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2015 international conference on microelectronic test structures : (ICMTS 2015) : Tempe, Arizona, USA : 23-26 March 2015 : 2015 IEEE international conference on microelectronic test structures : Mar 2015, Tempe, AZ.

2015 international conference on microelectronic test structures : (ICMTS 2015) : Tempe, Arizona, USA : 23-26 March 2015 : 2015 IEEE international conference on microelectronic test structures : Mar 2015, Tempe, AZ.
Paper図書
IEEE[2015]<M17-15-3236>
National Diet Library

Semiconductor material and device characterization / Dieter K. Schroder. 3rd ed.

Semiconductor material and device characterization / Dieter K. Schroder. 3rd ed.
Paper図書
IEEE Pressc2006.<ND371-B37>
National Diet Library
  • Subject HeadingSemiconductors. Semiconductors -- Testing.

2016 IEEE international test conference (ITC 2016) : Fort Worth, Texas, USA : 15-17 November 2016 : 47th international test conference : Nov 2016, Fort Worth, TX.

2016 IEEE international test conference (ITC 2016) : Fort Worth, Texas, USA : 15-17 November 2016 : 47th international test conference : Nov 2016, Fort Worth, TX.
Paper図書
IEEE[2016]<M17-18-1579>
National Diet Library

2012 IEEE international conference on microelectronic test structures : (ICMTS 2012) : San Diego, California, USA : 19-22 March 2012 : Mar 2012, San Diego, CA.

2012 IEEE international conference on microelectronic test structures : (ICMTS 2012) : San Diego, California, USA : 19-22 March 2012 : Mar 2012, San Diego, CA.
Paper図書
IEEEc2012.<M17-12-3881>
National Diet Library

2011 IEEE international conference on microelectronic test structures : (ICMTS 2011) : Amsterdam, Netherlands : 4-7 April 2011 : Apr 2011, Amsterdam, the Netherlands.

2011 IEEE international conference on microelectronic test structures : (ICMTS 2011) : Amsterdam, Netherlands : 4-7 April 2011 : Apr 2011, Amsterdam, the Netherlands.
Paper図書
IEEEc2011.<M17-12-1601>
National Diet Library

2010 international conference on microelectronic test structures : (ICMTS 2010) : Hiroshima, Japan : 22-25 March 2010. : IEEE international conference on microelectronic test structures : Mar 2010, Hiroshima, Japan.

2010 international conference on microelectronic test structures : (ICMTS 2010) : Hiroshima, Japan : 22-25 March 2010. : IEEE international conference on microelectronic test structures : Mar 2010, Hiroshima, Japan.
Paper図書
IEEEc2010.<M17-11-2929>
National Diet Library
  • Subject Heading...-- Congresses. Semiconductors -- Testing -- Congresses. Electronic app...

2009 IEEE international conference on microelectronic test structures : ICMTS 2009 : Embassy Suites : Mandalay Beach Hotel : Oxnard, CA : March 30-April 2, 2009. : 22nd annual ICMTS : Mar 2009, Oxnard, CA.

2009 IEEE international conference on microelectronic test structures : ICMTS 2009 : Embassy Suites : Mandalay Beach Hotel : Oxnard, CA : March 30-April 2, 2009. : 22nd annual ICMTS : Mar 2009, Oxnard, CA.
Paper図書
IEEEc2009.<M17-10-4024>
National Diet Library
  • Subject Heading...-- Congresses. Semiconductors -- Testing -- Congresses. Electronic app...

Optical absorption of impurities and defects in semiconducting crystals : electronic absorption of deep centres and vibrational spectra

Optical absorption of impurities and defects in semiconducting crystals : electronic absorption of deep centres and vibrational spectra
Paper図書
Bernard Pajot, Bernard Clerjaud.Springerc2013.<MC151-B44>
National Diet Library

2008 IEEE international conference on microelectronic test structures : conference proceedings : March 24-27 : the University of Edinburgh, UK. : Mar 2008, Edinburgh, UK.

2008 IEEE international conference on microelectronic test structures : conference proceedings : March 24-27 : the University of Edinburgh, UK. : Mar 2008, Edinburgh, UK.
Paper図書
IEEEc2008.<M17-09-1000>
National Diet Library
  • Subject Heading...-- Congresses. Semiconductors -- Testing -- Congresses. Electronic app...

2005 IEEE international test conference (ITC) : 8-10 November, 2005 : Austin, TX. : Nov 2005, Austin, TX.

2005 IEEE international test conference (ITC) : 8-10 November, 2005 : Austin, TX. : Nov 2005, Austin, TX.
Paper図書
IEEEc2005.<M17-10-182>
National Diet Library
  • Subject Heading...-- Congresses. Semiconductors -- Testing -- Congresses. Electronics --...

