL-1 [microform] : Monte Carlo simulation of SEM signals for linewidth metrology / Jeremiah R. Lowney and Egon Marx (
Semiconductor measurement technology
) (NIST special publication ; 400-95)
User's manual for the program MONSEL-1 [microform] : Monte Carlo simulation of SEM signals for linewidth metrology / Jeremiah R. Lowney and Egon Marx (Semiconductor measurement technology) (NIST special publication ; 400-95)
マイクロ
図書
1994
<YCA-C 13.10:400-95>
国立国会図書館
Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satellites [microform] / David G. Seiler ... [et al.] (
Semiconductor measurement technology
) (NIST special publication ; 400-94)
Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satellites [microform] / David G. Seiler ... [et al.] (Semiconductor measurement technology) (NIST special publication ; 400-94)
マイクロ
図書
1994
<YCA-C 13.10:400-94>
国立国会図書館
Thermal resistance measurements [microform] / Frank F. Oettinger and David L. Blackburn (NIST special publication ; 400-86) (
Semiconductor measurement technology
)
Thermal resistance measurements [microform] / Frank F. Oettinger and David L. Blackburn (NIST special publication ; 400-86) (Semiconductor measurement technology)
マイクロ
図書
1990
<YCA-C 13.10:400-86>
国立国会図書館
Semiconductor measurement technology
[microform] : evolution of silicon materials characterization : lessons learned for improved manufacturing / W. Murray Bullis ; prepared for Semiconductor Electronics Division, Electronics and Electrical Engineering Laboratory, National Institute of Standards and Technology" (NIST special publication ; 400-92)
Semiconductor measurement technology [microform] : evolution of silicon materials characterization : lessons learned for improved manufacturing / W. Murray Bullis ; prepared for Semiconductor Electronics Division, Electronics and Electrical Engineering Laboratory, National Institute of Standards and Technology" (NIST special publication ; 400-92)
マイクロ
図書
1993
<YCA-C 13.10:400-92>
国立国会図書館
Evaluating a chip, wafer, or lot using SUXES, SPICE, and STAT2 microform / J.C. Marshall and R.L. Mattis (
Semiconductor measurement technology
) (NIST special publication ; 400-90)
Evaluating a chip, wafer, or lot using SUXES, SPICE, and STAT2 microform / J.C. Marshall and R.L. Mattis (Semiconductor measurement technology) (NIST special publication ; 400-90)
マイクロ
図書
1992
<YCA-C 13.10:400-90>
国立国会図書館
Test structure implementation document [microform] : DC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs) / C.E. Schuster ; sponsored by Defense Advanced Research Projects Agency and U.S. Air Force Wright Laboratory (NIST special publication ; 400-97) (
Semiconductor measurement technology
)
Test structure implementation document [microform] : DC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs) / C.E. Schuster ; sponsored by Defense Advanced Research Projects Agency and U.S. Air Force Wright Laboratory (NIST special publication ; 400-97) (Semiconductor measurement technology)
マイクロ
図書
1995
<YCA-C 13.10:400-97>
国立国会図書館
A programmable reverse-bias safe operating area transistor tester [microform] / D.W. Berning (NIST special publication ; 400-87) (
Semiconductor measurement technology
)
A programmable reverse-bias safe operating area transistor tester [microform] / D.W. Berning (NIST special publication ; 400-87) (Semiconductor measurement technology)
マイクロ
図書
1990
<YCA-C 13.10:400-87>
国立国会図書館
Semiconductor measurement technology
: a bibliography of NBS publications for the years 1962-1986 / edited by Jane Walters (NBSIR ; 87-3522)
Semiconductor measurement technology : a bibliography of NBS publications for the years 1962-1986 / edited by Jane Walters (NBSIR ; 87-3522)
マイクロ
図書
1987
<YCA-C 13.58:87-3522>
国立国会図書館
Analytic analysis of ellipsometric errors / Deane Chandler-Horowitz (
Semiconductor measurement technology
) (NBS special publication ; 400-78)
Analytic analysis of ellipsometric errors / Deane Chandler-Horowitz (Semiconductor measurement technology) (NBS special publication ; 400-78)
マイクロ
図書
1986
<YCA-C 13.10:400-78>
国立国会図書館
Automatic determination of the interstitial oxygen content of silicon wafers polished on both sides / Warren K. Gladden ... [et al.] (
Semiconductor measurement technology
) (NIST special publication ; 400-81)
Automatic determination of the interstitial oxygen content of silicon wafers polished on both sides / Warren K. Gladden ... [et al.] (Semiconductor measurement technology) (NIST special publication ; 400-81)
マイクロ
図書
1988
<YCA-C 13.10:400-81>
国立国会図書館
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