「"Semiconductor storage devices -- Testing. -- Congresses."」の検索結果 | NDLサーチ

検索結果 19 件

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2009 IEEE international workshop on memory technology, design and testing : (MTDT 2009) : Hsinchu, Taiwan : 31 August-2 September 2009. : MTDT2009 : Aug 2009, Hsinchu, Taiwan.

紙図書

IEEEc2009.<M17-11-564>

国立国会図書館

MTDT 2004 : records of the 2004 international workshop on memory technology, design and testing : 9-10 August 2004 : San Jose, California, USA. : Aug 2004, San Jose, CA.

紙図書

IEEE Computer Societyc2004.<M17-05-431>

国立国会図書館

件名Semiconductor storage devices -- Testing. -- Congresses. Random access memory -- Congr...

Records of the 2003 international workshop on memory technology, design and testing : 28-29 July 2003 : San Jose California. : MTDT-03, the 11th annual IEEE international workshop on memory technology, design and testing : 11th annual meeting of the MTDT workshop : MTDT 2003 : Jul 2003, San Jose, CA. (Memory Technology, Design and Testing)

紙図書

IEEE Computer Societyc2003.<M17-04-1660>

国立国会図書館

件名Semiconductor storage devices -- Testing. -- Congresses. Random access memory -- Congr...

Proceedings of the 2002 IEEE international workshop on memory technology, design and testing : (MTDT 2002) : 10-12 July 2002, Isle of Bendor, France. : 10th IEEE international workshop on memory technology, design and testing : Jul 2002, Bandol, France. (Memory Technology, Design and Testing)

紙図書

IEEE Computer Societyc2002.<M17-03-393>

国立国会図書館

2001 IEEE international workshop on memory technology, design and testing : proceedings : August 6-7, 2001 : San Jose, California, USA. : MTDT 2001 : Aug 2001, San Jose, CA. (Memory Technology, Design and Testing)

紙図書

IEEE Computer Societyc2001.<M17-03-2017>

国立国会図書館

2005 IEEE International Workshop on Memory Technology, Design and Testing : MTDT 2005 : 3-5 August, 2005, Taipei, Taiwan

紙図書

IEEE Computer Society Test Technology Technical Council ; co-sponsored by National Tsing Hua UniversityIEEE Computer Societyc2005

全国の図書館

Records of the 2004 International Workshop on Memory Technology, Design and Testing : MTDT 2004 : 9-10 August, 2004, San Jose, California, USA

紙図書

edited by R. Rajsuman and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Test Technology Technical Council, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits SocietyIEEE Computer Societyc2004

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Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France : bookbroker

紙図書

editors, Bernard Courtois, Thomas Wik, Yervant Zorian ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits SocietyIEEE Computer Societyc2002

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Proceedings / International Test Conference.

紙図書

IEEE Computer Society Pressc1983-<M154-229>

国立国会図書館

Proceedings : International Workshop on Memory Technology, Design and Testing, August 24-25, 1998, San Jose, California, USA

紙図書

sponsored by IEEE Computer Society Technical Committee on Test Technology, Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuit Society ; edited by D. Lepejian, ... [et al.]IEEE Computer Society Pressc1998

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Proceedings : International Workshop on Memory Technology, Design, and Testing

紙図書

edited by F. Lombardi, R. Rajsuman, and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits CouncilIEEE Computer Society Pressc1997

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Records of the 1996 IEEE International Workshop on Memory Technology, Design, and Testing, August 13-14, 1996, Singapore

紙図書

edited by Rochit Rajsuman, Yong-Khim Swee, Lee-Yee Lau ; sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits CouncilIEEE Computer Society Pressc1996

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Records of the 1995 IEEE International Workshop on Memory Technology, Design, and Testing, August 7-8, 1995, San Jose, California

紙図書

edited by R. Rajsuman and K. Rajkanan ; sponsored by the IEEE Computer Society Technical Committee on Test Technology, the IEEE Computer Society Technical Committee on VLSI ; in cooperation with the IEEE Solid State Circuits CouncilIEEE Computer Society Pressc1995

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Records of the IEEE International Workshop on Memory Technology, Design, and Testing, August 8-9, 1994, San Jose, California

紙図書

edited by R. Rajsuman ; sponsored by IEEE Computer Society Technical Committee on Test Technology in cooperation with the IEEE Computer Society Technical Committee on VLSIIEEE Computer Society Pressc1994

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Memory & LSI; digest of papers.

紙図書

Institute of Electrical and Electronic Engineers.1974.<ND386-17>

国立国会図書館

Memory & LSI : digest of papers, 1977 Semiconductor Test Symposium, October 25-27, 1977, held at Cherry Hill, New Jersey

紙図書

sponsored by IEEE Computer Society and the Philadelphia Section of the IEEEInstitute of Electrical and Electronics Engineersc1977

全国の図書館

Memory & LSI : digest of papers, 1976 Semiconductor Test Symposium, October 19-21, 1976 held at Cherry Hill, New Jersey

紙図書

sponsored by IEEE Computer Society and the Philadelphia Section of the IEEEInstitute of Electrical and Electronics Engineersc1976

全国の図書館

Memory, LSI, linear IC : digest of papers : 1975 Semiconductor Test Symposium, October 14-16, 1975, held at Cherry Hill, New Jersey

紙図書

sponsored by IEEE Computer Society and the Philadelphia Section of the IEEEIEEE Computer Society Publications Officec1975

全国の図書館

Memory & LSI : digest of papers, 1974 Semiconductor Test Symposium, November 5-7, 1974 held at Cherry Hill, New Jersey

紙図書

sponsored by IEEE Computer Society and the Philadelphia Section of the IEEEInstitute of Electrical and Electronics Engineersc1974

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