2012 IEEE international test conference : (ITC 2012) : Anaheim, California, USA : 5-8 November 2012 : ITC's lecture : Nov 2012, Anaheim, CA. CFP12ITC-ART

2012 IEEE international test conference : (ITC 2012) : Anaheim, California, USA : 5-8 November 2012 : ITC's lecture : Nov 2012, Anaheim, CA. CFP12ITC-ART
Paper図書
IEEEc2012.<M17-13-2704>
National Diet Library

ICMTS 2006 : proceedings of the 2006 international conference on microelectronic test structures : Hyatt on Town Lake : Austin, Texas : March 6-9, 2006. : 19th annual ICMTS : Mar 2006, Austin, TX.

ICMTS 2006 : proceedings of the 2006 international conference on microelectronic test structures : Hyatt on Town Lake : Austin, Texas : March 6-9, 2006. : 19th annual ICMTS : Mar 2006, Austin, TX.
Paper図書
IEEEc2006.<M17-07-1509>
National Diet Library
  • Subject Heading...-- Congresses. Semiconductors -- Testing -- Congresses. Electronic app...

ICMTS 2004 : proceedings of the 2004 international conference on microelectronic test structures : March 22-25, 2004 : Awaji Yumebutai International Conference Center, Japan. : 17th ICMTS : Mar 2004, Higashiura-cho, Japan.

ICMTS 2004 : proceedings of the 2004 international conference on microelectronic test structures : March 22-25, 2004 : Awaji Yumebutai International Conference Center, Japan. : 17th ICMTS : Mar 2004, Higashiura-cho, Japan.
Paper図書
IEEEc2004.<M17-04-3497>
National Diet Library
  • Subject Heading...-- Congresses. Semiconductors -- Testing -- Congresses. Electronic app...

ICMTS 2003 : proceedings of the 2003 international conference on microelectronic test structures : March 17-20, 2003 : DoubleTree Hotel Monterey, California. : Mar 2003, Monterey, CA.

ICMTS 2003 : proceedings of the 2003 international conference on microelectronic test structures : March 17-20, 2003 : DoubleTree Hotel Monterey, California. : Mar 2003, Monterey, CA.
Paper図書
IEEEc2003.<M17-04-254>
National Diet Library
  • Subject Heading...-- Congresses. Semiconductors -- Testing -- Congresses. Electronic app...

Semiconductor / U.S. Department of Commerce, Technology Administration, National Institute of Standards and Technology

Semiconductor / U.S. Department of Commerce, Technology Administration, National Institute of Standards and Technology
Microform図書
1998<YCA-C 13.48/4:SE 5>
National Diet Library
  • Subject Heading...-- Measurement Semiconductors -- Testing

ICMTS 2002 : proceedings of the 2002 international conference on microelectronic test structures : April 8-11, 2002 : Cork, Ireland. : 15th ICMTS : Apr 2002, Cork, Ireland.

ICMTS 2002 : proceedings of the 2002 international conference on microelectronic test structures : April 8-11, 2002 : Cork, Ireland. : 15th ICMTS : Apr 2002, Cork, Ireland.
Paper図書
IEEEc2002.<M17-03-1788>
National Diet Library
  • Subject Heading...-- Congresses. Semiconductors -- Testing -- Congresses. Electronic app...

ICMTS 2001 : proceedings of the 2001 international conference on microelectronic test structures : March 19-22, 2001 : Kobe, Japan. Mar 2001, Kobe, Japan.

ICMTS 2001 : proceedings of the 2001 international conference on microelectronic test structures : March 19-22, 2001 : Kobe, Japan. Mar 2001, Kobe, Japan.
Microform図書
IEEEc2001.<M17-LS-03-9>
National Diet Library
  • Subject Heading...-- Congresses. Semiconductors -- Testing -- Congresses. Electronic app...

Semiconductor material and device characterization 3rd ed

Semiconductor material and device characterization 3rd ed
Paper図書
Dieter K. SchroderIEEE Pressc2006.
Other Libraries in Japan
  • Subject HeadingSemiconductors Semiconductors -- Testing
  • Subject Heading (ID)Semiconductors Semiconductors -- Testing

Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry [microform] / W. Murray Bullis, S. Perkowitz, D.G. Seiler (NIST special publication ; 400-98) (Semiconductor measurement technology)

Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry [microform] / W. Murray Bullis, S. Perkowitz, D.G. Seiler (NIST special publication ; 400-98) (Semiconductor measurement technology)
Microform図書
1995<YCA-C 13.10:400-98>
National Diet Library
  • Subject HeadingSemiconductors -- Testing -- Optical methods Semiconduc...

Production testing of RF and system-on-a-chip devices for wireless communications

Production testing of RF and system-on-a-chip devices for wireless communications
Paper図書
Keith B. Schaub, Joe KellyArtech Housec2004
Other Libraries in Japan
  • Subject HeadingSemiconductors -- Testing Wireless communication system...
  • Subject Heading (ID)Semiconductors -- Testing Wireless communication system...
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