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年

検索結果 40 件

29th VLSI test symposium : (VTS 2011) : Dana Point, California, USA : 1-5 May 2011 : 2011 29th IEEE VLSI test symposium : test technology educational program (TTEP) tutorials : TTTC-sponsored technical meeting : May 2011, Dana Point, CA.

29th VLSI test symposium : (VTS 2011) : Dana Point, California, USA : 1-5 May 2011 : 2011 29th IEEE VLSI test symposium : test technology educational program (TTEP) tutorials : TTTC-sponsored technical meeting : May 2011, Dana Point, CA.
紙図書
IEEEc2011.<M17-12-2224>
国立国会図書館

2015 IEEE 33rd VLSI test symposium : (VTS 2015) : Napa, California, USA : 27-29 April 2015 : TTTC-sponsored technical meetings : Apr 2015, Napa, CA.

2015 IEEE 33rd VLSI test symposium : (VTS 2015) : Napa, California, USA : 27-29 April 2015 : TTTC-sponsored technical meetings : Apr 2015, Napa, CA.
紙図書
IEEE[2015]<M17-17-2069>
国立国会図書館

2010 28th VLSI test symposium : (VTS 2010) : Santa Cruz, California, USA : 19-22 April 2010 : 2010 28th IEEE VLSI test symposium : test technology educational program (TTEP) tutorials : TTTC-sponsored technical meetings : TTTC test technology educational program (TTEP) 2010 : VTS conference : Apr 2010, Santa Cruz, CA.

2010 28th VLSI test symposium : (VTS 2010) : Santa Cruz, California, USA : 19-22 April 2010 : 2010 28th IEEE VLSI test symposium : test technology educational program (TTEP) tutorials : TTTC-sponsored technical meetings : TTTC test technology educational program (TTEP) 2010 : VTS conference : Apr 2010, Santa Cruz, CA.
紙図書
IEEEc2010.<M17-12-839>
国立国会図書館

2014 IEEE 32nd VLSI test symposium : (VTS 2014) : Napa, California, USA : 13-17 April 2014 : TTTC-sponsored technical meetings : Apr 2014, Napa, CA.

2014 IEEE 32nd VLSI test symposium : (VTS 2014) : Napa, California, USA : 13-17 April 2014 : TTTC-sponsored technical meetings : Apr 2014, Napa, CA.
紙図書
IEEE[2014]<M17-15-2218>
国立国会図書館

2016 IEEE 34th VLSI test symposium (VTS 2016) : Las Vegas, Nevada, USA : 25-27 April 2016 : intl. IEEE VLSI test symposium 2016 : Apr 2016, Las Vegas, NV.

2016 IEEE 34th VLSI test symposium (VTS 2016) : Las Vegas, Nevada, USA : 25-27 April 2016 : intl. IEEE VLSI test symposium 2016 : Apr 2016, Las Vegas, NV.
紙図書
IEEE[2016]<M17-17-2424>
国立国会図書館

2009 27th IEEE VLSI test symposium : VTS 2009 : proceedings : 3-7 May 2009 : Santa Cruz, CA, USA. : test technology education program : TTEP tutorials : TTTC test technology educational program (TTEP) 2009 : May 2009, Santa Cruz, CA.

2009 27th IEEE VLSI test symposium : VTS 2009 : proceedings : 3-7 May 2009 : Santa Cruz, CA, USA. : test technology education program : TTEP tutorials : TTTC test technology educational program (TTEP) 2009 : May 2009, Santa Cruz, CA.
紙図書
IEEE Computer Societyc2009.<M17-10-911>
国立国会図書館
  • 件名Integrated circuits -- Very large scale integration -- Testing -- Congresses.

26th IEEE VLSI test symposium : proceedings : San Diego, California : 27 April-1 May 2008. : test technology education program (TTEP) : TTTC test technology educational program (TTEP) 2008 : Apr 2008, San Diego, CA.

26th IEEE VLSI test symposium : proceedings : San Diego, California : 27 April-1 May 2008. : test technology education program (TTEP) : TTTC test technology educational program (TTEP) 2008 : Apr 2008, San Diego, CA.
紙図書
IEEE Computer Societyc2008.<M17-09-592>
国立国会図書館
  • 件名Integrated circuits -- Very large scale integration -- Testing -- Congresses.

25th IEEE VLSI test symposium : proceedings : 6-10 May 2007 : Berkeley, California. : VTS 2007 : test technology education program : TTTC test technology educational program (TTEP) 2007 : May 2007, Berkeley, CA.

25th IEEE VLSI test symposium : proceedings : 6-10 May 2007 : Berkeley, California. : VTS 2007 : test technology education program : TTTC test technology educational program (TTEP) 2007 : May 2007, Berkeley, CA.
紙図書
IEEE Computer Societyc2007.<M17-07-2969>
国立国会図書館
  • 件名Integrated circuits -- Very large scale integration -- Testing -- Congresses.

24th IEEE VLSI test symposium : proceedings : April 30-May 4, 2006 : Berkeley, California. : VTS 2006 : TTTC test technology educational program (TTEP) 2006 : Apr 2006, Berkeley, CA. (IEEE VLSI Test Symposium)

24th IEEE VLSI test symposium : proceedings : April 30-May 4, 2006 : Berkeley, California. : VTS 2006 : TTTC test technology educational program (TTEP) 2006 : Apr 2006, Berkeley, CA. (IEEE VLSI Test Symposium)
紙図書
IEEE Computer Societyc2006.<M17-06-2444>
国立国会図書館

23rd IEEE VLSI test symposium : proceedings : 1-5 May 2005 : Palm Springs, California. : VTS conference : TTTC test technology educational program (TTEP) 2005 : May 2005, Palm Springs, CA.

