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Reliability, packaging, testing, and characterization of MOEMS/MEMS, nanodevices, and nanomaterials XIII : 3-4 February 2014 : San Francisco, California, USA : MOEMS-MEMS symposium : Feb 2014, San Francisco, CA. (SPIE Proceedings ; 8975)

Reliability, packaging, testing, and characterization of MOEMS/MEMS, nanodevices, and nanomaterials XIII : 3-4 February 2014 : San Francisco, California, USA : MOEMS-MEMS symposium : Feb 2014, San Francisco, CA. (SPIE Proceedings ; 8975)
Paper図書
SPIE[2014]<M17-14-2670>
National Diet Library
  • Author HeadingShea, Herbert R. Ramesham, Rajeshuni.

Reliability, packaging, testing, and characterization of MOEMS/MEMS and nanodevices 12 : 4-5 February 2013 : San Francisco, California, United States : Feb 2013, San Francisco, CA. (SPIE Proceedings ; 8614)

Reliability, packaging, testing, and characterization of MOEMS/MEMS and nanodevices 12 : 4-5 February 2013 : San Francisco, California, United States : Feb 2013, San Francisco, CA. (SPIE Proceedings ; 8614)
Paper図書
SPIEc2013.<M17-13-2959>
National Diet Library
  • Author HeadingRamesham, Rajeshuni. Shea, Herbert R.

Reliability, packaging, testing, and characterization of MEMS/MOEMS and nanodevices 10 : 24-25 January 2011 : San Francisco, California, United States. : reliability, packaging, testing, and characterization of MEMS/MOEMS and nanodevices conference : photonics west 2011's MOEMS-MEMS symposium : Jan 2011, San Francisco, CA. (SPIE Proceedings ; 7928)

Reliability, packaging, testing, and characterization of MEMS/MOEMS and nanodevices 10 : 24-25 January 2011 : San Francisco, California, United States. : reliability, packaging, testing, and characterization of MEMS/MOEMS and nanodevices conference : photonics west 2011's MOEMS-MEMS symposium : Jan 2011, San Francisco, CA. (SPIE Proceedings ; 7928)
Paper図書
SPIEc2011.<M17-11-2358>
National Diet Library
  • Author HeadingGarcia-Blanco, Sonia. Universiteit Twente (Netherlands) Ramesham, Rajeshuni.

Reliability, packaging, testing, and characterization of MEMS/MOEMS and nanodevices 11 : 23-24 January 2012 : San Francisco, California, United States : Jan 2012, San Francisco, CA. (SPIE Proceedings ; 8250)

Reliability, packaging, testing, and characterization of MEMS/MOEMS and nanodevices 11 : 23-24 January 2012 : San Francisco, California, United States : Jan 2012, San Francisco, CA. (SPIE Proceedings ; 8250)
Paper図書
SPIEc2012.<M17-12-3311>
National Diet Library
  • Author Heading... (Netherlands) Ramesham, Rajeshuni. Fraunhofer-Institut für Zuver...

Reliability, packaging, testing, and characterization of MEMS/MOEMS and nanodevices 9 : 25-26 January 2010 : San Francisco, California, United States. : reliability, packaging, testing, and characterization of MEMS/MOEMS and nanodevices conference : Jan 2010, San Francisco, CA. (SPIE Proceedings ; 7592)

Reliability, packaging, testing, and characterization of MEMS/MOEMS and nanodevices 9 : 25-26 January 2010 : San Francisco, California, United States. : reliability, packaging, testing, and characterization of MEMS/MOEMS and nanodevices conference : Jan 2010, San Francisco, CA. (SPIE Proceedings ; 7592)
Paper図書
SPIEc2010.<M17-10-3692>
National Diet Library
  • Author HeadingKullberg, Richard C. Ramesham, Rajeshuni.

Reliability, packaging, testing, and characterization of MEMS/MOEMS and nanodevices 8 : 28-29 January 2009 : San Jose, California, United States. : international reliability conference : photonics west 2009 : MOEMS-MEMS 2009 devices/applications/reliability symposium : Jan 2009, San Jose, CA. (SPIE Proceedings ; 7206)

Reliability, packaging, testing, and characterization of MEMS/MOEMS and nanodevices 8 : 28-29 January 2009 : San Jose, California, United States. : international reliability conference : photonics west 2009 : MOEMS-MEMS 2009 devices/applications/reliability symposium : Jan 2009, San Jose, CA. (SPIE Proceedings ; 7206)
Paper図書
SPIEc2009.<M17-09-1761>
National Diet Library
  • Author HeadingKullberg, Richard C. Ramesham, Rajeshuni.

