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Search results 92

Total ionizing dose effects on MOS and bipolar devices in the natural space radiation environment SAND982040C DE99 000996

Total ionizing dose effects on MOS and bipolar devices in the natural space radiation environment SAND982040C DE99 000996
Microform規格・テクニカルリポート類
Fleetwood, D. M1998<LS-DE99/000996>
National Diet Library

Precursor ion damage and single event gate rupture in thin oxides SAND980452C DE98 005038 CONF980705

Precursor ion damage and single event gate rupture in thin oxides SAND980452C DE98 005038 CONF980705
Microform規格・テクニカルリポート類
Sexton, F. W, Fleetwood, D. M, Shaneyfelt, M. R, Dodd, P. E, Hash, G. L1998<LS-DE98/005038>
National Diet Library

Common-source TLD and RADFET characterization of Co-60, Cs-137, and x-ray irradiation sources SAND-97-0349C DE97 003211 CONF-97071114

Common-source TLD and RADFET characterization of Co-60, Cs-137, and x-ray irradiation sources SAND-97-0349C DE97 003211 CONF-97071114
Microform規格・テクニカルリポート類
Simons, M, Pease, R. L, Fleetwood, D. M1997<LS-DE97/003211>
National Diet Library

Effects of emitter-tied field plates on lateral PNP ionizing radiation response SAND980625C DE98 005032 CONF980705

Effects of emitter-tied field plates on lateral PNP ionizing radiation response SAND980625C DE98 005032 CONF980705
Microform規格・テクニカルリポート類
Barnaby, H. J, Schrimpf, R. D, Cirba, C. R, Pease, R. L, Fleetwood, D. M1998<LS-DE98/005032>
National Diet Library

Latent interface traps and 1/f noise in irradiated MOS devices SAND-97-0348C DE97 003212 CONF-97071113

Latent interface traps and 1/f noise in irradiated MOS devices SAND-97-0348C DE97 003212 CONF-97071113
Microform規格・テクニカルリポート類
Fleetwood, D. M, Johnson, M. J1997<LS-DE97/003212>
National Diet Library

Effects of irradiation and isochronal anneal temperature on hole and electron trapping in MOS devices SAND980381C DE98 004964 CONF980705

Effects of irradiation and isochronal anneal temperature on hole and electron trapping in MOS devices SAND980381C DE98 004964 CONF980705
Microform規格・テクニカルリポート類
Fleetwood, D. M, Winokur, P. S, Shaneyfelt, M. R, Riewe, L. C, Flament, O1998<LS-DE98/004964>
National Diet Library

Dose enhancement in a room cobalt-60 source SAND-97-0424C DE97 003201 CONF-97071112

Dose enhancement in a room cobalt-60 source SAND-97-0424C DE97 003201 CONF-97071112
Microform規格・テクニカルリポート類
Simons, M, Pease, R. L, Fleetwood, D. M, Schwank, J. R, Krzesniak, M1997<LS-DE97/003201>
National Diet Library

Effects of irradiation and proton implantation on the density of mobile protons in SiO(sub 2) films SAND980914C DE98 004955 CONF980705

Effects of irradiation and proton implantation on the density of mobile protons in SiO(sub 2) films SAND980914C DE98 004955 CONF980705
Microform規格・テクニカルリポート類
Vanheusden, K, Fleetwood, D. M, Schwank, J. R, Shaneyfelt, M. R, Meisenheimer, T. L1998<LS-DE98/004955>
National Diet Library

Fast and slow border traps in MOS devices SAND-95-2056C DE95 017894 CONF-95091072

Fast and slow border traps in MOS devices SAND-95-2056C DE95 017894 CONF-95091072
Microform規格・テクニカルリポート類
Fleetwood, D. M1995<LS-DE95/017894>
National Diet Library

Effects on focused ion beam irradiation on MOS transistors SAND-96-2512C DE97 004206 CONF-9704281

Effects on focused ion beam irradiation on MOS transistors SAND-96-2512C DE97 004206 CONF-9704281
Microform規格・テクニカルリポート類
Campbell, A. N, Peterson, K. A, Fleetwood, D. M, Soden, J. M1997<LS-DE97/004206>
National Diet Library

