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2009 IEEE international workshop on memory technology, design and testing : (MTDT 2009) : Hsinchu, Taiwan : 31 August-2 September 2009. : MTDT2009 : Aug 2009, Hsinchu, Taiwan.

2009 IEEE international workshop on memory technology, design and testing : (MTDT 2009) : Hsinchu, Taiwan : 31 August-2 September 2009. : MTDT2009 : Aug 2009, Hsinchu, Taiwan.
Paper図書
IEEEc2009.<M17-11-564>
National Diet Library
  • Subject HeadingSemiconductor storage devices -- Testing -- Congresses. Random access memory -- Cong...

MTDT 2004 : records of the 2004 international workshop on memory technology, design and testing : 9-10 August 2004 : San Jose, California, USA. : Aug 2004, San Jose, CA.

MTDT 2004 : records of the 2004 international workshop on memory technology, design and testing : 9-10 August 2004 : San Jose, California, USA. : Aug 2004, San Jose, CA.
Paper図書
IEEE Computer Societyc2004.<M17-05-431>
National Diet Library

Records of the 2003 international workshop on memory technology, design and testing : 28-29 July 2003 : San Jose California. : MTDT-03, the 11th annual IEEE international workshop on memory technology, design and testing : 11th annual meeting of the MTDT workshop : MTDT 2003 : Jul 2003, San Jose, CA. (Memory Technology, Design and Testing)

Records of the 2003 international workshop on memory technology, design and testing : 28-29 July 2003 : San Jose California. : MTDT-03, the 11th annual IEEE international workshop on memory technology, design and testing : 11th annual meeting of the MTDT workshop : MTDT 2003 : Jul 2003, San Jose, CA. (Memory Technology, Design and Testing)
Paper図書
IEEE Computer Societyc2003.<M17-04-1660>
National Diet Library

Proceedings of the 2002 IEEE international workshop on memory technology, design and testing : (MTDT 2002) : 10-12 July 2002, Isle of Bendor, France. : 10th IEEE international workshop on memory technology, design and testing : Jul 2002, Bandol, France. (Memory Technology, Design and Testing)

Proceedings of the 2002 IEEE international workshop on memory technology, design and testing : (MTDT 2002) : 10-12 July 2002, Isle of Bendor, France. : 10th IEEE international workshop on memory technology, design and testing : Jul 2002, Bandol, France. (Memory Technology, Design and Testing)
Paper図書
IEEE Computer Societyc2002.<M17-03-393>
National Diet Library
  • Subject HeadingSemiconductor storage devices -- Testing -- Congresses. Random access memory -- Cong...

2001 IEEE international workshop on memory technology, design and testing : proceedings : August 6-7, 2001 : San Jose, California, USA. : MTDT 2001 : Aug 2001, San Jose, CA. (Memory Technology, Design and Testing)

2001 IEEE international workshop on memory technology, design and testing : proceedings : August 6-7, 2001 : San Jose, California, USA. : MTDT 2001 : Aug 2001, San Jose, CA. (Memory Technology, Design and Testing)
Paper図書
IEEE Computer Societyc2001.<M17-03-2017>
National Diet Library
  • Subject HeadingSemiconductor storage devices -- Testing -- Congresses. Random access memory -- Cong...

2005 IEEE International Workshop on Memory Technology, Design and Testing : MTDT 2005 : 3-5 August, 2005, Taipei, Taiwan

2005 IEEE International Workshop on Memory Technology, Design and Testing : MTDT 2005 : 3-5 August, 2005, Taipei, Taiwan
Paper図書
IEEE Computer Society Test Technology Technical Council ; co-sponsored by National Tsing Hua UniversityIEEE Computer Societyc2005
Other Libraries in Japan
  • Subject HeadingSemiconductor storage devices -- Testing -- Congresses Random access memory -- Congr...
  • Subject Heading (ID)Semiconductor storage devices -- Testing -- Congresses Random access memory -- Congr...