Reliability, packaging, testing, and characterization of MEMS/MOEMS 7 : 21-22 January 2008 : San Jose, California, USA. : international reliability conference : 7th conference on reliability, packaging, testing, and characterization of MEMS/MOEMS : photonics west 2008 meeting : MOEMS-MEMS 2008 micro-nano fabrication symposium : Jan 2008, San Jose, CA. (SPIE Proceedings ; 6884)

Reliability, packaging, testing, and characterization of MEMS/MOEMS 7 : 21-22 January 2008 : San Jose, California, USA. : international reliability conference : 7th conference on reliability, packaging, testing, and characterization of MEMS/MOEMS : photonics west 2008 meeting : MOEMS-MEMS 2008 micro-nano fabrication symposium : Jan 2008, San Jose, CA. (SPIE Proceedings ; 6884)
Paper図書
SPIEc2008.<M17-08-1453>
National Diet LibraryOther Libraries in Japan
  • Author HeadingHartzell, Allyson L. Ramesham, Rajeshuni.

Reliability, packaging, testing, and characterization of MEMS/MOEMS 6 : 23-24 January 2007 : San Jose, California, USA. : reliability, packaging, testing, and characterization of MEMS/MOEMS conference : photonics west 2007 : MOEMS-MEMS 2007 micro-nano fabrication symposium : Jan 2007, San Jose, CA. (SPIE Proceedings ; 6463)

Reliability, packaging, testing, and characterization of MEMS/MOEMS 6 : 23-24 January 2007 : San Jose, California, USA. : reliability, packaging, testing, and characterization of MEMS/MOEMS conference : photonics west 2007 : MOEMS-MEMS 2007 micro-nano fabrication symposium : Jan 2007, San Jose, CA. (SPIE Proceedings ; 6463)
Paper図書
SPIEc2007.<M17-07-998>
National Diet Library
  • Author HeadingHartzell, Allyson L. Ramesham, Rajeshuni.

Reliability, packaging, testing, and characterization of MEMS/MOEMS 5 : 25-26 January 2006 : San Jose, California, USA. : Jan 2006, San Jose, CA. (SPIE Proceedings ; 6111)

Reliability, packaging, testing, and characterization of MEMS/MOEMS 5 : 25-26 January 2006 : San Jose, California, USA. : Jan 2006, San Jose, CA. (SPIE Proceedings ; 6111)
Paper図書
SPIEc2006.<M17-06-1210>
National Diet LibraryOther Libraries in Japan
  • Author HeadingTanner, Danelle Mary, 1952- Ramesham, Rajeshuni.

Reliability, testing, and characterization of MEMS/MOEMS 3 : 26-28 January 2004 : San Jose, California, USA. : SPIE conference on reliability, testing, and characterization of MEMS/MOEMS : Jan 2004, San Jose, CA. (SPIE Proceedings ; 5343)

Reliability, testing, and characterization of MEMS/MOEMS 3 : 26-28 January 2004 : San Jose, California, USA. : SPIE conference on reliability, testing, and characterization of MEMS/MOEMS : Jan 2004, San Jose, CA. (SPIE Proceedings ; 5343)
Paper図書
SPIEc2004.<M17-04-2169>
National Diet LibraryOther Libraries in Japan
  • Author HeadingTanner, Danelle Mary, 1952- Ramesham, Rajeshuni.

Reliability, testing, and characterization of MEMS/MOEMS 2 : 27-29 January 2003 : San Jose, California, USA. : Jan 2003, San Jose, CA. (SPIE Proceedings ; 4980)

Reliability, testing, and characterization of MEMS/MOEMS 2 : 27-29 January 2003 : San Jose, California, USA. : Jan 2003, San Jose, CA. (SPIE Proceedings ; 4980)
Paper図書
SPIEc2003.<M17-03-1639>
National Diet LibraryOther Libraries in Japan
  • Author Heading...ational (SEMI) Ramesham, Rajeshuni. Tanner, Danelle Mary, 1952-

Reliability, testing, and characterization of MEMS/MOEMS : 22-24 October 2001 : San Francisco, USA. : MEMS and MOEMS conference : Oct 2001, San Francisco, CA. (SPIE Proceedings ; 4558)

Reliability, testing, and characterization of MEMS/MOEMS : 22-24 October 2001 : San Francisco, USA. : MEMS and MOEMS conference : Oct 2001, San Francisco, CA. (SPIE Proceedings ; 4558)
Paper図書
SPIEc2001.<M17-03-4977>
National Diet Library
  • Author HeadingSemiconductor Equipment and Materials International (SEMI) Ramesham, Rajeshuni.

Reliability, packaging, testing, and characterization of MEMS/MOEMS VI : 23-24 January, 2007, San Jose, California, USA

Reliability, packaging, testing, and characterization of MEMS/MOEMS VI : 23-24 January, 2007, San Jose, California, USA
Paper図書
Allyson L. Hartzell, Rajeshuni Ramesham, chairs/editors ; sponsored and published by SPIE--the International Society for Optical EngineeringSPIEc2007
Other Libraries in Japan

Reliability, testing, and characterization of MEMS/MOEMS : 22-24 October 2001, San Trancisco, USA

Reliability, testing, and characterization of MEMS/MOEMS : 22-24 October 2001, San Trancisco, USA
Paper図書
Rajeshuni Ramesham, chair/editor ; sponsored and published by SPIE--The International Society for Optical Engineering ; cooperating organizations, SEMI--Semiconductor Equipment and Materials International (USA) ... [et al.]SPIEc2001
Other Libraries in Japan

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