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2014 IEEE 21st international symposium on the physical and failure analysis of integrated circuits : (IPFA 2014) : Singapore : 30 June-4 July 2014 : Jun 2014, Singapore.

2014 IEEE 21st international symposium on the physical and failure analysis of integrated circuits : (IPFA 2014) : Singapore : 30 June-4 July 2014 : Jun 2014, Singapore.
Paper図書
IEEE[2014]<M17-15-2494>
National Diet Library

2013 20th IEEE international symposium on the physical and failure analysis of integrated circuits : (IPFA 2013) : Suzhou, China : 15-19 July 2013 : IPFA2013 : Jul 2013, Suzhou, China. CFP13777-PRT

2013 20th IEEE international symposium on the physical and failure analysis of integrated circuits : (IPFA 2013) : Suzhou, China : 15-19 July 2013 : IPFA2013 : Jul 2013, Suzhou, China. CFP13777-PRT
Paper図書
IEEEc2013.<M17-14-1212>
National Diet Library

2012 19th IEEE international symposium on the physical and failure analysis of integrated circuits : (IPFA 2012) : Singapore : 2-6 July 2012 : Jul 2012, Singapore.

2012 19th IEEE international symposium on the physical and failure analysis of integrated circuits : (IPFA 2012) : Singapore : 2-6 July 2012 : Jul 2012, Singapore.
Paper図書
IEEEc2012.<M17-13-1384>
National Diet Library

18th IEEE international symposium on the physical and failure analysis of integrated circuits : (IPFA 2011) : Incheon, South Korea : 4-7 July 2011 : Jul 2011, Incheon, Korea.

18th IEEE international symposium on the physical and failure analysis of integrated circuits : (IPFA 2011) : Incheon, South Korea : 4-7 July 2011 : Jul 2011, Incheon, Korea.
Paper図書
IEEEc2011.<M17-12-1685>
National Diet Library

2016 IEEE 23rd international symposium on the physical and failure analysis of integrated circuits (IPFA 2016) : Singapore : 18-21 July 2016 : IPFA conference : Jul 2016, Singapore.

2016 IEEE 23rd international symposium on the physical and failure analysis of integrated circuits (IPFA 2016) : Singapore : 18-21 July 2016 : IPFA conference : Jul 2016, Singapore.
Paper図書
IEEE[2016]<M17-18-1168>
National Diet Library

2010 17th IEEE international symposium on the physical and failure analysis of integrated circuits : (IPFA 2010) : Singapore : 5-9 July 2010 : Jul 2010, Singapore.

2010 17th IEEE international symposium on the physical and failure analysis of integrated circuits : (IPFA 2010) : Singapore : 5-9 July 2010 : Jul 2010, Singapore.
Paper図書
IEEEc2010.<M17-12-238>
National Diet Library

2015 IEEE 22nd international symposium on the physical and failure analysis of integrated circuits : (IPFA 2015) : Hsinchu, Taiwan : 29 June-2 July 2015 : events of IPFA 2015 : IPFA 2015 tutorial : IPFA 2015 exhibition : Jun 2015, Hsinchu, Taiwan.

2015 IEEE 22nd international symposium on the physical and failure analysis of integrated circuits : (IPFA 2015) : Hsinchu, Taiwan : 29 June-2 July 2015 : events of IPFA 2015 : IPFA 2015 tutorial : IPFA 2015 exhibition : Jun 2015, Hsinchu, Taiwan.
Paper図書
IEEE[2015]<M17-17-1530>
National Diet Library

Proceedings of the 11th international symposium on the physical & failure analysis of integrated circuits : IPFA 2004. : 11th IEEE international symposium on the physical and failure analysis of integrated circuits : Jul 2004, Taipei, Taiwan.

Proceedings of the 11th international symposium on the physical & failure analysis of integrated circuits : IPFA 2004. : 11th IEEE international symposium on the physical and failure analysis of integrated circuits : Jul 2004, Taipei, Taiwan.
Paper図書
IEEEc2004.<M17-05-2126>
National Diet Library
  • Subject HeadingIntegrated circuits -- Defects -- Congresses. Integrated circuits -- Testin...

Proceedings of the 14th international symposium on the physical & failure analysis of integrated circuits : IPFA 2007. : IPFA 2007 tutorial : Jul 2007, Bangalore, India.

Proceedings of the 14th international symposium on the physical & failure analysis of integrated circuits : IPFA 2007. : IPFA 2007 tutorial : Jul 2007, Bangalore, India.
Paper図書
IEEEc2007.<M17-09-1411>
National Diet Library
  • Subject HeadingIntegrated circuits -- Defects -- Congresses. Integrated circuits -- Testin...