23rd IEEE VLSI test symposium : proceedings : 1-5 May 2005 : Palm Springs, California. : VTS conference : TTTC test technology educational program (TTEP) 2005 : May 2005, Palm Springs, CA.
紙図書
IEEE Computer Societyc2005.<M17-06-2720>
国立国会図書館

22nd IEEE VLSI test symposium : proceedings : 25-29 April 2004 : Napa Valley, California. : VTS 2004 : Apr 2004, Napa Valley, CA. (IEEE VLSI Test Symposium)

22nd IEEE VLSI test symposium : proceedings : 25-29 April 2004 : Napa Valley, California. : VTS 2004 : Apr 2004, Napa Valley, CA. (IEEE VLSI Test Symposium)
紙図書
IEEE Computer Societyc2004.<M17-05-433>
国立国会図書館

21st IEEE VLSI test symposium : proceedings : 27 April-1 May 2003 : Napa Valley, California. : VTS 2003 : Apr 2003, Napa Valley, CA. (IEEE VLSI Test Symposium)

21st IEEE VLSI test symposium : proceedings : 27 April-1 May 2003 : Napa Valley, California. : VTS 2003 : Apr 2003, Napa Valley, CA. (IEEE VLSI Test Symposium)
紙図書
IEEE Computer Societyc2003.<M17-04-1739>
国立国会図書館

2015 19th international symposium on VLSI design and test : (VDAT 2015) : Ahmedabad, India : 26-29 June 2015 : VDAT-2015 : Jun 2015, Ahmedabad, India.

2015 19th international symposium on VLSI design and test : (VDAT 2015) : Ahmedabad, India : 26-29 June 2015 : VDAT-2015 : Jun 2015, Ahmedabad, India.
紙図書
IEEE[2015]<M17-17-2065>
国立国会図書館

2016 20th international symposium on VLSI design and test (VDAT 2016) : Guwahati, India : 24-27 May 2016 : May 2016, Guwahati, India.

2016 20th international symposium on VLSI design and test (VDAT 2016) : Guwahati, India : 24-27 May 2016 : May 2016, Guwahati, India.
紙図書
IEEE[2016]<M17-19-737>
国立国会図書館

20th IEEE VLSI test symposium (VTS 2002) : proceedings : 28 April - 2 May 2002 : Monterey, California. : Apr 2002, Monterey, CA. (IEEE VLSI Test Symposium)

20th IEEE VLSI test symposium (VTS 2002) : proceedings : 28 April - 2 May 2002 : Monterey, California. : Apr 2002, Monterey, CA. (IEEE VLSI Test Symposium)
紙図書
IEEE Computer Societyc2002.<M17-03-4439>
国立国会図書館
  • 件名Integrated circuits -- Very large scale integration -- Testing -- Congresses.

2014 18th international symposium on VLSI design and test : (VDAT 2014) : Coimbatore, India : 16-18 July 2014 : Jul 2014, Coimbatore, India.

2014 18th international symposium on VLSI design and test : (VDAT 2014) : Coimbatore, India : 16-18 July 2014 : Jul 2014, Coimbatore, India.
紙図書
IEEE[2014]<M17-15-2215>
国立国会図書館

19th IEEE VLSI test symposium : VTS 2001 : proceedings : April 29-3 May 2001 : Marina Del Rey, California USA. : Apr 2001, Marina Del Rey, CA. (IEEE VLSI Test Symposium)

19th IEEE VLSI test symposium : VTS 2001 : proceedings : April 29-3 May 2001 : Marina Del Rey, California USA. : Apr 2001, Marina Del Rey, CA. (IEEE VLSI Test Symposium)
紙図書
IEEEc2001.<M17-03-2506>
国立国会図書館
  • 件名Integrated circuits -- Very large scale integration -- Testing -- Congresses.

2015 international symposium on VLSI design, automation and test : (VLSI-DAT 2015) : Hsinchu, Taiwan : 27-29 April 2015 : Apr 2015, Hsinchu, Taiwan.

2015 international symposium on VLSI design, automation and test : (VLSI-DAT 2015) : Hsinchu, Taiwan : 27-29 April 2015 : Apr 2015, Hsinchu, Taiwan.
紙図書
IEEE[2015]<M17-17-2062>
国立国会図書館

Proceedings : 2009 27th IEEE VLSI Test Symposium : VTS 2009 : 3-7 May 2009, Santa Cruz, CA, USA

Proceedings : 2009 27th IEEE VLSI Test Symposium : VTS 2009 : 3-7 May 2009, Santa Cruz, CA, USA
紙図書
IEEE Computer Societyc2009
全国の図書館
  • 件名Integrated circuits -- Very large scale integration -- Testing -- Congresses
  • 件名（識別子）Integrated circuits -- Very large scale integration -- Testing -- Congresses

Proceedings : 26th IEEE VLSI Test Symposium : San Diego, California, 27 April-1 May 2008

Proceedings : 26th IEEE VLSI Test Symposium : San Diego, California, 27 April-1 May 2008
紙図書
IEEE Computer Societyc2008
全国の図書館
  • 件名Integrated circuits -- Very large scale integration -- Testing -- Congresses
  • 件名（識別子）Integrated circuits -- Very large scale integration -- Testing -- Congresses
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