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2009 IEEE international workshop on memory technology, design and testing : (MTDT 2009) : Hsinchu, Taiwan : 31 August-2 September 2009. : MTDT2009 : Aug 2009, Hsinchu, Taiwan.

2009 IEEE international workshop on memory technology, design and testing : (MTDT 2009) : Hsinchu, Taiwan : 31 August-2 September 2009. : MTDT2009 : Aug 2009, Hsinchu, Taiwan.
Paper図書
IEEEc2009.<M17-11-564>
National Diet Library
  • Subject HeadingSemiconductor storage devices -- Testing -- Congresses. Random access memory -- Congr...

MTDT 2004 : records of the 2004 international workshop on memory technology, design and testing : 9-10 August 2004 : San Jose, California, USA. : Aug 2004, San Jose, CA.

MTDT 2004 : records of the 2004 international workshop on memory technology, design and testing : 9-10 August 2004 : San Jose, California, USA. : Aug 2004, San Jose, CA.
Paper図書
IEEE Computer Societyc2004.<M17-05-431>
National Diet Library

Records of the 2003 international workshop on memory technology, design and testing : 28-29 July 2003 : San Jose California. : MTDT-03, the 11th annual IEEE international workshop on memory technology, design and testing : 11th annual meeting of the MTDT workshop : MTDT 2003 : Jul 2003, San Jose, CA. (Memory Technology, Design and Testing)

Records of the 2003 international workshop on memory technology, design and testing : 28-29 July 2003 : San Jose California. : MTDT-03, the 11th annual IEEE international workshop on memory technology, design and testing : 11th annual meeting of the MTDT workshop : MTDT 2003 : Jul 2003, San Jose, CA. (Memory Technology, Design and Testing)
Paper図書
IEEE Computer Societyc2003.<M17-04-1660>
National Diet Library

Proceedings of the 2002 IEEE international workshop on memory technology, design and testing : (MTDT 2002) : 10-12 July 2002, Isle of Bendor, France. : 10th IEEE international workshop on memory technology, design and testing : Jul 2002, Bandol, France. (Memory Technology, Design and Testing)

Proceedings of the 2002 IEEE international workshop on memory technology, design and testing : (MTDT 2002) : 10-12 July 2002, Isle of Bendor, France. : 10th IEEE international workshop on memory technology, design and testing : Jul 2002, Bandol, France. (Memory Technology, Design and Testing)
Paper図書
IEEE Computer Societyc2002.<M17-03-393>
National Diet Library
  • Subject HeadingSemiconductor storage devices -- Testing -- Congresses. Random access memory -- Congr...

2001 IEEE international workshop on memory technology, design and testing : proceedings : August 6-7, 2001 : San Jose, California, USA. : MTDT 2001 : Aug 2001, San Jose, CA. (Memory Technology, Design and Testing)

2001 IEEE international workshop on memory technology, design and testing : proceedings : August 6-7, 2001 : San Jose, California, USA. : MTDT 2001 : Aug 2001, San Jose, CA. (Memory Technology, Design and Testing)
Paper図書
IEEE Computer Societyc2001.<M17-03-2017>
National Diet Library
  • Subject HeadingSemiconductor storage devices -- Testing -- Congresses. Random access memory -- Congr...

2005 IEEE International Workshop on Memory Technology, Design and Testing : MTDT 2005 : 3-5 August, 2005, Taipei, Taiwan

2005 IEEE International Workshop on Memory Technology, Design and Testing : MTDT 2005 : 3-5 August, 2005, Taipei, Taiwan
Paper図書
IEEE Computer Society Test Technology Technical Council ; co-sponsored by National Tsing Hua UniversityIEEE Computer Societyc2005
Other Libraries in Japan

Records of the 2004 International Workshop on Memory Technology, Design and Testing : MTDT 2004 : 9-10 August, 2004, San Jose, California, USA

Records of the 2004 International Workshop on Memory Technology, Design and Testing : MTDT 2004 : 9-10 August, 2004, San Jose, California, USA
Paper図書
edited by R. Rajsuman and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Test Technology Technical Council, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits SocietyIEEE Computer Societyc2004
Other Libraries in Japan

Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France : bookbroker

Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France : bookbroker
Paper図書
editors, Bernard Courtois, Thomas Wik, Yervant Zorian ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits SocietyIEEE Computer Societyc2002
Other Libraries in Japan

Proceedings / International Test Conference.