2005 IEEE international workshop on current & defect based testing (DBT 2005) : proceedings : May 1, 2005 : Lodge at Rancho Mirage, Palm Springs, USA. : DBT-2005 : May 2005, Palm Springs, CA.

2005 IEEE international workshop on current & defect based testing (DBT 2005) : proceedings : May 1, 2005 : Lodge at Rancho Mirage, Palm Springs, USA. : DBT-2005 : May 2005, Palm Springs, CA.
Paper図書
IEEEc2005.<M17-07-543>
National Diet Library
  • Subject HeadingIntegrated circuits -- Defects -- Congresses. Iddq testing -- Congresses. M...

Proceedings of the 10th international symposium on the physical & failure analysis of integrated circuits : IPFA 2003. : Jul 2003, Singapore.

Proceedings of the 10th international symposium on the physical & failure analysis of integrated circuits : IPFA 2003. : Jul 2003, Singapore.
Paper図書
IEEEc2003.<M17-04-2068>
National Diet Library
  • Subject HeadingIntegrated circuits -- Defects -- Congresses. Integrated circuits -- Testin...

2004 IEEE international workshop on current & defect based testing (DBT 2004) : proceedings : April 25, 2004 : Napa Valley Marriott, Napa Valley, CA, USA. : DBT-2004 : Apr 2004, Napa Valley, CA.

2004 IEEE international workshop on current & defect based testing (DBT 2004) : proceedings : April 25, 2004 : Napa Valley Marriott, Napa Valley, CA, USA. : DBT-2004 : Apr 2004, Napa Valley, CA.
Paper図書
IEEEc2004.<M17-05-2561>
National Diet Library
  • Subject Heading...-- Congresses. Integrated circuits -- Defects -- Congresses. Iddq testing -- Congresses.

Proceedings of the 9th international symposium on the physical & failure analysis of integrated circuits : IPFA 2002. : Jul 2002, Singapore.

Proceedings of the 9th international symposium on the physical & failure analysis of integrated circuits : IPFA 2002. : Jul 2002, Singapore.
Paper図書
IEEEc2002.<M17-03-4302>
National Diet Library
  • Subject HeadingIntegrated circuits -- Defects -- Congresses. Integrated circuits -- Testin...

Proceedings of the 2001 8th international symposium on the physical & failure analysis of integrated circuits : IPFA 2001. : Jul 2001, Singapore.

Proceedings of the 2001 8th international symposium on the physical & failure analysis of integrated circuits : IPFA 2001. : Jul 2001, Singapore.
Paper図書
IEEEc2001.<M17-03-3241>
National Diet Library
  • Subject HeadingIntegrated circuits -- Defects -- Congresses. Integrated circuits -- Testin...

Proceedings of the 12th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2005 : [27 June to 1 July 2005, Shangri-La's rasa Sentosa Resort, Singapore]

Proceedings of the 12th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2005 : [27 June to 1 July 2005, Shangri-La's rasa Sentosa Resort, Singapore]
Paper図書
edited by Tung Chih-Hang ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapoer Chapter ; technically co-sponsored by IEEE Electron Devices Society ... [et al.] ; in co-operation with Centre for IC Failure Anlaysis & Reliability (CICFAR), National University of SingaporeIEEEc2005
Other Libraries in Japan

Proceedings of the 1997 6th International Symposium on the Physical & Failure Analysis of Integrated Circuits [IPFA '97 : 21-25 July, 1997, Raffles City Convention Centre, Singapore] softbound

Proceedings of the 1997 6th International Symposium on the Physical & Failure Analysis of Integrated Circuits [IPFA '97 : 21-25 July, 1997, Raffles City Convention Centre, Singapore] softbound
Paper図書
edited by M.K. Radhakrishnan, Philip Ho, Chim Wai Kin ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technically co-sponsored by IEEE Electron Device Society ; in co-operation with National University of Singapore Centre for IC Failure Analysis & Reliability, Institute of Microelectronics,SingaporeInstitute of Electrical and Electronics Engineersc1997
Other Libraries in Japan

Proceedings of the 1995 5th International Symposium on the Physical & Failure Analysis of Integrated Circuits

Proceedings of the 1995 5th International Symposium on the Physical & Failure Analysis of Integrated Circuits
Paper図書
edited by Soon Huat Ong, MK Radhakrishnan ; organised by, IEEE Singapore Section, Reliability/CPMT/EDS Chapter ; technical co-sponsorship, IEEE Electron Devices Society ; in co-operation with National University of Singapore, Centre for IC Failure Analysis and Reliability, Institute of Microelectronics, Singapore, [and] Magnetics Technology Centre, SingaporeInstitute of Electrical and Electronics Engineersc1995
Other Libraries in Japan

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