Records of the 2004 International Workshop on Memory Technology, Design and Testing : MTDT 2004 : 9-10 August, 2004, San Jose, California, USA

Records of the 2004 International Workshop on Memory Technology, Design and Testing : MTDT 2004 : 9-10 August, 2004, San Jose, California, USA
Paper図書
edited by R. Rajsuman and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Test Technology Technical Council, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits SocietyIEEE Computer Societyc2004
Other Libraries in Japan
  • Subject HeadingSemiconductor storage devices -- Testing -- Congresses Random access memory -- Congr...
  • Subject Heading (ID)Semiconductor storage devices -- Testing -- Congresses Random access memory -- Congr...

Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France : bookbroker

Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France : bookbroker
Paper図書
editors, Bernard Courtois, Thomas Wik, Yervant Zorian ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits SocietyIEEE Computer Societyc2002
Other Libraries in Japan
  • Subject HeadingSemiconductor storage devices -- Testing -- Congresses Random access memory -- Congr...
  • Subject Heading (ID)Semiconductor storage devices -- Testing -- Congresses Random access memory -- Congr...

Proceedings / International Test Conference.

Proceedings / International Test Conference.
Paper図書
IEEE Computer Society Pressc1983-<M154-229>
National Diet Library
  • Subject Heading...-- Congresses. Semiconductor storage devices -- Testing -- Congresses.

Proceedings : International Workshop on Memory Technology, Design and Testing, August 24-25, 1998, San Jose, California, USA

Proceedings : International Workshop on Memory Technology, Design and Testing, August 24-25, 1998, San Jose, California, USA
Paper図書
sponsored by IEEE Computer Society Technical Committee on Test Technology, Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuit Society ; edited by D. Lepejian, ... [et al.]IEEE Computer Society Pressc1998
Other Libraries in Japan
  • Subject HeadingSemiconductor storage devices -- Testing -- Congresses Random access memory -- Congr...
  • Subject Heading (ID)Semiconductor storage devices -- Testing -- Congresses Random access memory -- Congr...

Proceedings : International Workshop on Memory Technology, Design, and Testing

Proceedings : International Workshop on Memory Technology, Design, and Testing
Paper図書
edited by F. Lombardi, R. Rajsuman, and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits CouncilIEEE Computer Society Pressc1997
Other Libraries in Japan
  • Subject HeadingSemiconductor storage devices -- Testing -- Congresses Random access memory -- Congr...
  • Subject Heading (ID)Semiconductor storage devices -- Testing -- Congresses Random access memory -- Congr...

Records of the 1996 IEEE International Workshop on Memory Technology, Design, and Testing, August 13-14, 1996, Singapore

Records of the 1996 IEEE International Workshop on Memory Technology, Design, and Testing, August 13-14, 1996, Singapore
Paper図書
edited by Rochit Rajsuman, Yong-Khim Swee, Lee-Yee Lau ; sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits CouncilIEEE Computer Society Pressc1996
Other Libraries in Japan
  • Subject HeadingSemiconductor storage devices -- Testing -- Congresses Random access memory -- Congr...
  • Subject Heading (ID)Semiconductor storage devices -- Testing -- Congresses Random access memory -- Congr...

Records of the 1995 IEEE International Workshop on Memory Technology, Design, and Testing, August 7-8, 1995, San Jose, California

Records of the 1995 IEEE International Workshop on Memory Technology, Design, and Testing, August 7-8, 1995, San Jose, California
Paper図書
edited by R. Rajsuman and K. Rajkanan ; sponsored by the IEEE Computer Society Technical Committee on Test Technology, the IEEE Computer Society Technical Committee on VLSI ; in cooperation with the IEEE Solid State Circuits CouncilIEEE Computer Society Pressc1995
Other Libraries in Japan
  • Subject HeadingSemiconductor storage devices -- Testing -- Congresses Random access memory -- Congr...
  • Subject Heading (ID)Semiconductor storage devices -- Testing -- Congresses Random access memory -- Congr...

