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2016 IEEE international reliability physics symposium : (IRPS 2016) : Pasadena, California, USA : 17-21 April 2016 : IRPS 2016 workshops : 2016 IRPS tutorial : Apr 2016, Pasadena, CA.

2016 IEEE international reliability physics symposium : (IRPS 2016) : Pasadena, California, USA : 17-21 April 2016 : IRPS 2016 workshops : 2016 IRPS tutorial : Apr 2016, Pasadena, CA.
Paper図書
IEEE[2016]<M17-18-1215>
National Diet Library

2016 IEEE international integrated reliability workshop : (IIRW 2016) : South Lake Tahoe, California, USA : 9-13 October 2016 : Oct 2016, South Lake Tahoe, CA.

2016 IEEE international integrated reliability workshop : (IIRW 2016) : South Lake Tahoe, California, USA : 9-13 October 2016 : Oct 2016, South Lake Tahoe, CA.
Paper図書
IEEE[2016]<M17-18-1892>
National Diet Library

2016 IEEE 23rd international symposium on the physical and failure analysis of integrated circuits (IPFA 2016) : Singapore : 18-21 July 2016 : IPFA conference : Jul 2016, Singapore.

2016 IEEE 23rd international symposium on the physical and failure analysis of integrated circuits (IPFA 2016) : Singapore : 18-21 July 2016 : IPFA conference : Jul 2016, Singapore.
Paper図書
IEEE[2016]<M17-18-1168>
National Diet Library

2015 IEEE international integrated reliability workshop : (IIRW 2015) : South Lake Tahoe, California, USA : 11-15 October 2015 : Oct 2015, South Lake Tahoe, CA.

2015 IEEE international integrated reliability workshop : (IIRW 2015) : South Lake Tahoe, California, USA : 11-15 October 2015 : Oct 2015, South Lake Tahoe, CA.
Paper図書
IEEE[2015]<M17-17-1155>
National Diet Library

2015 IEEE 22nd international symposium on the physical and failure analysis of integrated circuits : (IPFA 2015) : Hsinchu, Taiwan : 29 June-2 July 2015 : events of IPFA 2015 : IPFA 2015 tutorial : IPFA 2015 exhibition : Jun 2015, Hsinchu, Taiwan.

2015 IEEE 22nd international symposium on the physical and failure analysis of integrated circuits : (IPFA 2015) : Hsinchu, Taiwan : 29 June-2 July 2015 : events of IPFA 2015 : IPFA 2015 tutorial : IPFA 2015 exhibition : Jun 2015, Hsinchu, Taiwan.
Paper図書
IEEE[2015]<M17-17-1530>
National Diet Library

2013 IEEE conference on reliability science for advanced materials and devices : (RSAMD 2013) : Golden, Colorado, USA : 24-25 February 2013 : Feb 2013, Golden, CO.

2013 IEEE conference on reliability science for advanced materials and devices : (RSAMD 2013) : Golden, Colorado, USA : 24-25 February 2013 : Feb 2013, Golden, CO.
Paper図書
IEEEc2013.<M17-14-1900>
National Diet Library

2014 IEEE international integrated reliability workshop final report : (IIRW 2014) : South Lake Tahoe, California, USA : 12-16 October 2014 : Oct 2014, South Lake Tahoe, CA.

2014 IEEE international integrated reliability workshop final report : (IIRW 2014) : South Lake Tahoe, California, USA : 12-16 October 2014 : Oct 2014, South Lake Tahoe, CA.
Paper図書
IEEE[2014]<M17-16-1565>
National Diet Library

2013 IEEE international integrated reliability workshop : (IIRW 2013) : South Lake Tahoe, California, USA : 13-17 October 2013 : Oct 2013, South Lake Tahoe, CA.

2013 IEEE international integrated reliability workshop : (IIRW 2013) : South Lake Tahoe, California, USA : 13-17 October 2013 : Oct 2013, South Lake Tahoe, CA.
Paper図書
IEEE[2013]<M17-15-1043>
National Diet Library

2014 IEEE 21st international symposium on the physical and failure analysis of integrated circuits : (IPFA 2014) : Singapore : 30 June-4 July 2014 : Jun 2014, Singapore.

2014 IEEE 21st international symposium on the physical and failure analysis of integrated circuits : (IPFA 2014) : Singapore : 30 June-4 July 2014 : Jun 2014, Singapore.
Paper図書
IEEE[2014]<M17-15-2494>
National Diet Library

2013 20th IEEE international symposium on the physical and failure analysis of integrated circuits : (IPFA 2013) : Suzhou, China : 15-19 July 2013 : IPFA2013 : Jul 2013, Suzhou, China. CFP13777-PRT

2013 20th IEEE international symposium on the physical and failure analysis of integrated circuits : (IPFA 2013) : Suzhou, China : 15-19 July 2013 : IPFA2013 : Jul 2013, Suzhou, China. CFP13777-PRT
Paper図書
IEEEc2013.<M17-14-1212>
National Diet Library

2012 IEEE international integrated reliability workshop final report : (IIRW 2012) : South Lake Tahoe, California, USA : 14-18 October 2012 : Oct 2012, South Lake Tahoe, CA.