Space charge limited degradation of bipolar oxides at low electric-fields SAND980709C DE98 005033 CONF980705

Space charge limited degradation of bipolar oxides at low electric-fields SAND980709C DE98 005033 CONF980705
Microform規格・テクニカルリポート類
Witczak, S. C, Lacoe, R. C, Mayer, D. C, Fleetwood, D. M, Schrimpf, R. D1998<LS-DE98/005033>
National Diet Library

Effects of temperature on MOS radiation response SAND-97-0602C DE97 003729 CONF-9709341

Effects of temperature on MOS radiation response SAND-97-0602C DE97 003729 CONF-9709341
Microform規格・テクニカルリポート類
Shaneyfelt, M. R, Schwank, J. R, Fleetwood, D. M, Winokur, P. S1997<LS-DE97/003729>
National Diet Library

Impact of aging on radiation hardness SAND-97-1571C DE97 006945 CONF-97071116

Impact of aging on radiation hardness SAND-97-1571C DE97 006945 CONF-97071116
Microform規格・テクニカルリポート類
Shaneyfelt, M. R, Winokur, P. S, Fleetwood, D. M1997<LS-DE97/006945>
National Diet Library

Enhanced low-rate radiation-induced charge trapping at the emitter-base/oxide interface of bipolar devices SAND-96-2092C DE96 014087 CONF-9612311

Enhanced low-rate radiation-induced charge trapping at the emitter-base/oxide interface of bipolar devices SAND-96-2092C DE96 014087 CONF-9612311
Microform規格・テクニカルリポート類
Fleetwood, D. M, Schrimpf, R. D1996<LS-DE96/014087>
National Diet Library

Radiation-induced gain degradation in lateral PNP BJTs with lightly and heavily doped emitters SAND-97-0425C DE97 003203 CONF-97071115

Radiation-induced gain degradation in lateral PNP BJTs with lightly and heavily doped emitters SAND-97-0425C DE97 003203 CONF-97071115
Microform規格・テクニカルリポート類
Wu, A, Schrimpf, R. D, Pease, R. L, Fleetwood, D. M, Kosier, S. L1997<LS-DE97/003203>
National Diet Library

First-principles approach to total-dose hardness assurance SAND-95-0922C DE96 002238 CONF-9507163

First-principles approach to total-dose hardness assurance SAND-95-0922C DE96 002238 CONF-9507163
Microform規格・テクニカルリポート類
Fleetwood, D. M1995<LS-DE96/002238>
National Diet Library

Direct observation of mobile protons in SiO(sub 2) thin films: Potential application in a novel memory device SAND-97-0062C DE97 002463 CONF-96120225

Direct observation of mobile protons in SiO(sub 2) thin films: Potential application in a novel memory device SAND-97-0062C DE97 002463 CONF-96120225
Microform規格・テクニカルリポート類
Vanheusden, K, Warren, W. L, Fleetwood, D. M1996<LS-DE97/002463>
National Diet Library

Single event gate rupture in thin gate oxides SAND-97-0426C DE97 003202 CONF-97071111

Single event gate rupture in thin gate oxides SAND-97-0426C DE97 003202 CONF-97071111
Microform規格・テクニカルリポート類
Sexton, F. W, Fleetwood, D. M, Shaneyfelt, M. R, Dodd, P. E, Hash, G. L1997<LS-DE97/003202>
National Diet Library

Radiation-induced charge trapping in bipolar base oxides SAND-96-0406C DE96 006383 CONF-9607731

Radiation-induced charge trapping in bipolar base oxides SAND-96-0406C DE96 006383 CONF-9607731
Microform規格・テクニカルリポート類
Fleetwood, D. M, Riewe, L. C, Witczak, S. R. D1996<LS-DE96/006383>
National Diet Library

Accelerated tests for bounding the low dose rate radiation response of lateral PNP bipolar junction transistors SAND-96-0563C DE96 006384 CONF-9607732

Accelerated tests for bounding the low dose rate radiation response of lateral PNP bipolar junction transistors SAND-96-0563C DE96 006384 CONF-9607732
Microform規格・テクニカルリポート類
Witczak, S. C, Schrimpf, R. D, Galloway, K. F, Schmidt, D. M, Fleetwood, D. M1996<LS-DE96/006384>
National Diet Library