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2016 IEEE international integrated reliability workshop : (IIRW 2016) : South Lake Tahoe, California, USA : 9-13 October 2016 : Oct 2016, South Lake Tahoe, CA.

2016 IEEE international integrated reliability workshop : (IIRW 2016) : South Lake Tahoe, California, USA : 9-13 October 2016 : Oct 2016, South Lake Tahoe, CA.
Paper図書
IEEE[2016]<M17-18-1892>
National Diet Library

2015 IEEE international integrated reliability workshop : (IIRW 2015) : South Lake Tahoe, California, USA : 11-15 October 2015 : Oct 2015, South Lake Tahoe, CA.

2015 IEEE international integrated reliability workshop : (IIRW 2015) : South Lake Tahoe, California, USA : 11-15 October 2015 : Oct 2015, South Lake Tahoe, CA.
Paper図書
IEEE[2015]<M17-17-1155>
National Diet Library

2014 IEEE international integrated reliability workshop final report : (IIRW 2014) : South Lake Tahoe, California, USA : 12-16 October 2014 : Oct 2014, South Lake Tahoe, CA.

2014 IEEE international integrated reliability workshop final report : (IIRW 2014) : South Lake Tahoe, California, USA : 12-16 October 2014 : Oct 2014, South Lake Tahoe, CA.
Paper図書
IEEE[2014]<M17-16-1565>
National Diet Library

2013 IEEE international integrated reliability workshop : (IIRW 2013) : South Lake Tahoe, California, USA : 13-17 October 2013 : Oct 2013, South Lake Tahoe, CA.

2013 IEEE international integrated reliability workshop : (IIRW 2013) : South Lake Tahoe, California, USA : 13-17 October 2013 : Oct 2013, South Lake Tahoe, CA.
Paper図書
IEEE[2013]<M17-15-1043>
National Diet Library

2012 IEEE international integrated reliability workshop final report : (IIRW 2012) : South Lake Tahoe, California, USA : 14-18 October 2012 : Oct 2012, South Lake Tahoe, CA.

2012 IEEE international integrated reliability workshop final report : (IIRW 2012) : South Lake Tahoe, California, USA : 14-18 October 2012 : Oct 2012, South Lake Tahoe, CA.
Paper図書
IEEEc2012.<M17-13-3207>
National Diet Library

2010 IEEE international integrated reliability workshop final report : (IRW 2010) : S. Lake Tahoe, California, USA : 17-21 October 2010. : IIRW 2010 : Oct 2010, ------.

2010 IEEE international integrated reliability workshop final report : (IRW 2010) : S. Lake Tahoe, California, USA : 17-21 October 2010. : IIRW 2010 : Oct 2010, ------.
Paper図書
IEEEc2010.<M17-11-3261>
National Diet Library
  • Subject Heading...-- Congresses. Integrated circuits -- Wafer-scale integration -- Reliability -- Congresses. Integrated cir...

2009 IEEE international integrated reliability workshop final report : (IRW 2009) : South Lake Tahoe, California, USA : 18-22 October 2009. : IIRW 2009 : Oct 2009, ------.

2009 IEEE international integrated reliability workshop final report : (IRW 2009) : South Lake Tahoe, California, USA : 18-22 October 2009. : IIRW 2009 : Oct 2009, ------.
Paper図書
IEEEc2009.<M17-10-3653>
National Diet Library
  • Subject Heading...-- Congresses. Integrated circuits -- Wafer-scale integration -- Reliability -- Congresses. Integrated cir...

2002 IEEE international integrated reliability workshop : final report : Stanford Sierra Camp : Lake Tahoe, California : October 21-24, 2002. : 2002 IRW : Oct 2002, ------.

2002 IEEE international integrated reliability workshop : final report : Stanford Sierra Camp : Lake Tahoe, California : October 21-24, 2002. : 2002 IRW : Oct 2002, ------.
Paper図書
IEEEc2002.<M17-04-70>
National Diet Library
  • Subject Heading...-- Congresses. Integrated circuits -- Wafer-scale integration -- Reliability -- Congresses.

2001 IEEE international integrated reliability workshop final report : Stanford Sierra Camp : Lake Tahoe, California : October 15-18, 2001. : Oct 2001, ------.

2001 IEEE international integrated reliability workshop final report : Stanford Sierra Camp : Lake Tahoe, California : October 15-18, 2001. : Oct 2001, ------.
Paper図書
IEEE Electron Devices Societyc2001.<M17-03-5070>
National Diet Library
  • Subject Heading...-- Congresses. Integrated circuits -- Wafer-scale integration -- Reliability -- Congresses.