Proceedings / International Test Conference.
Paper図書
IEEE Computer Society Pressc1983-<M154-229>
National Diet Library
  • Subject Heading...-- Congresses. Semiconductor storage devices -- Testing -- Congresses.

Proceedings : International Workshop on Memory Technology, Design and Testing, August 24-25, 1998, San Jose, California, USA

Proceedings : International Workshop on Memory Technology, Design and Testing, August 24-25, 1998, San Jose, California, USA
Paper図書
sponsored by IEEE Computer Society Technical Committee on Test Technology, Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuit Society ; edited by D. Lepejian, ... [et al.]IEEE Computer Society Pressc1998
Other Libraries in Japan

Proceedings : International Workshop on Memory Technology, Design, and Testing

Proceedings : International Workshop on Memory Technology, Design, and Testing
Paper図書
edited by F. Lombardi, R. Rajsuman, and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits CouncilIEEE Computer Society Pressc1997
Other Libraries in Japan

Records of the 1996 IEEE International Workshop on Memory Technology, Design, and Testing, August 13-14, 1996, Singapore

Records of the 1996 IEEE International Workshop on Memory Technology, Design, and Testing, August 13-14, 1996, Singapore
Paper図書
edited by Rochit Rajsuman, Yong-Khim Swee, Lee-Yee Lau ; sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits CouncilIEEE Computer Society Pressc1996
Other Libraries in Japan

Records of the 1995 IEEE International Workshop on Memory Technology, Design, and Testing, August 7-8, 1995, San Jose, California

Records of the 1995 IEEE International Workshop on Memory Technology, Design, and Testing, August 7-8, 1995, San Jose, California
Paper図書
edited by R. Rajsuman and K. Rajkanan ; sponsored by the IEEE Computer Society Technical Committee on Test Technology, the IEEE Computer Society Technical Committee on VLSI ; in cooperation with the IEEE Solid State Circuits CouncilIEEE Computer Society Pressc1995
Other Libraries in Japan

Records of the IEEE International Workshop on Memory Technology, Design, and Testing, August 8-9, 1994, San Jose, California

Records of the IEEE International Workshop on Memory Technology, Design, and Testing, August 8-9, 1994, San Jose, California
Paper図書
edited by R. Rajsuman ; sponsored by IEEE Computer Society Technical Committee on Test Technology in cooperation with the IEEE Computer Society Technical Committee on VLSIIEEE Computer Society Pressc1994
Other Libraries in Japan

Memory & LSI; digest of papers.

Memory & LSI; digest of papers.
Paper図書
Institute of Electrical and Electronic Engineers.1974.<ND386-17>
National Diet Library
  • Subject HeadingSemiconductor storage devices -- Testing -- Congresses. Integrated circuits -- Large ...

Memory & LSI : digest of papers, 1977 Semiconductor Test Symposium, October 25-27, 1977, held at Cherry Hill, New Jersey

Memory & LSI : digest of papers, 1977 Semiconductor Test Symposium, October 25-27, 1977, held at Cherry Hill, New Jersey
Paper図書
sponsored by IEEE Computer Society and the Philadelphia Section of the IEEEInstitute of Electrical and Electronics Engineersc1977
Other Libraries in Japan

Memory & LSI : digest of papers, 1976 Semiconductor Test Symposium, October 19-21, 1976 held at Cherry Hill, New Jersey

Memory & LSI : digest of papers, 1976 Semiconductor Test Symposium, October 19-21, 1976 held at Cherry Hill, New Jersey
Paper図書
sponsored by IEEE Computer Society and the Philadelphia Section of the IEEEInstitute of Electrical and Electronics Engineersc1976
Other Libraries in Japan

Memory, LSI, linear IC : digest of papers : 1975 Semiconductor Test Symposium, October 14-16, 1975, held at Cherry Hill, New Jersey

Memory, LSI, linear IC : digest of papers : 1975 Semiconductor Test Symposium, October 14-16, 1975, held at Cherry Hill, New Jersey
Paper図書
sponsored by IEEE Computer Society and the Philadelphia Section of the IEEEIEEE Computer Society Publications Officec1975
Other Libraries in Japan

Memory & LSI : digest of papers, 1974 Semiconductor Test Symposium, November 5-7, 1974 held at Cherry Hill, New Jersey

Memory & LSI : digest of papers, 1974 Semiconductor Test Symposium, November 5-7, 1974 held at Cherry Hill, New Jersey
Paper図書
sponsored by IEEE Computer Society and the Philadelphia Section of the IEEEInstitute of Electrical and Electronics Engineersc1974
Other Libraries in Japan

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