2012 IEEE international integrated reliability workshop final report : (IIRW 2012) : South Lake Tahoe, California, USA : 14-18 October 2012 : Oct 2012, South Lake Tahoe, CA.
Paper図書
IEEEc2012.<M17-13-3207>
National Diet Library

2012 19th IEEE international symposium on the physical and failure analysis of integrated circuits : (IPFA 2012) : Singapore : 2-6 July 2012 : Jul 2012, Singapore.

2012 19th IEEE international symposium on the physical and failure analysis of integrated circuits : (IPFA 2012) : Singapore : 2-6 July 2012 : Jul 2012, Singapore.
Paper図書
IEEEc2012.<M17-13-1384>
National Diet Library

18th IEEE international symposium on the physical and failure analysis of integrated circuits : (IPFA 2011) : Incheon, South Korea : 4-7 July 2011 : Jul 2011, Incheon, Korea.

18th IEEE international symposium on the physical and failure analysis of integrated circuits : (IPFA 2011) : Incheon, South Korea : 4-7 July 2011 : Jul 2011, Incheon, Korea.
Paper図書
IEEEc2011.<M17-12-1685>
National Diet Library

2010 IEEE international integrated reliability workshop final report : (IRW 2010) : S. Lake Tahoe, California, USA : 17-21 October 2010. : IIRW 2010 : Oct 2010, ------.

2010 IEEE international integrated reliability workshop final report : (IRW 2010) : S. Lake Tahoe, California, USA : 17-21 October 2010. : IIRW 2010 : Oct 2010, ------.
Paper図書
IEEEc2010.<M17-11-3261>
National Diet Library
  • Subject Heading...-- Congresses. Integrated circuits -- Reliability -- Congresses.

Design for testability, debug and reliability : next generation measures using formal techniques

Design for testability, debug and reliability : next generation measures using formal techniques
Paper図書
Sebastian Huhn, Rolf DrechslerSpringerc2021
Other Libraries in Japan
  • Subject HeadingIntegrated circuits -- Design and construction Integrated circuits -- Reliability
  • Subject Heading (ID)Integrated circuits -- Design and construction Integrated circuits -- Reliability

2010 17th IEEE international symposium on the physical and failure analysis of integrated circuits : (IPFA 2010) : Singapore : 5-9 July 2010 : Jul 2010, Singapore.

2010 17th IEEE international symposium on the physical and failure analysis of integrated circuits : (IPFA 2010) : Singapore : 5-9 July 2010 : Jul 2010, Singapore.
Paper図書
IEEEc2010.<M17-12-238>
National Diet Library

2009 IEEE international integrated reliability workshop final report : (IRW 2009) : South Lake Tahoe, California, USA : 18-22 October 2009. : IIRW 2009 : Oct 2009, ------.

2009 IEEE international integrated reliability workshop final report : (IRW 2009) : South Lake Tahoe, California, USA : 18-22 October 2009. : IIRW 2009 : Oct 2009, ------.
Paper図書
IEEEc2009.<M17-10-3653>
National Diet Library
  • Subject Heading...-- Congresses. Integrated circuits -- Reliability -- Congresses.

Proceedings of the 14th international symposium on the physical & failure analysis of integrated circuits : IPFA 2007. : IPFA 2007 tutorial : Jul 2007, Bangalore, India.

Proceedings of the 14th international symposium on the physical & failure analysis of integrated circuits : IPFA 2007. : IPFA 2007 tutorial : Jul 2007, Bangalore, India.
Paper図書
IEEEc2007.<M17-09-1411>
National Diet Library
  • Subject Heading...-- Congresses. Integrated circuits -- Reliability -- Congresses.

2004 IEEE international reliability physics symposium : 42nd annual : Phoenix, Arizona April 25-29, 2004. : IRPS 2004 : Apr 2004, Phoenix, AZ.

2004 IEEE international reliability physics symposium : 42nd annual : Phoenix, Arizona April 25-29, 2004. : IRPS 2004 : Apr 2004, Phoenix, AZ.
Paper図書
IEEEc2004.<M17-05-285>
National Diet Library
  • Subject Heading...-- Congresses. Integrated circuits -- Reliability. -- Congresses. Electronic ap...

2002 IEEE international integrated reliability workshop : final report : Stanford Sierra Camp : Lake Tahoe, California : October 21-24, 2002. : 2002 IRW : Oct 2002, ------.

2002 IEEE international integrated reliability workshop : final report : Stanford Sierra Camp : Lake Tahoe, California : October 21-24, 2002. : 2002 IRW : Oct 2002, ------.
Paper図書
IEEEc2002.<M17-04-70>
National Diet Library
  • Subject HeadingIntegrated circuits -- Reliability -- Congresses. Integrated cir...
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