Gate dielectric integrity: material, process, and tool qualification. : conference on gate dielectric integrity (GDI) : Jan 1999, San Jose, CA. (STP ; 1382)

Gate dielectric integrity: material, process, and tool qualification. : conference on gate dielectric integrity (GDI) : Jan 1999, San Jose, CA. (STP ; 1382)
Paper図書
ASTMc2000.<M17-06-1350>
National Diet Library
  • Subject Heading...- Reliability. Integrated circuits -- Wafer-scale integration -- Reliability. Gate array circuits -- Mater...

2005 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 17-20, 2005

2005 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 17-20, 2005
Paper図書
sponsored by the IEEE Electron Devices Society, the IEEE Reliability SocietyIEEE Electron Devices Society : IEEE Reliability Societyc2005
Other Libraries in Japan
  • Subject Heading... -- Congresses Integrated circuits -- Wafer-scale integration -- Reliability -- Congresses
  • Subject Heading (ID)... -- Congresses Integrated circuits -- Wafer-scale integration -- Reliability -- Congresses

2003 IEEE International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 20-23, 2003

2003 IEEE International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 20-23, 2003
Paper図書
sponsored by the IEEE Electron Devices Society and the IEEE Reliability SocietyIEEE Operations Centerc2003
Other Libraries in Japan
  • Subject Heading...ity Congresses Integrated circuits -- Wafer-scale integration -- Reliability Congresses
  • Subject Heading (ID)...ity Congresses Integrated circuits -- Wafer-scale integration -- Reliability Congresses

2002 IEEE International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 21-24, 2002 :softbound

2002 IEEE International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 21-24, 2002 :softbound
Paper図書
sponsored by the IEEE Electron Devices Society and the IEEE Reliability SocietyIEEE Operations Centerc2002
Other Libraries in Japan
  • Subject Heading...ity Congresses Integrated circuits -- Wafer-scale integration -- Reliability Congresses
  • Subject Heading (ID)...ity Congresses Integrated circuits -- Wafer-scale integration -- Reliability Congresses

2001 IEEE International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 15-18, 2001 :softbound

2001 IEEE International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 15-18, 2001 :softbound
Paper図書
sponsored by the IEEE Electron Devices Society and the IEEE Reliability SocietyIEEE Operations Centerc2001
Other Libraries in Japan
  • Subject Heading...ity Congresses Integrated circuits -- Wafer-scale integration -- Reliability Congresses
  • Subject Heading (ID)...ity Congresses Integrated circuits -- Wafer-scale integration -- Reliability Congresses

1998 IEEE International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 12-15, 1998 :softbound

1998 IEEE International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 12-15, 1998 :softbound
Paper図書
sponsored by the IEEE Electron Devices Society, the IEEE Reliability SocietyIEEE Electron Devices Society : IEEE Reliability Societyc1998
Other Libraries in Japan
  • Subject Heading...ity Congresses Integrated circuits -- Wafer-scale integration -- Reliability Congresses
  • Subject Heading (ID)...ity Congresses Integrated circuits -- Wafer-scale integration -- Reliability Congresses

1997 IEEE International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 13-16, 1997 :softbound

1997 IEEE International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 13-16, 1997 :softbound
Paper図書
sponsored by the IEEE Electron Devices Society, the IEEE Reliability SocietyIEEE Electron Devices Society : IEEE Reliability Societyc1997
Other Libraries in Japan
  • Subject Heading... -- Congresses Integrated circuits -- Wafer-scale integration -- Reliability -- Congresses
  • Subject Heading (ID)... -- Congresses Integrated circuits -- Wafer-scale integration -- Reliability -- Congresses

Manufacturing yield evaluation of VLSI/WSI systems

Manufacturing yield evaluation of VLSI/WSI systems
Paper図書
Bruno CicianiIEEE Computer Society Press1994
Other Libraries in Japan
  • Subject Heading...-- Reliability Integrated circuits -- Wafer-scale integration -- Reliability Fault-tolerant computing
  • Subject Heading (ID)...-- Reliability Integrated circuits -- Wafer-scale integration -- Reliability Fault-tolerant computing

2003 IEEE international integrated reliability workshop final report : Stanford Sierra Camp : Lake Tahoe, California : October 20-23, 2003. : IRW 2003 : Oct 2003, ------.

2003 IEEE international integrated reliability workshop final report : Stanford Sierra Camp : Lake Tahoe, California : October 20-23, 2003. : IRW 2003 : Oct 2003, ------.
Paper図書
<M17-04-2992>
National Diet Library
  • Subject Heading...-- Congresses. Integrated circuits -- Wafer-scale integration -- Reliability. -- Congresses.

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