Records of the IEEE International Workshop on Memory Technology, Design, and Testing, August 8-9, 1994, San Jose, California

Records of the IEEE International Workshop on Memory Technology, Design, and Testing, August 8-9, 1994, San Jose, California
Paper図書
edited by R. Rajsuman ; sponsored by IEEE Computer Society Technical Committee on Test Technology in cooperation with the IEEE Computer Society Technical Committee on VLSIIEEE Computer Society Pressc1994
Other Libraries in Japan
  • Subject HeadingSemiconductor storage devices -- Testing -- Congresses Random access memory -- Congr...
  • Subject Heading (ID)Semiconductor storage devices -- Testing -- Congresses Random access memory -- Congr...

Memory & LSI; digest of papers.

Memory & LSI; digest of papers.
Paper図書
Institute of Electrical and Electronic Engineers.1974.<ND386-17>
National Diet Library
  • Subject HeadingSemiconductor storage devices -- Testing -- Congresses. Integrated circuits -- Large...

Memory & LSI : digest of papers, 1977 Semiconductor Test Symposium, October 25-27, 1977, held at Cherry Hill, New Jersey

Memory & LSI : digest of papers, 1977 Semiconductor Test Symposium, October 25-27, 1977, held at Cherry Hill, New Jersey
Paper図書
sponsored by IEEE Computer Society and the Philadelphia Section of the IEEEInstitute of Electrical and Electronics Engineersc1977
Other Libraries in Japan
  • Subject Heading... -- Congresses Semiconductor storage devices -- Testing -- Congresses Integrated circuits -- Large ...
  • Subject Heading (ID)... -- Congresses Semiconductor storage devices -- Testing -- Congresses Integrated circuits -- Large ...

Memory & LSI : digest of papers, 1976 Semiconductor Test Symposium, October 19-21, 1976 held at Cherry Hill, New Jersey

Memory & LSI : digest of papers, 1976 Semiconductor Test Symposium, October 19-21, 1976 held at Cherry Hill, New Jersey
Paper図書
sponsored by IEEE Computer Society and the Philadelphia Section of the IEEEInstitute of Electrical and Electronics Engineersc1976
Other Libraries in Japan
  • Subject Heading... -- Congresses Semiconductor storage devices -- Testing -- Congresses Integrated circuits -- Large ...
  • Subject Heading (ID)... -- Congresses Semiconductor storage devices -- Testing -- Congresses Integrated circuits -- Large ...

Memory, LSI, linear IC : digest of papers : 1975 Semiconductor Test Symposium, October 14-16, 1975, held at Cherry Hill, New Jersey

Memory, LSI, linear IC : digest of papers : 1975 Semiconductor Test Symposium, October 14-16, 1975, held at Cherry Hill, New Jersey
Paper図書
sponsored by IEEE Computer Society and the Philadelphia Section of the IEEEIEEE Computer Society Publications Officec1975
Other Libraries in Japan
  • Subject HeadingSemiconductor storage devices -- Testing -- Congresses Minicomputers -- Testing -- C...
  • Subject Heading (ID)Semiconductor storage devices -- Testing -- Congresses Minicomputers -- Testing -- C...

Memory & LSI : digest of papers, 1974 Semiconductor Test Symposium, November 5-7, 1974 held at Cherry Hill, New Jersey

Memory & LSI : digest of papers, 1974 Semiconductor Test Symposium, November 5-7, 1974 held at Cherry Hill, New Jersey
Paper図書
sponsored by IEEE Computer Society and the Philadelphia Section of the IEEEInstitute of Electrical and Electronics Engineersc1974
Other Libraries in Japan
  • Subject Heading... -- Congresses Semiconductor storage devices -- Testing -- Congresses Integrated circuits -- Large ...
  • Subject Heading (ID)... -- Congresses Semiconductor storage devices -- Testing -- Congresses Integrated circuits -- Large ...

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